• 제목/요약/키워드: SEM(Scanning electronic microscope)

검색결과 220건 처리시간 0.024초

다결정 실리콘 웨이퍼의 표면 텍스쳐링을 위한 습식 화학 식각에 대한 연구 (Investigation of Wet Chemical Etching for Surface Texturing of Multi-crystalline Silicon Wafers)

  • 김범호;이현우;이은주;이수홍
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2006년도 추계학술대회 논문집 Vol.19
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    • pp.19-20
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    • 2006
  • Two methods that can reduce reflectance in solar cells are surface texturing and anti-reflection coating. Wet chemical etching is a typical method that surface texturing of multi-crystalline silicon. Wet chemical etching methods are the acid texturization of saw damage on the surface of multi-crystalline silicon or double-step chemical etching after KOH saw damage removal too. These methods of surface texturing are realized by chemical etching in acid solutions HF-$HNO_3$-$H_2O$. In this solutions we can reduce reflectance spectra by simple process etching of multi-crystalline silicon surface. We have obtained reflectance of 27.19% m 400~1100nm from acidic chemical etching after KOH saw damage removal. This result is about 7% less than just saw damage removal substrate. The surface morphology observed by microscope and scanning electron microscopy (SEM).

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4H-SiC기판 위에 Aerosol Deposition으로 증착된 Al2O3박막의 후열처리 효과 (Post Annealing Effect on the Characteristics of Al2O3 Thin Films Deposited by Aerosol Deposition on 4H-SiC)

  • 유수산나;강민석;김홍기;이영희;구상모
    • 한국전기전자재료학회논문지
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    • 제27권8호
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    • pp.486-490
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    • 2014
  • $Al_2O_3$ films on silicon carbide were fabricated by Aerosol deposition with annealing temperature at $800^{\circ}C$ and $1,000^{\circ}C$. The effect of thermal treatment on physical properties of $Al_2O_3$ thin films has been investigated by XRD (X-ray diffraction), AFM (atomic force microscope), SEM (scanning electron microscope), and AES (auger electron spectroscopy). Also electrical properties have been investigated by Keithley 4,200 semiconductor parameter analyzer to explain the interface trapped charge density ($D_{it}$), flatband voltage ($V_{FB}$) and leakage current ($I_o$). $Al_2O_3$ films become crystallized with increasing temperature by calculating full width at half maximum (FWHM) of diffraction peaks, also surface morphology is observed by topography measurement in non-contact mode AFM. $D_{it}$ was $2.26{\times}10^{-12}eV^{-1}.cm^{-2}$ at $800^{\circ}C$ annealed sample, which is the lowest value in all samples. Also the sample annealed at $800^{\circ}C$ has the lowest leakage current of $4.89{\times}10^{-13}A$.

HVPE 방법에 의해 성장된 탄소 마이크로구의 특성 (Characterization of carbon microspheres grown by HVPE)

  • 이찬미;전헌수;박민아;이찬빈;양민;이삼녕;안형수;김석환;유영문;신기삼;배종성;이효석
    • 한국결정성장학회지
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    • 제25권2호
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    • pp.62-67
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    • 2015
  • 혼합소스 HVPE 방법을 사용하여 탄소 마이크로구를 합성하였다. 소스 물질로는 그래파이트 보트에 담겨 진 Ga, Al을 사용하였고 반응가스로 암모니아, 염산, 질소 가스를 사용하였다. 탄소 마이크로구의 합성은 $1090^{\circ}C$에서 실시하였다. 질소 가스는 5000, 염산 가스는 80, 암모니아 가스는 2000 sccm으로 공급되며 반응 시간은 3시간으로 하였다. 탄소 마이크로구의 SEM 측정 결과 수백 ${\mu}m$의 지름을 가지고 매끈한 표면을 가지는 완전한 구형 모양을 가짐을 알 수 있었다. XPS 결과 탄소 마이크로구의 내부는 탄소 71.78 wt%, 산소 15.37 wt%, 황 0.32 wt%, 규소 1.97 wt%로 구성되어 있었다. 또한 TEM 분석을 통해 탄소 마이크로구가 비정질임을 알 수 있었다. 탄소 마이크로구가 합성된 것은 에피 성장 과정 중에 배양판과 같이 홈이 파져 있는 공간에서 가스 간의 흡착 반응에 의해 탄소 마이크로구의 성분들이 합성된 것으로 판단된다.

