• Title/Summary/Keyword: Simultaneous low-temperature plasma annealing

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Simultaneous Low-Temperature Plasma Annealing Process for Enhancing the Electrical Performance of a-IGZO Thin Film Transistors (a-IGZO 박막 트랜지스터의 전기적 성능 개선을 위한 동시 저온 플라즈마 어닐링 공정)

  • Jung Hun Choi;Jae-Yun Lee;Beom Gu Lee;Jung Moo Seo;Sung-Jin Kim
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.37 no.6
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    • pp.630-636
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    • 2024
  • The display industry has recently been at the forefront of innovative advancements in modern electronic devices. Technological progress such as flexible display holds significant potential across various application fields, particularly in wearable devices and rollable displays. A low-temperature process is essential for fabricating such displays. One of the key technologies in displays is the thin film transistor (TFT), with amorphous indium gallium zinc oxide (a-IGZO) receiving particular attention. a-IGZO is widely applied in high-performance displays due to its high charge mobility and stability. While a thermal treatment above 350℃ is typically required to maximize the electrical performance of a-IGZO TFTs, such high temperatures pose challenges for utilizing polymer substrates like plastics. Here, we thesis investigates the simultaneous low-temperature plasma annealing process to develop next-generation high-performance flexible display devices. To define the optimal temperature, devices were fabricated and analyzed at varying temperatures of 40℃, 80℃, 120℃, and 160℃. Experimental results indicated that devices fabricated at 160℃ and 80℃ exhibited superior performance, with those at 160℃ demonstrating better performance in terms of current ratio, threshold voltage, and subthreshold swing. These findings confirm that the simultaneous low-temperature plasma annealing process is effective for next-generation high-performance displays.