• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.11
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• pp.87-95
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• 2004

This paper proposes a new test data compression/decompression method for SoC(Systems-on-a-Chip). The method is based on analyzing the factors that influence test parameters: compression ratio and hardware overhead. To improve compression ratio, the proposed method is based on Modified Statistical Coding (MSC) and Input Reduction (IR) scheme, as well as a novel mapping and reordering algorithm proposed in a preprocessing step. Unlike previous approaches using the CSR architecture, the proposed method is to compress original test data and decompress the compressed test data without the CSR architecture. Therefore, the proposed method leads to better compression ratio with lower hardware overhead than previous works. An experimental comparison on ISCAS '89 benchmark circuits validates the proposed method.

• ETRI Journal
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• v.42 no.4
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• pp.518-526
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• 2020

This paper presents an efficient hardware random-number generator based on a beta source. The proposed generator counts the values of "0" and "1" and provides a method to distinguish between pseudo-random and true random numbers by comparing them using simple cumulative operations. The random-number generator produces labeled data indicating whether the count value is a pseudo- or true random number according to its bit value based on the generated labeling data. The proposed method is verified using a system based on Verilog RTL coding and LabVIEW for hardware implementation. The generated random numbers were tested according to the NIST SP 800-22 and SP 800-90B standards, and they satisfied the test items specified in the standard. Furthermore, the hardware is efficient and can be used for security, artificial intelligence, and Internet of Things applications in real time.

• Journal of the Korean Chemical Society
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• v.60 no.5
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• pp.353-361
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• 2016

The goal of this study was to examine the current status of science teachers’ stage of concern (SOC) and level of use (LoU) on descriptive assessment and determine the relationship between SoC and LoU. To achieve this, concerns-based adoption model (CBAM) was used, and a survey was conducted on 138 science teachers. The data from this study were analyzed by frequency analysis, percentile analysis based on CBAM, χ² test, and Spearman correlation analysis. SoC and LoU of the science teachers observed in this study are as follows. First, the science teachers’ overall SoC for the descriptive assessment was low and showed a typical pattern of the initial stage when the program was introduced. Second, LoU analysis on descriptive assessment showed that the “mechanical Use” (N=49, 35.5%) or “routine” (N=48, 34.8%) accounted for the majority. Third, the Spearman correlation between SoC and LoU on descriptive assessment was .299(p<.01). This suggests that teachers’ SoC needs to be increased in order to promote higher LoU on descriptive assessment, which requires new alternative measures.

• Proceedings of the Korea Concrete Institute Conference
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• 2003.05a
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• pp.293-298
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• 2003

In this study, tensile adhesive strength(TAS) test was carreid out for evaluated the effects of temperature conditions(-20, -10, 5, 20, 30, $40^{\circ}C$) on the tensile adhesive characteristics about six waterproofing membranes which were commercially used in bridge decks. And, failure appeariences of waterproofing systems in each temperature were investigated and observed the sawing surfaces of waterproofing systems for whether or not damaged of waterproofing membranes. TAS test results were increased when test temperature was decrease in all waterproofing membrane. The type of failure was ductile in $30^{\circ}C$ and $40^{\circ}C$, but brittle failure below $20^{\circ}C$. This results were shown that if temperature above $30^{\circ}C$ is continued for a long time, waterproofing material will be damaged by softening and a part of membranes were damaged by hot aggregate in SMA. So we will consider the type of asphalt for choice of the waterproofing membranes.

• Journal of Korean Society for Quality Management
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• v.30 no.1
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• pp.74-96
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• 2002

The objectives of this study is to suggest the rectifying sampling inspection plan considering quality cost. Limiting quality level(LQL) plans(also called LTPD plans) and outgoing quality(OQ) plans are considered. The Hald's linear cost model is discussed with and without a beta prior for the distribution of the fraction of nonconforming items in a lot. It is assumed that the sampling inspection is error free. We consider the design of reliability acceptance sampling plan (RASP) for failure rate level qualification at selected confidence level. The lifetime distribution of products is assumed to be exponential. MIL-STD-690C and K C 6032 standards provide this procedures. But these procedures have some questions to apply in the field. The cost of test and confidence level(1-$\beta$ risk) are the problem between supplier and user. So, we suggest that the optimal life test sampling inspection plans using simple linear cost model considering product cost, capability of environment chamber, environmental test cost, and etc. Especially, we consider a reliability of lots that contain some nonconforming items. In this case we assumed that a nonconforming item fail after environmental life test. Finally, we develope the algorithm of the optimal sampling inspection plan based on minimum costs for rectifying inspection and RASP. And computer application programs are developed So, it is shown how the desired sampling plan can be easily found.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.1
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• pp.14-19
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• 2008

Semiconductor testing area challenges many testing issues due to the minimization and ultra high performance of current semiconductors. Among these issues, signal integrity test on interconnections must be solved for highly integrated circuits like SoC. In this paper, we propose an effective pattern application method for signal integrity test on interconnects. Proposed method can be applied by using boundary scan architecture and very efficient test can be preceded with pretty short test time.

