• 한국시뮬레이션학회논문지
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• 제20권4호
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• pp.115-125
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• 2011

제품의 품질 수준 제고를 위해 통계적 공정 관리(SPC : Statistical Process Control)의 다양한 관리도가 기업의 생산 공정을 관리하는데 사용된다. 관리도에 기록되는 공정 데이터는 특정 요인(Assignable Cause)에 의한 이상이 발생했을 때 그 요인에 따라 서로 다른 패턴(Pattern)으로 변화한다. 이러한 패턴을 구별하는 관리도 패턴(CCP : Control Chart Pattern) 인식(Recognition)은 공정에 대한 관리자의 빠른 의사 결정을 위해 매우 중요하다. 앞 선 연구들은 수집되는 원 데이터를 가공 하지않고 그대로 사용하였기 때문에 인식기(Recognizer)의 성능과 학습 속도가 저하되는 문제점이 있었다. 따라서 최근 데이터의 차원 축소와 인식기의 성능 향상을 위해 특질 추출법(Feature Extraction)을 적용한 특질 기반 인식기(Feature based Recognizer)에 대한 연구가 활발히 진행 중이다. 본 논문은 BDK(Bi-Directional Kohonen Network)를 사용하여 CCP의 참조 벡터(Reference Vector)를 생성하고 참조 벡터와 CCP 데이터의 거리를 기반으로 하는 특질을 추출하였다. 추출된 특질을 인공 신경망 기반 인식기의 입력 벡터로 사용하여 학습하였으며 원 데이터를 사용하여 학습하는 인공신경망 인식기와 예측 정확도 비교를 통해 제안 알고리즘의 성능을 평가하였다.

• 품질경영학회지
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• 제26권2호
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• pp.106-117
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• 1998

The following study has been undertaken to build QIP (Quality Improvement Process) of an inner-layer process in a PCB (Printed Circuit Board) manufacturing plant. The objective of the study is stabilization and optimization of the process through quality improvement. To do that, defective factors in process are gathered by the cause and effect analysis and classified by PFD (Process Flow Diagram), key factors are found out by PFMECA (Process Failure Mode and Effect Criticalty Analisis), DOE(Design of Experiments) is a, pp.ied to those key factors to optimize the process, SPC (Statistical Process Control) chart is used to maintain the optimal conditions of the process and to improve quality continuously, and a quality management system is developed to improve quality mind and quality system for the PCB jmanufacturing plant. Overall, QIP is established to improve quality for the PCB manufacturing plant in the study.

• 산업경영시스템학회지
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• 제41권4호
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• pp.203-212
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• 2018

Quality requirements of manufactured products or parts are given in the form of specification limits on the quality characteristics of individual units. If a product is to meet the customer's fitness for use criteria, it should be produced by a process which is stable or repeatable. In other words, it must be capable of operating with little variability around the target value or nominal value of the product's quality characteristic. In order to maintain and improve product quality, we need to apply statistical process control techniques such as histogram, check sheet, Pareto chart, cause and effect diagram, or control charts. Among those techniques, the most important one is control charting. The cumulative sum (CUSUM) control charts have been used in statistical process control (SPC) in industries for monitoring process shifts and supporting online measurement. The objective of this research is to apply Taguchi's quality loss function concept to cost based CUSUM control chart design. In this study, a modified quality loss function was developed to reflect quality loss situation where general quadratic loss curve is not appropriate. This research also provided a methodology for the design of CUSUM charts using Taguchi quality loss function concept based on the minimum cost per hour criterion. The new model differs from previous models in that the model assumes that quality loss is incurred even in the incontrol period. This model was compared with other cost based CUSUM models by Wu and Goel, According to numerical sensitivity analysis, the proposed model results in longer average run length in in-control period compared to the other two models.

• Industrial Engineering and Management Systems
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• 제12권4호
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• pp.380-388
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• 2013

Large variation in electrocardiogram (ECG) waveforms continues to present challenges in defining R-wave locations in ECG signals. This research presents a procedure to extract the R-wave locations by forward-backward (FB) algorithm and classify the arrhythmic beat conditions by using RR intervals. The FB algorithm shows forward and backward searching rules from QRS onset and eliminates lower-amplitude signals near the baseline using a statistical process control concept. The proposed algorithm was trained the optimal parameters by using MIT-BIH arrhythmia database (MITDB), and it was verified by actual Holter ECG signals from a local hospital. The signals are classified into normal (N) and three arrhythmia beat types including premature ventricular contraction (PVC), ventricular flutter/fibrillation (VF), and second-degree heart block (BII) beat. This work produces 98.54% accuracy in the detection of R-wave location; 98.68% for N beats; 91.17% for PVC beats; and 87.2% for VF beats in the collected Holter ECG signals, and the results are better than what are reported in literature.

• 산업경영시스템학회지
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• 제32권1호
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• pp.94-101
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• 2009

Complex Products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. Demerit systems are very effective systems to monitoring the different types of defects. So, classical demerit control chart used to monitor counts of several different types of defects simultaneously in complex products. S.M. Na et al.(2003) proposed the Demerit-CUSUM for the improvement of the demerit control chart performance and Nembhard, D. A. et al.(2001) and G.Y Cho et al.(2004) developed a Demerit control chart using the EWMA technique and evaluated the performance of the control chart. In this paper, we present an effective method for process control using the Demerit-CUSUM with fast initial response. Moreover, we evaluate exact performance of the Demerit-CUSUM control chart with fast initial response, Demerit-CUSUM and Demerit-EWMA according to changing sample size or parameters.

