• Journal of Information Display
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• v.12 no.4
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• pp.167-171
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• 2011

The angular distribution of the luminance on each optical component of 40-inch light-emitting diode backlight was measured and studied, using the optical-simulation method. Several scattering functions were investigated as the reflection distribution function of the scattering dots printed on the bottom surface of the light guide plate (LGP). It was found that both the diffuse Lambertian and near-specular Gaussian scattering functions were necessary for the successful reproduction of the experimental angular distribution of the luminance. The optimization of the scattering parameters included in these scattering functions led to almost the same luminance distribution as that obtained from the experiment. This approach may be an effective way of indirectly estimating the reflection distribution function of the scattering dots of the LGP, which cannot be made accessible through any other experimental method.

• Transactions of the Korean Society of Mechanical Engineers B
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• v.25 no.10
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• pp.1451-1458
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• 2001

The effects of a specularly reflecting surface on the wall heat flux and medium temperature distribution are studied. The system is an infinite square duct enclosing an absorbing and emitting medium. The walls are opaque, and black or gray. The walls emit diffusely but reflect diffusely or speculary. Heat is transferred by the combined effect of conduction and radiation. The radiative heat transfer is analyzed using direct discrete-ordinates method. The parameters under study are conduction, to radiation parameter, optical depth, wall emissivity, and reflection characteristics. The specular reflection and diffuse reflection show sizeable differences when the conduction to radiation parameter is less than around 0.01. The differences appear only either on the side wall heat flux or on the medium temperature profiles for the range of this study. The differences on the side wall heat flux are observed for optical thickness less than around 0.1 However the differences on the medium temperate profiles are found for optical thickness greater than around 1. The difference increase with increasing reflectance. The specular reflection increases the well heat flux gradient along the side wall.

• Journal of the Korean Institute of Telematics and Electronics T
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• v.35T no.3
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• pp.103-112
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• 1998

This paper proposes a propagation prediction model which can calculate a propagation path loss easily at option point in case of the propagation processing by repeat reflection when we analysis a propagation route, it makes the calculation speed which is the defect of a geometrical of image method and a ray-launching method improve and we develop and apply the algorithms which can do an angle of incidence, an angle of reflection with a propagation direct path, a reflection path and a maximum reflection number arithmetic process synchronously. Finally we choose as a sample which is the real road condition where is around SK telecoms chunnam branch office in wolgok-dong, kwangsan-ku, kwangju and simulate proposition model then we demonstrate the relative superiority with comparing the results.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.8
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• pp.572-579
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• 2003

By comparing the measured optical reflection spectra with calculated one by the transfer-matrix method (TMM) in epitaxial wafers for vertical-cavity surface-emitting lasers (VCSELs), we have estimated the systematic thickness errors in a simple and nondestructive way. The experimentally confirmed technique is based on the finding that the shape of the reflection spectra depends mainly on a newly defined single parameter, the effective error in the n-mirror layers, and the thickness error in the active cavity simply shifts the Fabry-Perot resonance wavelength. Also shown is that the proposed method is reliable when the relative standard deviation of the random thickness errors is less than 0.005. Because reflection spectra are routinely measured, we can easily estimate the thickness errors nondestructively with high spatial resolution.

• Korean Journal of Materials Research
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• v.28 no.12
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• pp.714-718
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• 2018

Anti-reflection thin films are fabricated on glass substrates using the screen printing method. Tetra ethyl silicate(TEOS) and methyl tri methoxy silane(MTMS) are used as starting materials and buthyl carbitol acetate(BCA) and buthyl cellusolve(BC) are mixed to improve the viscosity of the solution. Anti-reflection thin films are fabricated according to the number of the screen mesh and the characteristics improve as the mesh size increases. The transmittance and reflectance of the coated thin film using 325 mesh are about 94 % and 0.43 % in the visible wavelength. The thickness and refractive index of the AR thin film are 107 nm and n = 1.26, respectively.

