• 제목/요약/키워드: Solid State Lighting

검색결과 58건 처리시간 0.032초

용융염을 이용한 다이아몬드 표면의 크롬카바이드 코팅 (Chromium Carbide Coating on Diamond Particle Using Molten Salts)

  • 정영우;김화정;안용식;최희락
    • 한국재료학회지
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    • 제28권7호
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    • pp.423-427
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    • 2018
  • For diamond/metal composites it is better to use diamond particles coated with metal carbide because of improved wettability between the diamond particles and the matrix. In this study, the coating of diamond particles with a chromium carbide layer is investigated. On heating diamond and chromium powders at $800{\sim}900^{\circ}C$ in molten salts of LiCl, KCl, $CaCl_2$, the diamond particles are coated with $Cr_7C_3$. The surfaces of the diamond powders are analyzed using X-ray diffraction and scanning electron microscopy. The average thickness of the $Cr_7C_3$ coating layers is calculated from the result of the particle size analysis. By using the molten salt method, the $Cr_7C_3$ coating layer is uniformly formed on the diamond particles at a relatively low temperature at which the graphitization of the diamond particles is avoided. Treatment temperatures are lower than those in the previously proposed methods. The coated layer is thickened with an increase in heating temperature up to $900^{\circ}C$. The coating reaction of the diamond particles with chromium carbide is much more rapid in $LiCl-KCl-CaCl_2$ molten salts than with the molten salts of $KCl-CaCl_2$.

Growth and characterization of molecular beam epitaxy grown GaN thin films using single source precursor with ammonia

  • Chandrasekar, P.V.;Lim, Hyun-Chul;Chang, Dong-Mi;Ahn, Se-Yong;Kim, Chang-Gyoun;Kim, Do-Jin
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2009년도 제38회 동계학술대회 초록집
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    • pp.174-174
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    • 2010
  • Gallium Nitride(GaN) attracts great attention due to their wide band gap energy (3.4eV), high thermal stability to the solid state lighting devices like LED, Laser diode, UV photo detector, spintronic devices, solar cells, sensors etc. Recently, researchers are interested in synthesis of polycrystalline and amorphous GaN which has also attracted towards optoelectronic device applications significantly. One of the alternatives to deposit GaN at low temperature is to use Single Source Molecular Percursor (SSP) which provides preformed Ga-N bonding. Moreover, our group succeeds in hybridization of SSP synthesized GaN with Single wall carbon nanotube which could be applicable in field emitting devices, hybrid LEDs and sensors. In this work, the GaN thin films were deposited on c-axis oriented sapphire substrate by MBE (Molecular Beam Epitaxy) using novel single source precursor of dimethyl gallium azido-tert-butylamine($Me_2Ga(N_3)NH_2C(CH_3)_3$) with additional source of ammonia. The surface morphology, structural and optical properties of GaN thin films were analyzed for the deposition in the temperature range of $600^{\circ}C$ to $750^{\circ}C$. Electrical properties of deposited thin films were carried out by four point probe technique and home made Hall effect measurement. The effect of ammonia on the crystallinity, microstructure and optical properties of as-deposited thin films are discussed briefly. The crystalline quality of GaN thin film was improved with substrate temperature as indicated by XRD rocking curve measurement. Photoluminescence measurement shows broad emission around 350nm-650nm which could be related to impurities or defects.

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Bactericidal Effect of a 275-nm UV-C LED Sterilizer for Escalator Handrails: Optimization of Optical Structure and Evaluation of Sterilization of Six Bacterial Strains