• 산업경영시스템학회지
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• 제33권2호
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• pp.9-17
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• 2010

Complex products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. So, demerit systems are very effective systems to monitor the different types of defects. Recently, Kang et al.(2009) proposed the revised Demerit-CUSUM for the evaluation of the Demerit-CUSUM control chart performance exactly. In this paper, we present an advanced Demerit control chart using the double EWMA technique. The double EWMA technique is very efficient and strong method for process control where defects and nonconformities occur with various defect types. Moreover, we compare exact performance of Demerit-CUSUM, Demerit-EWMA and Demerit-DEWMA control chart according to changing sample size or mean shifts magnitude. By the result, we confirm that the performance of Demerit-DEWMA control chart is more than the performance of the Demerit-CUSUM and Demerit-EWMA control chart.

• 산업경영시스템학회지
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• 제31권4호
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• pp.114-120
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• 2008

The control chart is widely used statistical process control(SPC) tool that searches for assignable cause of variation and detects any change of process. Generally, ${\bar{X}}-R$ control chart and ${\bar{X}}-S$ are most frequently used. When the production run is short and process parameter changes frequently, it is difficult to monitor the process using traditional control charts. In such a case, the coefficient of variation (CV) is very useful for monitoring the process variability. The CV control chart is an effective tool to control the mean and variability of process simultaneously. The CV control chart, however, is not sensitive at small shift in the magnitude of CV. In this paper, we propose an CV-EWMA (exponentially weighted moving average) control chart which is effective in detecting a small shift of CV. Since the CV-EWMA control chart scheme can be viewed as a weighted average of all past and current CV values, it is very sensitive to small change of mean and variability of the process. We suggest the values of design parameters and show the results of the performance study of CV-EWMA control chart by the use of average run length (ARL). When we compared the performance of CV-EWMA control chart with that of the CV control chart, we found that the CV-EWMA control chart gives longer in-control ARL and much shorter out-of-control ARL.

• 산업경영시스템학회지
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• 제39권2호
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• pp.37-45
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• 2016

Control chart is representative tools of statistical process control (SPC). It is a graph that plotting the characteristic values from the process. It has two steps (or Phase). First step is a procedure for finding a process parameters. It is called Phase I. This step is to find the process parameters by using data obtained from in-controlled process. It is a step that the standard value was not determined. Another step is monitoring process by already known process parameters from Phase I. It is called Phase II. These control chart is the process quality characteristic value for management, which is plotted dot whether the existence within the control limit or not. But, this is not given information about the economic loss that occurs when a product characteristic value does not match the target value. In order to meet the customer needs, company not only consider stability of the process variation but also produce the product that is meet the target value. Taguchi's quadratic loss function is include information about economic loss that occurred by the mismatch the target value. However, Taguchi's quadratic loss function is very simple quadratic curve. It is difficult to realistically reflect the increased amount of loss that due to a deviation from the target value. Also, it can be well explained by only on condition that the normal process. Spiring proposed an alternative loss function that called reflected normal loss function (RNLF). In this paper, we design a new control chart for overcome these disadvantage by using the Spiring's RNLF. And we demonstrate effectiveness of new control chart by comparing its average run length (ARL) with ${\bar{x}}-R$ control chart and expected loss control chart (ELCC).

• Korean Chemical Engineering Research
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• 제45권1호
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• pp.32-38
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• 2007

통계적인 공정 제어 기법을 회분식 공정에 적용하여, 일반적인 회분식 공정의 데이터를 통해 보다 빠르고, 손쉽게 공정의 상태를 진단할 수 있는 시스템을 구현해 보았다. 대표적인 회분식 공정의 하나인 반도체 식각공정과 반회분식 스타이렌-부타디엔 고무 생산 공정의 데이터를 이용하여 공정 변수와 공정의 상태간의 연관 관계를 규명할 수 있는 모델을 수립하였으며, 이 모델의 출력(output) 결과를 이용해 통계적 공정 제어 차트를 구성하고, 시간에 따른 공정의 추이를 분석해 이상을 판별해 보았다. 회분식 공정의 다축(multi-way) 데이터를 두개의 축으로 만드는 펼치기(unfolding) 과정을 거쳤으며, 모델링 방법으로는 Support Vector Regression 및 Partial Least Square 등의 다변량 회귀분석 방법을 이용하였다. 또한 에러차트 및 변수 기여도 차트(variable contribution chart)를 이용해 이상의 세기, 형태 및 이상 데이터에 대한 각 변수들의 기여도를 계산해 보았으며, 그 결과 이상의 발생 유무 및 발생시점 뿐만아니라 이상의 세기 및 원인 까지 진단해 볼 수 있는 우수한 성능을 보이는 것을 확인할 수 있었다.

• 산업경영시스템학회지
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• 제36권4호
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• pp.109-115
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• 2013

Process Capability Index (PCI) is useful Statistical Process Control (SPC) tool that is measure of process diagnostic and assessment tools widely use in industrial field. It has advantage of easy to calculate and easy to use in the field. $C_p$ and $C_{pk}$ are traditional PCIs. These are only considers of process variation. These are not given information about the characteristic value does not match the target value of the process. Studies of this process capability index by many scholars actively for supplement of its disadvantage. These studies to evaluate the capability of situation of various field has presented a new process capability index. $C_{pm}$ is considers both the process variation and the process deviation from target value. And $C_{pm}{^+}$ is considers economic loss for the process deviation from target value. In this paper development of new process capability index that is Taguchi's quadratic loss function by applying the expected loss. And check the correlation between existing traditional process capability index ($C_{pk}$) and new one. Finally, we propose the criteria for classification about developed process capability index.