• KSII Transactions on Internet and Information Systems (TIIS)
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• v.18 no.7
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• pp.1817-1839
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• 2024

To solve the problem of insufficient recognition of key nodes in the existing software defect detection process, this paper proposes a key node recognition algorithm based on node expansion degree and improved K-shell position, shortened as SDD_KNR. Firstly, the calculation formula of node expansion degree is designed to improve the degree that can measure the local defect propagation capability of nodes in the software network. Secondly, the concept of improved K-shell position of node is proposed to obtain the improved K-shell position of each node. Finally, the measurement of node defect propagation capability is defined, and the key node recognition algorithm is designed to identify the key function nodes with large defect impact range in the process of software defect detection. Using real software systems such as Nano, Cflow and Tar to design three sets of experiments. The corresponding directed weighted software function invoke networks are built to simulate intentional attack and defect source infection. The proposed SDD_KNR algorithm is compared with the BC algorithm, K-shell algorithm, KNMWSG algorithm and NMNC algorithm. The changing trend of network efficiency and the strength of node propagation force are analyzed to verify the effectiveness of the proposed SDD_KNR algorithm.

• Journal of the Semiconductor & Display Technology
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• v.20 no.1
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• pp.88-93
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• 2021

The automotive industry is developing day by day. Among them, it is very important to prevent accidents while driving. However, despite the importance of developing automobile industry technology, accidents due to road defects increase every year, especially in the rainy season. To this end, we proposed a road defect detection system for road management by converging deep learning and raspberry pi, which show various possibilities. In this paper, we developed a system that visually displays through a map after analyzing the images captured by the Raspberry Pi and the route GPS. The deep learning model trained for this system achieved 96% accuracy. Through this system, it is expected to manage road defects efficiently at a low cost.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.14 no.2
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• pp.687-701
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• 2020

In the production of industrial fabric, it needs automatic real-time system to detect defects on the fabric for assuring the defect-free products flow to the market. At present, many visual-based methods are designed for detecting the fabric defects, but they usually lead to high false alarm. Base on this reason, we propose a Sobel operator combined with patch statistics (SOPS) algorithm for defects detection. First, we describe the defect detection model. mean filter is applied to preprocess the acquired image. Then, Sobel operator (SO) is applied to deal with the defect image, and we can get a coarse binary image. Finally, the binary image can be divided into many patches. For a given patch, a threshold is used to decide whether the patch is defect-free or not. Finally, a new image will be reconstructed, and we did a loop for the reconstructed image to suppress defects noise. Experiments show that the proposed SOPS algorithm is effective.

• Journal of KIISE:Software and Applications
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• v.37 no.5
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• pp.386-393
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• 2010

A defect in an image is a set of pixels forming an irregular shape. Since a defect, in most cases, is not easy to be modeled mathematically, the defect detection problem still resides in a research area. If a given image, however, composed by certain patterns, a defect can be detected by the fact that a non-defect area should be explained by another patch in terms of a rotation, translation, and noise. In this paper, therefore, the defect detection method for a repeated multi-patterned image is proposed. The proposed defect detection method is composed of three steps. First step is the interest point detection step, second step is the selection step of a appropriate patch size, and the last step is the decision step. The proposed method is illustrated using SEM images of semiconductor wafer samples.

• The KIPS Transactions:PartD
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• v.11D no.4
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• pp.873-884
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• 2004

This research provides the solution of defect problem and detection of defect and its causes that happen on software development. For developing a reliable software, a key factor is to find and manage defects that are during software development. Based on defect items analysis, we understand associated relation between defects and design defect opportunity tree. Developing the similar project, we can estimate defect and prepare to solve defect by using defect management opportunity tree.