• Nuclear Engineering and Technology
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• v.50 no.8
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• pp.1298-1305
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• 2018

The use of System-on-Chip (SoC) solutions in the design of on-board data handling systems is an important step towards further miniaturization in space. However, the Total Ionizing Dose (TID) and Single Event Effects (SEE) characterization of these complex devices present new challenges that are either not fully addressed by current testing guidelines or may result in expensive, cumbersome test configurations. In this paper we report the test setups, procedures and results for TID testing of a SoC microcontroller both using standard $^{60}Co$ and low-energy protons beams. This paper specifically points out the differences in the test methodology and in the challenges between TID testing with proton beam and with the conventional gamma ray irradiation. New test setup and procedures are proposed which are capable of emulating typical mission conditions (clock, bias, software, reprogramming, etc.) while keeping the test setup as simple as possible at the same time.

• Journal of the Korean Ceramic Society
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• v.28 no.8
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• pp.626-634
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• 1991

The specimens for the corrosion test were made by hot-pressing of SiC power with 2 wt% Nl2O3 and 10wt% Al2O3 additions at 200$0^{\circ}C$ and 205$0^{\circ}C$. The specimens were corroded in 37 mole% NaCl and 63 mole% Na2SO4 salt mixture at 100$0^{\circ}C$ up to 60 min. SiO2 layer was formed on SiC and then this oxide layer was dissolved by Na2O ion in the salt mixture. The rate of corrosion of the specimen containing 10 wt% Al2O3 was slower than that of the specimen containing 2 wt% Al2O3. This is due to the presence of continuous grain boundary phase in the specimen containing 10 wt% Al2O3. The oxidation of SiC produced gas bubbles at the SiC-SiO2 interface. The rate of corrosion follows a linear rate law up to 50 min. and then was accelerated. This acceleration is due to the disruption oxide layer by the gas evolution at SiC-SiO2 interface. Pitting corrosion has found at open pores and grain boundaries.

• Journal of the Korean Institute of Gas
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• v.3 no.3 s.8
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• pp.39-44
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• 1999

In the study, corrosion characteristics under various corrosion environments(neutral solution, acid solution), for various hinge materials(SM20C, BsC3 and STC4H), were investigated by immersion test, and the behaviour of fretting wear under atmosphere was studied. In immersion test, corrosion potential of those materials showed to be noble in the sequence of $0.5\%HNO_3$> underground water> $0.5\%\;H_2SO_4$ solution, and potential of a sole material, except BsC3, was more noble than these of mixed materials. In same material SM20C, the fretting wear loss of rotary materials increased about 1.9 times to that of moving materials, because of surface hardening by frictional force.

• Applied Chemistry for Engineering
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• v.17 no.5
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• pp.532-538
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• 2006

The carbonization and activation conditions for the PAN-based ACF of various grade were investigated to obtain the optimun activation condition with high surface area. And the surface properties and the absorption performance of toxic gas for terror were examined toward the PAN-ACF with the highest surface area. In the test results the surface area increased with increase of the activation temperature, but decreased with increase of the carbonization temperature. After carbonization condition ($900^{\circ}C$-15min) and activation condition ($900^{\circ}C$-30 min), we got the ACF with the highest surface area of $1204m^2/g$. In the absorption test of iodine and toxic gas for terror, this ACF showed more excellent absorption performance than the existing carbon-based adsorbent. Also, in order to give the function characteristic for a selective absorption, the stable nanoparticles of the Ag, Pt, Cu, Pd were prepared and impregnated on the PAN-based ACF in replacement of the existing method supporting metal catalysis. And were analyzed the surface characteristics and the $SO_{2}$ adsorption characteristics. In the $SO_{2}$ absorption performance test of the PAN-ACF with the impregnated nanoparticles, it wasn't change breakthrough time of Ag, Pt, Cu nanoparticle supported the PAN-ACF comparing with breakthrough time (326 sec) of the non supported PAN-ACF but Pd nanoparticle supported the PAN-ACF achieved excellent $SO_{2}$ absorption performance which has break-through time 925 sec.