• Journal of KIISE:Software and Applications
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• v.37 no.2
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• pp.104-109
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• 2010

The lighting reflection is a common problem in image analysis and causes the many difficulties to extract distinct features in related fields. Furthermore, the problem grows in the rainy night. In this paper, we aim to remove light reflection effects and reconstruct a road surface without lighting reflections in order to extract distinct features. The proposed method utilizes a 3D analysis based on a multiple geometry using captured images, with which we can combine each reflected areas; that is, we can remove lighting reflection effects and reconstruct the surface. At first, the regions of lighting sources and reflected surfaces are extracted by local maxima based on vertically projected intensity-histograms. After that, a fundamental matrix and homography matrix among multiple images are calculated by corresponding points in each image. Finally, we combine each surface by selecting minimum value among multiple images and replace it on a target image. The proposed method can reduces lighting reflection effects and the property on the surface is not lost. While the experimental results with collected data shows plausible performance comparing to the speed, reflection-overlapping areas which can not be reconstructed remain in the result. In order to solve this problem, a new reflection model needs to be constructed.

• Journal of the Korean Society for Nondestructive Testing
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• v.23 no.6
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• pp.577-582
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• 2003

This paper describes a new technique for thickness measurement of a very thin layer less than one-quarter of the wavelength of ultrasonic wave used in the ultrasonic pulse-echo measurements. The technique determines the thickness of a thin layer in a tapered medium from constructive interference of multiple reflection waves. The interference characteristics are derived and investigated in theoretical and experimental approaches. Modified total reflection wave g(t) defined as difference between total and first reflection waves increases in amplitude as the interfacial layer thickness decreases down to zero. A layer thickness less than one-tenth of the ultrasonic wavelength is measured using the maximum amplitude of g(t) with a good accuracy and sensitivity. The method also requires no inversion process to extract the thickness information from the waveforms of reflected waves, so that it makes possible to have the on-line thickness measurement of a thin layer such as a lubricating oil film in thrust bearings and journal bearings during manufacturing process.

• Journal of KSNVE
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• v.4 no.3
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• pp.295-305
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• 1994

The reflection coefficient of a material at oblique incidence is measured in a free field. The sound pressure distributions are measured at discrete points on two measurement lines and then decomposed into plane wave components by using spatial Fourier transform. The inciedent and reflected plane wave components are obtained from a set of "decomposition equations" of which uses the plane wave propagation theory. Numerical simulations and experiments have been performed to see the effect of finite size of measurement area. To reduce this effect, a window fuction has been performed to see the effects of finite size of mesurement area. To reduce this effect, a window function has been proposed and its effect on the measurement of sound absorbing material property has been studied as well. The reflection coefficient obtained by this method is compared with those obtained from other methods; 2-microphone method in a duct and an expirical equation of which determines the characteristic impedance .rho.c and propagation constant k of a material from flow resistance information.formation.

• Journal of Welding and Joining
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• v.14 no.6
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• pp.37-47
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• 1996

An ultrasonic testing uses the directivity of the ultrasonic wave which propagates in one direction. The directivity is expressed as the relationship between the propagate direction and its sound pressure. The directivity of ultrasonic wave is related to determination of testing sensitivity, scanning pitch and defect location. This paper investigated the directivity of ultrasonic wave, which scattered from slit defect located in heat-affected zone (HAZ) in butt joint using visualization method. The directivity of shear waves scattered from slit defect were different according to probe direction (far defect, near defect) and probe position (forward movement, maximum echo position, backward movement). The difference of directivity of reflection wave was existed between 2 MHz and 4 MHz angle probes. In the case of 2 MHz angle probe, the directivity of reflection wave was appeared sharp form because of the relation wave length and defect size.

• ETRI Journal
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• v.35 no.6
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• pp.1148-1151
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• 2013

We propose a way to measure the absorber reflectivity at a low cost. Only one simple antenna with a small radiating aperture and a frequency-domain instrument are utilized. The previously used equation for calculating the reflectivity of an absorber is inaccurate, and, therefore, a new equation is derived based on multiple reflection analysis and three test models. Notably, the reflection coefficient of the antenna is included in the derived equation. The accuracy of the proposed method is proven through simulation and measurements. It can be easily applied to a product examination by absorber manufacturers and customers owing to its advantages of simplicity, cost effectiveness, and non-cutting examination.