• Journal of KIISE:Software and Applications
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• v.33 no.7
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• pp.605-614
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• 2006

The success of a software development project can be determined by the use of QCD. And as a software's size and complexity increase, the importance of early quality assurance rises. Therefore, more effort should be given to prevention, as opposed to correction. In order to provide a framework for the prevention of defects, defect detection activities such as peer review and testing, along with analysis of previous defects, is required. This entails a systematization and use of quality data from previous development efforts. FMEA, which is utilized for system safety assurance, can be applied as a means of software defect prevention. SW-FMEA (Software Failure Mode Effect Analysis) attempts to prevent defects by predicting likely defects. Presently, it has been applied to requirement analysis and design. SW-FMEA utilizes measured data from development activities, and can be used for defect prevention on both the development and management sides, for example, in planning, analysis, design, peer reviews, testing, risk management, and so forth. This research discusses about related methodology and proposes defect prevention model based on SW-FMEA. Proposed model is extended SW-FMEA that focuses on system analysis and design. The model not only supports verification and validation effectively, but is useful for reducing defect detection.

• 한국정보디스플레이학회:학술대회논문집
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• 2005.07a
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• pp.594-597
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• 2005

This paper shows that the defect detection in TFTarray panel can be improved by using newly developed software solution without adding additional hardware instruments. Some issues are reviewed in current TFT array test and new algorithm is explained for detecting more real defects without paying the penalty of reporting more false defects in TFT array test.

• Proceedings of the KIEE Conference
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• 1999.07b
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• pp.668-670
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• 1999

We have developed a automatic surface inspection system for cold Rolled strips in steel making process for several years. We have experienced the various kinds of surface inspection systems, including linear CCD camera type and the laser type inspection system which was installed in cold rolled strips production lines. But, we did not satisfied with these inspection systems owing to insufficient detection and classification rate, real time processing performance and limited line speed of real production lines. In order to increase detection and computing power, we have used the Dark Field illumination with Infra_Red LED, Bright Field illumination with Xenon Lamp, Parallel Computing Processor with Area typed CCD camera and full software based image processing technique for the ease up_grading and maintenance. In this paper, we introduced the automatic inspection system and real time image processing technique using the Object Detection, Defect Detection, Classification algorithms. As a result of experiment, under the situation of the high speed processed line(max 1000 meter per minute) defect detection is above 90% for all occurred defects in real line, defect name classification rate is about 80% for most frequently occurred 8 defect, and defect grade classification rate is 84% for name classified defect.

• Journal of Software Assessment and Valuation
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• v.15 no.1
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• pp.79-86
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• 2019

Software dimension reduction identifies the commonality of elements and extracts important feature elements. So it reduces complexity by simplify and solves multi-collinearity problems. And it reduces redundancy by performing redundancy and noise detection. In this study, we proposed defect severity-based dimension reduction model. Proposed model is applied defect severity-based NASA dataset. And it is verified the number of dimensions in the column that affect the severity of the defect. Then it is compares and analyzes the dimensions of the data before and after reduction. In this study experiment result, the number of dimensions of PC4's dataset is 2 to 3. It was possible to reduce the dimension.

• International Journal of Computer Science & Network Security
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• v.22 no.10
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• pp.1-10
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• 2022

Nowadays software defect prediction (SDP) is most active research going on in software engineering. Early detection of defects lowers the cost of the software and also improves reliability. Machine learning techniques are widely used to create SDP models based on programming measures. The majority of defect prediction models in the literature have problems with class imbalance and high dimensionality. In this paper, we proposed Centroid and Nearest Neighbor based Class Imbalance Reduction (CNNCIR) technique that considers dataset distribution characteristics to generate symmetry between defective and non-defective records in imbalanced datasets. The proposed approach is compared with SMOTE (Synthetic Minority Oversampling Technique). The high-dimensionality problem is addressed using Ant Colony Optimization (ACO) technique by choosing relevant features. We used nine different classifiers to analyze six open-source software defect datasets from the PROMISE repository and seven performance measures are used to evaluate them. The results of the proposed CNNCIR method with ACO based feature selection reveals that it outperforms SMOTE in the majority of cases.