HVPE 방법에 의해 성장된 graded AlGaN 에피층의 특성 (Characterizations of graded AlGaN epilayer grown by HVPE)

  • 이찬빈;전헌수;이찬미;전인준;양민;이삼녕;안형수;김석환;유영문
    • 한국결정성장학회지
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    • 제25권2호
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    • pp.45-50
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    • 2015
  • 본 논문에서는 Al 조성이 점진적으로 변화된 AlGaN 에피층을 HVPE (hydride vapor phase epitaxy) 방법에 의하여 성장하였다. 소스영역의 온도는 $950^{\circ}C$, 성장 영역의 온도는 $1145^{\circ}C$에서 연속적으로 (0001) 사파이어 기판위에 성장되었고, AlGaN 에피층은 시간당 100 nm의 성장률을 보였다. FE-SEM 측정과 EDS 측정으로부터 성장층의 Al 변화를 확인하였으며, AFM 측정결과 2인치 기판위에 성장된 graded AlGaN 에피층의 거칠기는 수십 nm였다. Al 조성의 변화는 XRD 측정에 의하여 확인하였으며, Al 조성 74 %의 (002) AlGaN의 주피크 관측과 함께 연속적으로 (002) AlN 층의 피크가 확인되었다. 이는 하나의 층에 사파이어 기판으로부터 Al 조성이 점진적으로 변화하는 에피층을 HVPE 방법으로 얻었음을 증명하며, 이 결과로부터 다양한 광소자 및 전자소자의 응용이 기대된다.

석영기판에 증착된 질화탄소막의 유전특성 (Dielectric Characteristics of Carbon Nitride Films on Quartz Substrate)

  • 하세근;이지공;이성필
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.2
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    • pp.872-875
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    • 2003
  • Carbon nitride($CN_x$) thin films were deposited on quartz substrates using reactive RF magnetron sputtering system at uarious deposition conditions and investigated dielectric characteristics. Samples for capacitance measurements were of the MIM(Metal-Insulator-Metal) type devices. Aluminum film electrodes were prepared by a vacuum thermal evaporation method before and after the deposition of carbon nitride films. Capacitances were measured by a FLUKE PM6306 RCL Meter at room temperature. Current-voltage(I-V) characteristics and resistivity were measured by a CATS CA-EDA semiconductor test and analyzer. The carbon nitride films showed ${\alpha}-C_3N_4$ and ${\beta}-C_3N_4$ etc. peaks through Raman and FTIR. Observed surface of film and side structure using SEM(Scanning Electron Microscope), and measured thickness of film by ${\alpha}-step$. We can find that the dielectric constant was the lowest value in 50% nitrogen ratio and the resistivity was the highest value in 70% nitrogen ratio.

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플라즈마 밀도와 기판의 기울임 정도에 따른 탄소나노튜브의 성장 (Synthesis of CNTs with plasma density and tilt degree of substrate)

  • 김경욱;최은창;박용섭;김형진;윤덕용;홍병유
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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    • pp.393-394
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    • 2008
  • Carbon nanotubes are attractive nano-structured materials because of their remarkable electronic, physical, chemical properties. Due to these reasons, application researches of CNTs are actively processed on the display, the electronic element, the nano-diode fields and the semiconductor element. Today, The major issue of semiconductor technique are via and interconnects. CNTs are used to make via and interconnects because of high electric currents density and high heat transfer. Control of the orientation of grown CNTs is very important thing for making via and interconnects. Via are horizontal growth of CNTs and interconnects are vertical growth of CNTs. This research is based on the experiment using control of gas flow directions and DC bias. Scanning Electron Microscope (SEM) was used to check this experiment.

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Characterization of recycled polycarbonate from electronic waste and its use in hydraulic concrete: Improvement of compressive performance

  • Colina-Martinez, Ana L. De la;Martinez-Barrera, Gonzalo;Barrera-Diaz, Carlos E.;Avila-Cordoba, Liliana I.;Urena-Nunez, Fernando
    • Advances in concrete construction
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    • 제5권6호
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    • pp.563-573
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    • 2017
  • Transparency, excellent toughness, thermal stability and a very good dimensional stability make Polycarbonate (PC) one of the most widely used engineering thermoplastics. Polycarbonate market include electronics, automotive, construction, optical media and packaging. One alternative for reducing the environmental pollution caused by polycarbonate from electronic waste (e-waste), is to use it in cement concretes. In this work, physical and chemical characterization of recycled polycarbonate from electronic waste was made, through the analysis by Fourier transform infrared spectroscopy (FTIR), X-ray diffraction (XRD), energy dispersive spectroscopy (EDS) and scanning electron microscope (SEM). Then cement concrete was made with Portland cement, sand, gravel, water, and this recycled polycarbonate. Specimens without polycarbonate were produced for comparison purposes. The effect of the particle sizes and concentrations of recycled polycarbonate within the concrete, on the compressive strength and density was studied. Results show that compressive strength values and equilibrium density of concrete depend on the polycarbonate particle sizes and its concentrations; particularly the highest compressive strength values were 20% higher than that for concrete without polycarbonate particles. Moreover, morphological, structural and crystallinity characteristics of recycled polycarbonate, are suitable for to be mixed into concrete.