  • Kim, Jong-Oh;Jeong, Geum-Jae;Son, Eun-Ik;Jo, Du-Min;Kim, Myung-Sub;Chun, Dong-Hae;Kim, Young-Mog;Ryu, Uh-Chan
    • Current Optics and Photonics
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    • 제6권2호
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    • pp.202-211
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    • 2022
  • In the pasteurization of escalator handrails using ultraviolet (UV) sterilizers, a combination of light distribution and escalator speed has priority over other important factors. Furthermore, since part of the escalator handrail has a curved structure, proper design is needed to improve the sterilization rate on the surfaces touched by users. In this paper, two types of sterilizers satisfying these conditions are manufactured with 275-nm UV-C LEDs, after modeling the three-dimensional (3D) structure of an escalator handrail and simulating optical distributions of UV-C irradiation on the handrail's surface according to light-emitting diode (LED) positions and reflector variations in the sterilizers. Pasteurization experiments with the UV-C LED sterilizers are conducted on six types of gram-positive and gram-negative bacteria, with exposure times of 0.2, 5, and 15 s at an actual installation distance of 20 mm. The sterilization rates for the gram-positive bacteria are 10.63% to 27.94% at 0.2 s, 89.44% to 96.30% at 5 s, and 99.64% to 99.88% at 15 s. Those for the gram-negative bacteria are 57.70% to 77.63% at 0.2 s, 98.90% to 99.49% at 5 s, and 99.88% to 99.99% at 15 s. The power consumption of the UV-C LED sterilizer is about 8 W, which can be supplied by a self-generation module instead of an external power supply.

Excimer-Based White Phosphorescent OLEDs with High Efficiency

  • Yang, Xiaohui;Wang, Zixing;Madakuni, Sijesh;Li, Jian;Jabbour, Ghassan E.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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    • pp.1520-1521
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    • 2008
  • There are several ways to demonstrate white organic light emitting diodes (OLEDs) for displays and solid state lighting applications. Among these approaches are the stacked three primary or two complementary colors light-emitting layers, multiple-doped emissive layer, and excimer and exciplex emission [1-10]. We report on white phosphorescent excimer devices by using two light emitting materials based on platinum complexes. These devices showed a peak EQE of 15.7%, with an EQE of 14.5% (17 lm/W) at $500\;cd/m^2$, and a noticeable improvement in both the CIE coordinates (0.381, 0.401) and CRI (81). Devices with the structure ITO/PEDOT:PSS/TCTA (30 nm)/26 mCPy: 12% FPt (10 nm) /26 mCPy: 2% Pt-4 (15 nm)/BCP (40 nm)/CsF/Al [device 1], ITO/PEDOT:PSS/TCTA (30 nm)/26 mCPy: 2% Pt-4 (15 nm)/26 mCPy: 12% FPt (10 nm)/BCP (40 nm)/CsF/Al [device 2], and ITO/PEDOT:PSS/TCTA (30 nm)/26 mCPy: 2% Pt-4: 12% FPt (25 nm)/BCP (40 nm)/CsF/Al [device 3] were fabricated. In these cases, the emissive layer was either the double-layer of 26 mCPy:12% FPt and 15 nm 26 mCPy: 2% Pt-4, or the single layer of 26mCPy with simultaneous doping of Pt-4 and FPt. Device characterization indicates that the CIE coordinates/CRI of device 2 were (0.341, 0.394)/75, (0.295, 0.365)/70 at 5 V and 7 V, respectively. Significant change in EL spectra with the drive voltage was observed for device 2 indicating a shift in the carrier recombination zone, while relatively stable EL spectra was observed for device 1. This indicates a better charge trapping in Pt-4 doped layers [10]. On the other hand, device 3 having a single light-emitting layer (doped simultaneously) emitted a board spectrum combining emission from the Pt-4 monomer and FPt excimer. Moreover, excellent color stability independent of the drive voltage was observed in this case. The CIE coordinates/CRI at 4 V ($40\;cd/m^2$) and 7 V ($7100\;cd/m^2$) were (0.441, 0.421)/83 and (0.440, 0.427)/81, respectively. A balance in the EL spectra can be further obtained by lowering the doping ratio of FPt. In this regard, devices with FPt concentration of 8% (denoted as device 4) were fabricated and characterized. A shift in the CIE coordinates of device 4 from (0.441, 0.421) to (0.382, 0.401) was observed due to an increase in the emission intensity ratio of Pt-4 monomer to FPt excimer. It is worth noting that the CRI values remained above 80 for such device structure. Moreover, a noticeable stability in the EL spectra with respect to changing bias voltage was measured indicating a uniform region for exciton formation. A summary of device characteristics for all cases discussed above is shown in table 1. The forward light output in each case is approximately $500\;cd/m^2$. Other parameters listed are driving voltage (Bias), current density (J), external quantum efficiency (EQE), power efficiency (P.E.), luminous efficiency (cd/A), and CIE coordinates. To conclude, a highly efficient white phosphorescent excimer-based OLEDs made with two light-emitting platinum complexes and having a simple structure showed improved EL characteristics and color properties. The EQE of these devices at $500\;cd/m^2$ is 14.5% with a corresponding power efficiency of 17 lm/W, CIE coordinates of (0.382, 0.401), and CRI of 81.

