• 대한산업공학회지
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• 제34권3호
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• pp.328-336
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• 2008

This research proposes a method for economic-statistical design of adaptive moving average (A-MA) charts. The basic idea of the A-MA chart is to accumulate previous samples selectively in order to increase the sensitivity. The A-MA chart is a kind of adaptive chart such as the variable sampling size (VSS) chart. A major advantage of the A-MA chart over the VSS chart is that it is easy to maintain rational subgroups by using the fixed sampling size. A steady state cost rate function is constructed based on Lorenzen and Vance (1986) model. The cost rate function is optimized with respect to five design parameters. Computational experiments show that the A-MA chart is superior to the VSS chart as well as to the Shewhart $\bar{X}$ chart in the economic-statistical sense.

• International Journal of Quality Innovation
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• 제2권1호
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• pp.69-86
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• 2001

The economic design of control charts has been researched for over four decades since Duncan proposed the concept in 1956. Few studies, however, have focused attention on the economic design of a moving average (MA) control chart. An MA control chart is more effective than the Shewhart chart in detecting small process shifts [9]. This paper provides an economic model for determining the optimal parameters of an MA control chart with multiple assignable causes and two failures in the production process. These parameters consist of the sample size, the spread of the control limit and the sampling interval. A numerical example is shown and the sensitivity analysis shows that the magnitude of shift, rate of occurrence of assignable causes and increasing cost when the process is out of control have a more significant effect on the loss cost, meaning that one should more carefully estimate these values when conducting an economic analysis.

• 통합자연과학논문집
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• 제5권3호
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• pp.151-156
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• 2012

Because of the equivalence between control chart procedures and hypothesis testing, we propose to use likelihood ratio test (LRT) statistic $Z_i^2$ as the multivariate control statistic for simultaneous monitoring means of the multivariate normal process. Properties and comparisons of the proposed control charts are explored and conducted for matched fixed sampling interval (FSI) and variable sampling interval (VSI) with two sampling interval charts. The result of numerical comparisons shows that EWMA chart with two sampling interval procedure is more efficient than the corresponding FSI chart for small or moderate changes. When large shift of the process has occurred, we also found that Shewhart chart is more efficient than EWMA chart.

• 대한산업공학회지
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• 제31권1호
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• pp.87-98
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• 2005

This research investigates economic-statistical characteristics of variable sampling size and interval (VSSI)$\bar{X}$charts under two assignable causes. A Markov chain approach is employed in order to calculate average run length (ARL) and average time to signal (ATS). Six transient states are derived by carefully defining the state. A steady state cost rate function is constructed based on Lorenzen and Vance(1986) model. The cost rate function is optimized with respect to six design parameters for designing the VSSI $\bar{X}$ charts. Computational experiments show that the VSSI $\bar{X}$ chart is superior to the Shewhart $\bar{X}$ chart in the economic-statistical sense, even under two assignable causes. A comparative study shows that the cost rate may increase up to almost 30% by overlooking the second cause. Critical input parameters are also derived from a sensitivity study and a few guideline graphs are provided for determining the design parameters.

• Communications for Statistical Applications and Methods
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• 제22권5호
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• pp.519-530
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• 2015

The geometric chart has proven more effective than Shewhart p or np charts to monitor the proportion nonconforming in high-quality processes. Implementing a geometric chart commonly requires the assumption that the in-control proportion nonconforming is known or accurately estimated. However, accurate parameter estimation is very difficult and may require a larger sample size than that available in practice in high-quality process where the proportion of nonconforming items is very small. Thus, the error in the parameter estimation increases and may lead to deterioration in the performance of the control chart if a sample size is inadequate. We suggest adjusting the control limits in order to improve the performance when a sample size is insufficient to estimate the parameter. We propose a linear function for the adjustment constant, which is a function of the sample size, the number of nonconforming items in a sample, and the false alarm rate. We also compare the performance of the geometric charts without and with adjustment using the expected value of the average run length (ARL) and the standard deviation of the ARL (SDARL).