Surface Modification by Atmospheric Pressure DBDs Plasma: Application to Electroless Ni Plating on ABS Plates

  • Song, Hoshik;Choi, Jin Moon;Kim, Tae Wan
    • Transactions on Electrical and Electronic Materials
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    • 제14권3호
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    • pp.133-138
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    • 2013
  • Acrylonitrile-butadiene-styrene (ABS) plastic is a polymer material extensively used in electrical and electronic applications. Nickel (Ni) thin film was deposited on ABS by electroless plating, after its surface was treated and modified with atmospheric plasma generated by means of dielectric barrier discharges (DBDs) in air. The method in this study was developed as a pre-treatment for electroless plating using DBDs, and is a dry process featuring fewer processing steps and more environmentally friendliness than the chemical method. After ABS surfaces were modified, surface morphologies were observed using a scanning electron microscope (SEM) to check for any physical changes of the surfaces. Cross-sectional SEM images were taken to observe the binding characteristics between metallic films and ABS after metal plating. According to the SEM images, the depths of ABS by plasma are shallow compared to those modified by chemically treatment. The static contact angles were measured with deionized (DI) water droplets on the modified surfaces in order to observe for any changes in chemical activities and wettability. The surfaces modified by plasma showed smaller contact angles, and their modified states lasted longer than those modified by chemical etching. Adhesion strengths were measured using 3M tape (3M 810D standard) and by 90° peel-off tests. The peel-off test revealed the stronger adhesion of the Ni films on the plasma-modified surfaces than on the chemically modified surfaces. Thermal shock test was performed by changing the temperature drastically to see if any detachment of Ni film from ABS would occur due to the differences in thermal expansion coefficients between them. Only for the plasma-treated samples showed no separation of the Ni films from the ABS surfaces in tests. The adhesion strengths of metallic films on the ABS processed by the method developed in this study are better than those of the chemically processed films.

Ni 박막 위 20 nm급 고정렬 Pt 크로스-바 구조물의 형성 방법 (Pattern Formation of Highly Ordered Sub-20 nm Pt Cross-Bar on Ni Thin Film)

  • 박태완;정현성;조영래;이정우;박운익
    • 대한금속재료학회지
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    • 제56권12호
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    • pp.910-914
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    • 2018
  • Since catalyst technology is one of the promising technologies to improve the working performance of next generation energy and electronic devices, many efforts have been made to develop various catalysts with high efficiency at a low cost. However, there are remaining challenges to be resolved in order to use the suggested catalytic materials, such as platinum (Pt), gold (Au), and palladium (Pd), due to their poor cost-effectiveness for device applications. In this study, to overcome these challenges, we suggest a useful method to increase the surface area of a noble metal catalyst material, resulting in a reduction of the total amount of catalyst usage. By employing block copolymer (BCP) self-assembly and nano-transfer printing (n-TP) processes, we successfully fabricated sub-20 nm Pt line and cross-bar patterns. Furthermore, we obtained a highly ordered Pt cross-bar pattern on a Ni thin film and a Pt-embedded Ni thin film, which can be used as hetero hybrid alloy catalyst structure. For a detailed analysis of the hybrid catalytic material, we used scanning electron microscope (SEM), transmission electron microscope (TEM) and energy-dispersive X-ray spectroscopy (EDS), which revealed a well-defined nanoporous Pt nanostructure on the Ni thin film. Based on these results, we expect that the successful hybridization of various catalytic nanostructures can be extended to other material systems and devices in the near future.

Structure and Properties of Polymer Infiltrated Alumina Thick Film via Inkjet Printing Process

  • Jang, Hun-Woo;Koo, Eun-Hae;Hwang, Hae-Jin;Kim, Jong-Hee
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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    • pp.207-207
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    • 2008
  • Modern industry has focused on processing that produce low- loss dielectric substrates used complex micron-sized devices using tick film technologies such as tape casting and slip casting. However, these processes have inherent disadvantages fabricating high density interconnect with embedded passives for high speed communication electronic devices. Here, we have successfully fabricated porous alumina dielectric layer infiltrated with polymer solution by using inkjet printing process. Alumina suspensions were formulated as dielectric ink that were optimized to use in inkjet process. The layer was confirmed by field emission scanning electron microscope (FE-SEM) for measuring microstructure and volume fraction. In addition, the reaction kinetics and electrical properties were characterized by FT-IR and the impedance analyzer. The volume fraction of alumina in porous dielectric alumina layer is around 70% much higher than that in the conventional process. Furthermore, after infiltration on the dielectric layer using polymer resins such as cyanate ester. Excellent Q factors of the dielectric is about 200 when confirmed by impedance analyzer without any high temperature process.

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