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고상법을 이용한 LED용 SrGa2S4:Eu 녹색 형광체의 합성 및 발광특성 (Synthesis and Luminescence Characteristics of SrGa2S4:Eu Green Phosphor for Light Emitting Diodes by Solid-State Method)

  • 김재명;김경남;박정규;김창해;장호겸
    • 대한화학회지
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    • 제48권4호
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    • pp.371-378
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    • 2004
  • 기존의 $SrGa_2S_4:Eu^{2+}$ 녹색 발광 형광체는 주로 CRT (Cathode Ray Tube)용이나 FED (Field Emission Display), 그리고 EL (Electroluminescence)용 발광소자로 많이 연구되어졌다. 현재는 장파장 영역의 여기 특성을 이용한 LED (Light Emitting Diode)용 형광체로 주목 되어지고 있다. $SrGa_2S_4:Eu^{2+}$ 형광체의 일반적 합성 방법은 Flux를 이용하여 인체에 유해한 $H_2S$$CS_2$ 기체를 사용할 뿐만 아니라 높은 합성온도, 긴 반응시간 및 공정이 복잡한 단점을 지니고 있다. 따라서 본 실험은 황화물계 원료인 SrS, $Ga_2S_3$ 그리고 EuS를 출발 물질로 하여 $H_2S$ 기체를 사용하지 않고 혼합 기체$(5% H_2/95% N_2)$를 사용해 환원 분위기 하에서 $SrGa_2S_4:Eu^{2+}$을 합성하였다. 그리고 다양한 합성 조건과 LED용으로 사용되기 위해 수세처리와 Sieving 과정을 거친 형광체의 발광특성을 검토하였다.

실리콘 기판과 $CoSi_2$ 버퍼층 위에 HVPE로 저온에서 형성된 GaN의 에피텍셜 성장 연구 (GaN epitaxy growth by low temperature HYPE on $CoSi_2$ buffer/Si substrates)

  • 하준석;박종성;송오성;;장지호
    • 한국결정성장학회지
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    • 제19권4호
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    • pp.159-164
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    • 2009
  • 실리콘 기판에 GaN 에피성장을 확인하기 위해, P형 Si(100), Si(111) 기판 전면에 버퍼층으로 40 nm 두께의 코발트실리사이드를 형성시켰다. 형성된 코발트실리사이드 층에 연속으로 HVPE(hydride vapor phase epitaxy)로 하나는 $850^{\circ}C$-12분 + $1080^{\circ}C$-30분(공정I)과, 또 하나 조건은 $557^{\circ}C$-5분 + $900^{\circ}C$-5분(공정II) 조건으로 각각 나누어 진행하여 보았다. GaN의 에피성장을 광학현미경, 주사전자현미경, 주사탐침현미경, 그리고 HR-XRD로 확인하였다. 공정I로는 GaN의 에피성장이 진행되지 않았으며, 공정II에서는 에피성장이 진행되었다. 특히 공정 II는 열팽창에 의해 실리콘 기판과의 자가정렬적인 기판분리 현상을 보였으며, XRD로 GaN의 0002 방향의 결정성 (crystallinity)을 ${\omega}$-scan으로 확인한 결과(100)면 방향의\ 실리콘과 코발트실리사이드를 버퍼층으로 활용하고 저온에서 HVPE를 진행한 조합이 GaN의 에피성장에 유리하였다.

