• Title/Summary/Keyword: Resistance offset

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The Analysis of I-V characteristics on n-channel offset gated poly-Si TFT`s (Offset 구조를 갖는 n-채널 다결정 실리콘 박막 트랜지스터의 I-V 분석)

  • 변문기;이제혁;김동진;조동희;김영호
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.05a
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    • pp.26-29
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    • 1999
  • The I-V characteristics of the n-channel offset gated poly-Si TETs have been systematically investigated in order to analyse the effects of offset region. The on currents are reduced due to the series resistance by the offset length and there is no kink phenomenon in offset devices. The off currents of the offset gated TFTs are remarkably reduced to 10$^{-12}$ A independent of gate and drain voltage because the electric field is weakened by the increase of the depletion region width near the drain region. It is shown that the offset regions behave as a series resistance and reduce lateral and vertical electric field.

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Prediction of Residual Resistance Coefficient of Ships using Convolutional Neural Network (합성곱 신경망을 이용한 선박의 잉여저항계수 추정)

  • Kim, Yoo-Chul;Kim, Kwang-Soo;Hwang, Seung-Hyun;Yeon, Seong Mo
    • Journal of the Society of Naval Architects of Korea
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    • v.59 no.4
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    • pp.243-250
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    • 2022
  • In the design stage of hull forms, a fast prediction method of resistance performance is needed. In these days, large test matrix of candidate hull forms is tested using Computational Fluid Dynamics (CFD) in order to choose the best hull form before the model test. This process requires large computing times and resources. If there is a fast and reliable prediction method for hull form performance, it can be used as the first filter before applying CFD. In this paper, we suggest the offset-based performance prediction method. The hull form geometry information is applied in the form of 2D offset (non-dimensionalized by breadth and draft), and it is studied using Convolutional Neural Network (CNN) and adapted to the model test results (Residual Resistance Coefficient; CR). Some additional variables which are not included in the offset data such as main dimensions are merged with the offset data in the process. The present model shows better performance comparing with the simple regression models.

Electrical Characteristics of Poly-Si TFT`s with Improved Degradation (열화가 억제된 다결정 실리콘 박막 트랜지스터의 전기적 특성)

  • 변문기;이제혁;백희원;김동진;김영호
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.11a
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    • pp.457-460
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    • 1999
  • The effects of electrical positive stress on n-channel LDD and offset structured poly-Si TFT\`s have been systematically investigated in order to analyze the transfer curve\`s shift mechanism. It has been found that the LDD and offset regions behave as a series resistance that reduce the electric field near drain. Hot carrier effects are reduced because of these results. After electrical stress transfer curve’s shift and variation of the off-current are dependent upon the offset length rather than offset region’s doping concentration. Variation of the subthreshold slope is dependent upon offset region’s doping concentration as well as offset length.

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DC Offset Current Compensation Method of Transformeless Fuel Cell/PV PCS (무변압기형 연료전지/태양광용 PCS의 직류분 보상기법)

  • Park, Bong-Hee;Kim, Seung-Min;Choi, Ju-Yeop;Choy, Ick;Lee, Sang-Chul;Lee, Dong-Ha;Lee, Young-Kwon
    • Journal of the Korean Solar Energy Society
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    • v.33 no.6
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    • pp.92-97
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    • 2013
  • This paper proposes DC offset current compensation method of transformerless fuel cell/PV PCS. DC offset current is generated by the unbalanced internal resistance of the switching devices in full bridge topology. The other cause is the sensitivity of the current sensor, which is lower than DSP in resolution. If power converter system has these causes, the AC output current in the inverter will generate the DC offset. In case of transformerless grid-connected inverter system, DC offset current is fatal to grid-side, which results in saturating grid side transformer. Several simulation results show the difficulties of detecting DC offset current. Detecting DC offset current method consists of the differential amplifiers and PWM is compensated by the output of the Op amp circuit with integrator controller. PSIM simulation verifies that the proposed method is simpler and more effective than using low resolution current sensor alone.

An Offset Reduction Technique of High Speed Dynamic latch comparator (고속 다이나믹 래치 비교기의 오프셋 최소화 기법)

  • 현유진;성광수;서희돈
    • Proceedings of the IEEK Conference
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    • 2000.11b
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    • pp.160-163
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    • 2000
  • In this paper, we propose an efficient technique to minimize the input offset of a dynamic latch comparator. We analyzed offset due to charge injection mismatching and unwanted positive feedback during sampling phase. The last one was only considered in the previous works. Based on the analysis, we proposed a modified dynamic latch with initialization switch. The proposed circuit was simulated using 0.65$\mu\textrm{m}$ CMOS process parameter with 5v supply. The simulation results showed that the input offset is less than 5mv at 200㎒ sampling frequency and the input offset is improved about 80% compared with previous work in 5k$\Omega$ input resistance.

