• Korean Journal of Materials Research
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• v.5 no.6
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• pp.706-714
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• 1995

Silicon oxide thin films were deposited by remote plasma chemical vapor deposition (RPCYD). The effect of the operating variables, such as plasma power, deposition temperature and partial pressure of reactant on the material Properties of the silicon oxide film was investigated. By XPS, it was found out that the film was suboxide (O/Si<2) and small amount of nitrogen due to the plasma excitation was accumulated at the Si/SiO$_2$interface. The amount of dangling bonds at the Si/SiO$_2$interfaces were measured by ESR and the concentration of hydrogen bond was obtained by SIMS and FT-IR. The bond angle distribution(d$\theta$/$\theta$) was shown to be similiar to thermal oxide above 20$0^{\circ}C$ but the etch rate was higher than that of the thermal oxides due to the structural difference and the stress between silicon substrate and silicon oxide film.

• Journal of the Korea Institute of Military Science and Technology
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• v.12 no.4
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• pp.483-490
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• 2009

In this paper, a novel low-damage silicon nitride passivation for 100nm InAlAs/InGaAs MHEMTs has been developed using remote ICPCVD. The silicon nitride deposited by ICPCVD showed higher quality, higher density, and lower hydrogen concentration than those of silicon nitride deposited by PECVD. In particular, we successfully minimized the plasma damage by separating the silicon nitride deposition region remotely from ICP generation region, typically with distance of 34cm. The silicon nitride passivation with remote ICPCVD has been successfully demonstrated on GaAs MHEMTs with minimized damage. The passivated devices showed considerable improvement in DC characteristics and also exhibited excellent RF characteristics($f_T$of 200GHz).The devices with remote ICPCVD passivation of 50nm silicon nitride exhibited 22% improvement(535mS/mm to 654mS/mm) of a maximum extrinsic transconductance($g_{m.max}$) and 20% improvement(551mA/mm to 662mA/mm) of a maximum saturation drain current ($I_{DS.max}$) compared to those of unpassivated ones, respectively. The results achieved in this work demonstrate that remote ICPCVD is a suitable candidate for the next-generation MHEMT passivation technique.

• International Journal of Internet, Broadcasting and Communication
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• v.12 no.2
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• pp.90-97
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• 2020

Recently, with the growth of mixed reality industrial infrastructure, relevant convergence research has been proposed. For real-time mixed reality services such as remote video conferencing, the research on real-time acquisition-process-transfer methods is required. This paper aims to implement an AR remote rendering method of volumetric 3D video data. We have proposed and implemented two modules; one, the parsing module of the volumetric 3D video to a game engine, and two, the server rendering module. The result of the experiment showed that the volumetric 3D video sequence data of about 15 MB was compressed by 6-7%. The remote module was streamed at 27 fps at a 1200 by 1200 resolution. The results of this paper are expected to be applied to an AR cloud service.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.20 no.8
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• pp.6-14
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• 2006

This paper is a study about a proper method of plasma generation to cleaning method and a high frequency power equipment circuit to generation of plasma that used cleaning of chamber for TFT-LCD PECVD. The high density plasma required for cleaning causes a possibility of high density plasma more than $1{\times}10^{11}[EA/cm^3]$. It apply a ferrite core of ferromagnetic body to a existing ICP form. In case of power transfer equipment on 400[kHz] high frequency to generation of plasma it makes certain a stable switching operation in condition of plasma through using a inverter form for general purpose HB. And it demonstrates the performance of power transfer equipment using methods of measurement which use a transformer of series combination the density of plasma and the rate of dissolution of $NF_3$ in condition of $A_r\;and\;NF_3$.

• Proceedings of the Korean Vacuum Society Conference
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• 2000.02a
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• pp.183-183
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• 2000

Aigrain에 의해 Helicon이라는 이름이 명명된 이후, helicon은 저온의 금속과 같은 높은 전도도(conductivity)를 갖는 매질이나 강한 자기장이 걸려있는 plasma를 전파해 나가는 저주파 전자기장을 지칭해왔다. 이온화된 개스에서 이러한 전자기장은 전자 공명 주파수(electron cyclotron frequency)와 이온 공명 주파수(ion cyclotron frequency) 사이의 주파수로 전파하며 전리층 (ionosphere)을 통과하며 발생하는 가청 주파수 영역대의 음조가 강하하는 현상에 의해 low-frequency whistler라고도 불린다. Helicon wave plasma는 Boswell에 의해 처음 발생된 후, 높은 이온화율(~100%)로 인해 많은 연구가 이루어져 왔다. 1985년에 Chen은 helicon plasma의 높은 이온화율을 설명하기 위해 Landaudamping을 제시하였다. 이러한 설명은 1997년에 Shamrai에 의해 TG mode가 도입되기 전까지 직접적인 실험결과 없이 helicon plasma 발생의 mechanism으로 받아들여졌다. shamrai의 이론에 의하면 정전기파(electrostatic wave)는 plasma의 표면(surface)에서 강하게 감쇄되어 energy를 전달하게 된다. Cho는 radial density 분포가 외각보다 중심이 높을 경우 TG wave의 power 전달이 중심에서 일어날 수 있음을 계산하였다. Helicon plasma의 특성은 높은 이온화율에 의한 높은 밀도($\geq$1012cm3), 1-2 kW의 rf power에서 상대적으로 낮은 전자 온도( 4eV), $\omega$ci $\omega$LH<$\omega$ $\omega$ce $\omega$pe 영역대의 주파수, 자기장 50-1200 Gauss, 압력 1-10 mTorr로 특정지을 수 있다. 이러한 외부분수들의 조건에 k라 helicon plasma는 여러 종류의 mode로 존재한다. Degeling은 이러한 mode의 변화를 capacitive mode, inductive mode, 그리고 helicon mode(wave mode)의 세가지 부분으로 구분하였다. Helicon plasma가 갖는 높은 이온화율은 여러 가지 응용으로의 가능성을 가지고 있다. 그 예로 plasma processing, plasma wave에 의한 입자 가속, 그리고 가스 레이저 활성 매질 발생 등이 있다. 특히 plasma processing의 경우 helicon plasma는 높은 밀도, 비교적 낮은 자기장, remote operation 등이 가능하다는 점에서 현재 연구가 활발히 진행되고 있다. 상업용으로도 PMT와 Lucas Signatone Corp.에 서 helicon source가 제작되었다. 또한 높은 해리율을 이용하여 저유전 물질인 SiOF의 증착에서 적용되고 있다. 이 외에도 다수의 연구결과들이 발표되었다.

• Proceedings of the Korean Vacuum Society Conference
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• 1995.06a
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• pp.24-24
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• 1995

• Proceedings of the Materials Research Society of Korea Conference
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• 1997.10a
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• pp.69-69
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• 1997

• Proceedings of the Korean Vacuum Society Conference
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• 2002.02a
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• pp.167-167
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• 2002

• Proceedings of the Korean Vacuum Society Conference
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• 2002.02a
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• pp.168-168
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• 2002

• Proceedings of the Korean Vacuum Society Conference
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• 2001.07a
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• pp.55-55
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• 2001