• Journal of the Korean Society of Radiology
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• v.4 no.3
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• pp.27-31
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• 2010

Spatial resolution is determined by the performance of x-ray optics used in the x-ray imaging system. A zone plate was designed for obtaining a high spatial resolution image at x-ray energy of 8.5keV. A spatial resolution of 80 nm was estimated by the ray tracing when an x-ray tube of tungsten targe was used instead of synchrotron radiation. The designed zone plate of outermost zone width of 40nm was successfully fabricated by the electron-beam lithography.

• Applied Microscopy
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• v.42 no.4
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• pp.218-222
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• 2012

Modern aberration-corrected transmission electron microscope (TEM) with appropriate electron beam energy is able to achieve atomic resolution imaging of single and bilayer graphene sheets. Especially, atomic configuration of bilayer graphene with a rotation angle can be identified from the direct imaging and phase reconstructed imaging since atomic resolution Moir$\acute{e}$ pattern can be obtained successfully at atomic scale using an aberration-corrected TEM. This study boosts a reliable stacking order analysis, which is required for synthesized or artificially prepared multilayer graphene, and lets graphene researchers utilize the information of atomic configuration of stacked graphene layers readily.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.51 no.4
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• pp.169-174
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• 2002

This paper presents a high-resolution capactive microaccelerometer using branched finger electrodes with high-amplitude sense voltage. From the fabricated microacceleromcter, the total noise is obtained as 9 $\mu\textrm{g}$/√Hz at the sense voltage of 16.5V, while the conventional microaccelerometers have shown the noire level of 25~800 $\mu\textrm{g}$/√Hz. We reduce the mechanical noise level of the microaccelerometer by increasing the proof-class based on deep RIE process of an SOI wafer. We reduce the electrical noise level by increasing the amplitude of AC sense voltage. The nonlinearity problem caused by the high-amplitude sense volage has been solved by a new electrode design of branched finger type, resulting in self force-balancing effects for the enhanced linearity and bandwidth. The fabricated microaccelerometer shows the electrical noise of 2.4 $\mu\textrm{g}$/√Hz at the sense voltage of 16.5V, which is an order of magnitude reduction of the electrical noise of 24.3 $\mu\textrm{g}$/√Hz measured at 0.9V. For the sense voltage higher than 2V, the electrical noise of the microaccelerometer is lower than the voltage-independent mechanical noise of 11 $\mu\textrm{g}$/√Hz. Total noise, composed of the electrical noise and the mechanical noire, has been measured as 9 $\mu\textrm{g}$/√Hz at the sense voltage of 16.5V, which is 31% of the total noise of 28.6 $\mu\textrm{g}$/√Hz at the sense voltage 0.9V. The self force-balancing effect in the blanched finger electrodes increases the stiffness of the microaccelerometer from 1.1N/m to 1.61N/m as the sense voltage increases from 0V to 17.8V, thereby generating additional stiffness at the rate of 0.0016$\pm$0.0008 N/m/V$^2$.

• Proceedings of the Korean Society of Medical Physics Conference
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• 2002.09a
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• pp.94-96
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• 2002

In order to achieve the radiotherapy more precisely using highly energetic heavy charged particles, it is important to know the distribution of the electron density in a human body, which is highly related to the range of charged particles. We can directly obtain the 2-D distribution of the electron density in a sample from a heavy ion CT image. For this purpose, we have developed a heavy ion CT system using a broad beam. The performance, especially the position resolution, of this system is estimated in this work. All experiments were carried out using the heavy ion beam from the HIMAC. We have obtained the projection data of polyethylene samples with various sizes using He 150 MeV/u, C 290 MeV/u and Ne 400 MeV/u beams. The used targets are the cylinders of 40, 60 and 80 mm in diameter, each of them has a hole of 10 mm in diameter at the center of it. The dependence of the spatial resolution on the target size and the kinds of beams will be discussed.

• Childhood Kidney Diseases
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• v.20 no.1
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• pp.18-22
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• 2016

Purpose: The previous reports regarding VUR resolution were not precise due to early frequent surgical intervention. We evaluated the spontaneous resolution (SR) rate and the incidence of new renal scars in primary VUR, focusing on severe reflux. Methods: Medical records of 334 patients with primary VUR who were on medical prophylaxis without surgery for 1 to 9 years, were retrospectively reviewed. Medical prophylaxis was initiated with low-dose antibiotic prophylaxis or probiotics. Radioisotope cystourethrography was performed every 1 to 3 years until SR of reflux. New renal scar was evaluated with follow-up $^{99m}Tc$ DMSA renal scan. Results: The SR rates decreased as VUR grades were getting higher (P=0.00). The overall and annual SR were 58.4% and 14.9%/yr in grade IV reflux and 37.5% and 9.3%/yr in grade V reflux. The median times of SR were 38 months in grade IV reflux and 66 months in grade V reflux. The probable SR rates in grade IV and V reflux were 7.8% and 8.9% in the 1st year, 46.0% and 30.8% in the 3rd year and 74.4% and 64.4% in the 5th year. The incidences of new renal scars between low to moderate reflux and severe reflux showed no significant difference (P=0.32). Conclusion: The SR rates of severe primary VUR were higher than previously reported and most new renal scars were focal and mild.