• 응용통계연구
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• 제35권6호
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• pp.725-737
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• 2022

통계적 공정 모니터링에서 관리 상태일 때 품질 특성치의 모수값은 하나의 값으로 지정하는 경우가 대부분이다. 그러나 관리 상태로부터 공정 모수의 작은 변화는 실제적으로 크게 중요하지 않은 경우, 품질 특성치의 모수 영역은 관리 상태, 무관심, 그리고 이상 상태의 세 영역으로 구성될 수 있다. 이 논문에서는 3개의 모수 영역이 있는 공정에 적용할 수 있는 두 가지 지수가중 이동평균(exponentially weighted moving average; EWMA) 관리도 절차를 제안하고, 제안된 절차의 성능을 Shewhart 관리도 및 누적합(cumulative sum; CUSUM) 관리도와 비교하여 그 효율을 평가하였다.

• 대한산업공학회지
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• 제39권5호
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• pp.422-428
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• 2013

In many cases, an $\bar{X}$ control chart which is based on the performance variable is used in industrial fields. However, if the performance variable is too costly or impossible to measure and a less expensive surrogate variable is available, the process may be more efficiently controlled using surrogate variables. In this paper, we propose a model for the economic design of a VSI (Variable Sampling Interval) $\bar{X}$ control chart using a surrogate variable that is linearly correlated with the performance variable. The total average profit model is constructed, which involves the profit per cycle time, the cost of sampling and testing, the cost of detecting and eliminating an assignable cause, and the cost associated with production during out-of-control state. The VSI $\bar{X}$ control charts using surrogate variables are expected to be superior to the Shewhart FSI (Fixed Sampling Interval) $\bar{X}$ control charts using surrogate variables with respect to the expected profit per unit cycle time from economic viewpoint.

• 산업공학
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• 제16권3호
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• pp.344-351
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• 2003

Critical dimension is one of the most important characteristics of up-to-date integrated circuit devices. Hence, critical dimension control in a semiconductor wafer fabrication process is inevitable in order to achieve optimum device yield as well as electrically specified functions. Currently, in complex semiconductor wafer fabrication processes, statistical methodologies such as Shewhart-type control charts become crucial tools for practitioners. Meanwhile, given a critical dimension sampling plan, the analysis of variance technique can be more effective to investigating critical dimension variation, especially for on-chip and on-wafer variation. In this paper, relating to a typical sampling plan, linear statistical models are presented for the analysis of critical dimension variation. A case study is illustrated regarding a semiconductor wafer fabrication process.

• 한국경영과학회:학술대회논문집
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• 대한산업공학회/한국경영과학회 1996년도 춘계공동학술대회논문집; 공군사관학교, 청주; 26-27 Apr. 1996
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• pp.15-18
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• 1996

Shewhart control chart is a basic technique to monitor the state of a process. We observe observations of a group of size four or five in a rational way and plot some statistics (e.g., means and ranges) on the chart. When setting up the control chart, the control limits are calculated based on preliminary 20-40 samples, which were supposedly obtained from stable operating conditions. But it may be hard to believe, especially at the beginning of constructing the chart for the first time, whether the process is stable and hence all samples were generated under the homogeneous operating conditions. In this report we suggest a mechanism to obtain robust control limits under self-criticism. When outliers are present in the sample, we obtain tighter control limits and hence increase the sensitivity of the chart. Examples will be given via simulation study.

• Communications for Statistical Applications and Methods
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• 제10권3호
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• pp.825-833
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• 2003

Knowing the time of the process change could lead to quicker identification of the responsible special cause and less process down time, and it could help to reduce the probability of incorrectly identifying the special cause. In this paper, we propose a maximum likelihood estimator of the process change point when a Shewhart $\bar{X}$ chart with variable sample size (VSS) scheme signals a change in the process mean. Also we build a confidence interval for the process change point by using the likelihood function.