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Design and Fabrication of Oscillator Improving Q of Inductor Using Negative Resistance (부성저항을 이용한 인덕터의 Q값 개선과 이를 이용한 발진기의 설계 및 제작)

  • 권순철;윤영섭;류원열;최현철
    • Proceedings of the Korea Electromagnetic Engineering Society Conference
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    • 2001.11a
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    • pp.218-221
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    • 2001
  • In this paper, High Q Inductor using negative resistance circuit and the ceramic inductor was designed and fabricated at 2GHz. It was Improved the inductor of Q=90 using a inductor with Q=30 added to negative resistance circuit at 2GHz. As a result, at the bias condition of 3V and 16mA, the output power and phase noise in the operation frequency 2.01GHz are 5dBm and -115.34dBc/Hz at 100kHz offset from carrier, respectively. Phase noise was improved -10dBc/Hz at 100kHz offset compared to only using ceremic inductor.

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Effects of Accelerated Iso-Thermal Aging on Elastic-Plastic Fracture Toughness and Fracture Resistance Curve by Unloading Compliance Method in SA533B Low Alloy Steel (제하 컴플라이언스법에 의한 SA533B강의 $J_1C$ 및 J-R 곡선에 미치는 열시효 영향)

  • 윤한기;차귀준
    • Journal of Ocean Engineering and Technology
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    • v.8 no.2
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    • pp.157-165
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    • 1994
  • Effect of an accelerated iso-thermal aging (375 degree C x 66days, 375 degree C x 200days) on elastic-plastic fracture resistance curve were examined in SA533B low alloy steel. Fracture toughness test are conducted by unloading compliance method at room temperature. But the apparent negative crack growth phenomenon, usually arise in partial unloading compliance test. The phenomenon of negative crack growth may be eliminated by the offset technique. There is no effect of aging on J sub(IC) and dJ/da in iso-thermal aged (375 degree C x 66 days) specimen, but there is very little effect in iso-thermal aged (375 degree C x 200 days) specimen.

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Cancellation method of Second Order Distortion and DC-Offset in Down-Conversion Mixer (무선 수신기용 Down-Conversion mixer의 2차 비선형성과 DC-Offset 제거 기법)

  • Jung, Jae-Hoon;Hwang, Bo-Hyun;Kim, Shin-Nyoung;Jeong, Chan-Young;Lee, Mi-Young;Yoo, Chang-Sik
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.10 s.352
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    • pp.97-103
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    • 2006
  • This paper presents the method of improving second order intermodulation distortion(IMD2) and dc-offset problems in down-conversion mixer. A simple analysis reveals the IMD2 and dc-offset can be eliminated by controlling the duty cycles of local oscillator(LO) inputs. A mixer with the proposed method has been simulated with a $0.13{\mu}m$ RF CMOS technology with 5% mismatch in the load resistance, the mixer shows 2.04dBm IIP2 and 22mnV input referred DC-offset. By controlling two duty cycles of LO inputs, IIP2 and DC-offset can be improved to 38.8dBm and $777{\mu}V$, respectively.

Electrical characteristics of polysilicon thin film transistors with PNP gate (PNP 게이트를 가지는 폴리 실리콘 박막 트랜지스터의 전기적 특성)

  • 민병혁;박철민;한민구
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.3
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    • pp.96-106
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    • 1996
  • One of the major problems for poly-Si TFTs is the large off state leakage current. LDD (lightly doped drain) and offset gated structures have been employed in order to reduce the leakage current. However, these structures also redcue the oN current significantly due to the extra series resistance caussed by the LDD or offset region. It is desirable to have a device which would have the properties of the offset gated structure in the OFF state, while behaving like a fully gated device in the oN state. Therefore, we propose a new thin film transistor with pnp junction gate which reduce the leakage curretn during the OFF state without sacrificing the ON current during the ON state.

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An Experimental Study on the Thermal Resistance Characteristics of Layered Heat Sink (적층형 Heat Sink의 열저항 특성에 관한 실험적 연구)

  • 김종하;윤재호;권오경;이창식
    • Korean Journal of Air-Conditioning and Refrigeration Engineering
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    • v.13 no.4
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    • pp.271-287
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    • 2001
  • This paper has been made to investigate the thermal performance characteristics for the several types of layered aluminum heat sinks with offset-strip fin. Heat sinks with different fin height, fin length, number of fin layer and slanted fin are prepared and tested for natural convection as well as forced convection. The experimental results for layered heat sink(LHS) are compared to those for advanced pin fin heat sink (PHS) so that the appropriate heat sink can be designed or chosen according to the heating conditions. The overall heat transfer performances for LHS are almost comparable to those of PHS under natural convection, and become 1.2∼1.5 times as high as those of PHS under forced convection situation. This study shows that fin height and number of fin layer re important parameters, which have a serious influence on thermal performance for layered heat sinks.

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