Control of electrical types in the P-doped ZnO thin film by Ar/$O_2$ gas flow ratio

  • Kim, Young-Yi;Han, Won-Suk;Kong, Bo-Hyun;Cho, Hyung-Koun;Kim, Jun-Ho;Lee, Ho-Seoung
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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    • pp.11-11
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    • 2008
  • ZnO has a very large exciton binding energy (60 meV) as well as thermal and chemical stability, which are expected to allow efficient excitonic emission, even at room temperature. ZnO based electronic devices have attracted increasing interest as the backplanes for applications in the next-generation displays, such as active-matrix liquid crystal displays (AMLCDs) and active-matrix organic light emitting diodes (AMOLEDs), and in solid state lighting systems as a substitution for GaN based light emitting diodes (LEDs). Most of these electronic devices employ the electrical behavior of n-type semiconducting active oxides due to the difficulty in obtaining a p-type film with long-term stability and high performance. p-type ZnO films can be produced by substituting group V elements (N, P, and As) for the O sites or group I elements (Li, Na, and K) for Zn sites. However, the achievement of p-type ZnO is a difficult task due to self-compensation induced from intrinsic donor defects, such as O vacancies (Vo) and Zn interstitials ($Zn_i$), or an unintentional extrinsic donor such as H. Phosphorus (P) doped ZnO thin films were grown on c-sapphire substrates by radio frequency magnetron sputtering with various Ar/ $O_2$ gas ratios. Control of the electrical types in the P-doped ZnO films was achieved by varying the gas ratio with out post-annealing. The P-doped ZnO films grown at a Ar/ $O_2$ ratio of 3/1 showed p-type conductivity with a hole concentration and hole mobility of $10^{-17}cm^{-3}$ and $2.5cm^2/V{\cdot}s$, respectively. X-ray diffraction showed that the ZnO (0002) peak shifted to lower angle due to the positioning of $p^{3-}$ ions with a smaller ionic radius in the $O^{2-}$ sites. This indicates that a p-type mechanism was due to the substitutional Po. The low-temperature photoluminescence of the p-type ZnO films showed p-type related neutral acceptor-bound exciton emission. The p-ZnO/n-Si heterojunction LEO showed typical rectification behavior, which confirmed the p-type characteristics of the ZnO films in the as-deposited status, despite the deep-level related electroluminescence emission.

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Enhancement of light extraction efficiency in vertical light-emitting diodes with MgO nano-pyramids structure

  • Son, Jun-Ho;Yu, Hak-Ki;Lee, Jong-Lam
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2010년도 춘계학술회의 초록집
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    • pp.16-16
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    • 2010
  • GaN-based light-emitting diodes (LEDs) are attracting great interest as candidates for next-generation solid-state lighting, because of their long lifetime, small size, high efficacy, and low energy consumption. However, for general illumination applications, the external quantum efficiency of LEDs, determined by the internal quantum efficiency (IQE) and the light extraction efficiency, must be further increased. The IQE is determined by crystal quality and epitaxial layer structure and high value of IQE more than 70% for blue LEDs have been already reported. However, there is much room for improvement of light extraction efficiency because most of the generated photons from active layer remain inside LEDs by total internal reflection at the interface of semiconductor with air due to the high refractive index difference between LEDs epilayer (for GaN, n=2.5) and air (n=1). The light confining in LEDs will be reabsorbed by the metal electrode or active layer, reducing the efficacy of LEDs. Here, we present the first demonstration of enhanced light extraction by forming a MgO nano-pyramids structure on the surface of vertical-LEDs. The MgO nano-pyramids structure was successfully fabricated at room temperature using conventional electron-beam evaporation without any additional process. The nano-sized pyramids of MgO are formed on the surface during growth due to anisotropic characteristics between (111) and (200) plane of MgO. The ZnO layer with quarter-wavelength in thickness is inserted between GaN and MgO layers to increase the critical angle for total internal reflection, because the refractive index of ZnO (n=1.94) could be matched between GaN (n=2.5) and MgO (n=1.73). The MgO nano-pyramids structure and ZnO refractive-index modulation layer enhanced the light extraction efficiency ofV-LEDs with by 49%, comparing with the V-LEDs with a flat n-GaN surface. The angular-dependent emission intensity shows the enhanced light extraction through the side walls of V-LEDs as well as through the top surface of the n-GaN, because of the increase in critical angle for total internal reflection as well as light scattering at the MgO nano-pyramids surface.

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