• Proceedings of the KSME Conference
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• 2001.06c
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• pp.53-58
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• 2001

This paper presents a high resolution capacitive microaccelerometer for applications to personal information systems. We reduce the mechanical noise level of the microaccelerometer by increasing the proof-mass based on deep RIE process. We reduce the electrical noise level by increasing the amplitude of an AC sense voltage. The high sense voltage is obtained by DC-to-DC voltage multiplier. In order to solve the nonlinearity problem caused by the high sense voltage, we modify the conventional comb electrode of straight finger type into that of branched finger type, resulting in self force-balancing effects for enhanced detection linearity. The proposed branched finger capacitive microaccelerometer was fabricated by the deep RIE process of an SOI wafer. The fabricated microaccelerometer reduces the electrical noise at the level of $2.4{\mu}g/\sqrt{Hz}$ for the sense voltage of l6.5V, which is 10.1 times smaller than the electrical noise level of $24.3{\mu}g/\sqrt{Hz}$ at 0.9V. For the sense voltage higher than 2V, the electrical noise level of the microaccelerometer became smaller than the constant mechanical noise level of $11{\mu}g/\sqrt{Hz}$. Total noise level, including the electrical noise and the mechanical noise, has been measured as $9{\mu}g/\sqrt{Hz}$ for the sense voltage of 16.5V, which is 3.2 times smaller than the total noise of $28.6{\mu}g/\sqrt{Hz}$ for the sense voltage of 0.9V. The self force-balancing effect results in the increased stiffness of 1.98 N/m at the sense voltage of 17.8V, compared to the stiffness of 1.35 N/m at 0V, thereby generating the additional stiffness at the rate of $0.002N/m/V^{2}$.

• Journal of Energy Engineering
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• v.23 no.1
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• pp.1-6
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• 2014

We have surveyed on microcalorimetry which we can treat with energy dispersive spectrometer(EDS) as wavelength dispersive spectrometer(WDS), to be developed in order to make higher energy resolution as to detect X-ray peak as high as wavelength dispersive spectrometer(WDS). When we take into consideration about energy resolution, Wavelength dispersive spectrometer is 2~20eV and energy dispersive spectrometer is 140~180eV.

• Journal of the Korean Vacuum Society
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• v.6 no.1
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• pp.97-102
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• 1997

A medium energy ion scattering spectroscopy(ME1S) system has been developed and tested.In the MEIS system a toroidal electrostatic energy analyzer(TEA) and a two dimensional position sensitivedetector(PSD) were used. The energy resolution of MEIS system was estimated to be less than $4\times 10^{-3}$ and the overall angular resolution was less than 0.3". From the MEIS spectrum of $Ta_2O_5$(300 $\AA$)/ onSi analyzedousing 60 keV $H^+$, the energy loss factor(S.1 and depth resolution were estimated to he 42 eV/$\AA$ and 9.7 $\AA$, respectively. Also Si(100) surface was analyzed using the MEIS system. A random MElSspectrum was obtained from thc Si(100) covered with native oxide layers. At the double alignment condition, MElS spectrum showed ;i Si surface peak, a oxygen peak and a carbon peak.nd a carbon peak.

• Communications for Statistical Applications and Methods
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• v.2 no.2
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• pp.404-413
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• 1995

2수준계 요인실험법에서 Kim(1992) 에 의해 균형배열을 이용하여 설계된 resolution V 포화균형부분실시법에서 추정량들의 공분산행렬을 계산하여 통계적 특성을 연구하였다. 이러한 부분실시법은 최소의 처리조합수를 가지고 주효과와 2인자 교호작용까지 분석할 수 있는 특징이 있다. 특히 본 논문에서는 인자의 수에 따라 설계가능한 8개의 부분실시법들간의 유사성과 통계적 효율성, 그리고 index number들의 변화에 따른 공분산행렬의 특성을 살펴보았다.

• Journal of Astronomy and Space Sciences
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• v.14 no.1
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• pp.59-66
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• 1997

The relationship between Mg II emission line and light variation of V711 Tau has been derived to investigate the chromospheric activity on V711 Tau. First, a shape of an optical light curve was compared with that of ultraviolet constructed from the IUE low resolution spectra. Second, the intensities of Mg II k emission lines have been reduced from IUE high resolution spectra. The intensity of Mg II k line was compared with brightness of the UV light curve at given phase. The Mg II line intensity is maximum at the phase $O.^{P}4$ where the light is minimum. The evidence of chromosperic activity is indicated by the intensity variation of the MgII emission line with orbital phase for V711 Tau.