Analysis of An Anomalous Hump Phenomenon in Low-temperature Poly-Si Thin Film Transistors (저온 다결정 실리콘 박막 트랜지스터의 비정상적인 Hump 현상 분석)
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- Journal of the Korean Institute of Electrical and Electronic Material Engineers
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- v.24 no.11
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- pp.900-904
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- 2011