• 제목/요약/키워드: Reactive gases

검색결과 112건 처리시간 0.027초

A study on the TiN coating applied to a rolling wire probe

  • Song, Young-Sik;S. K. Yang;Kim, J.
    • 한국표면공학회:학술대회논문집
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    • 한국표면공학회 2003년도 추계학술발표회초록집
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    • pp.118-118
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    • 2003
  • In a rolling wire probe, a key component of an inspection apparatus for PDP electrode patterns, the electric performance of it is known to be strongly dependent on the surface condition of a collet pin, a needle pin, and a wire. However, the collet and needle pins rotate very rapidly in contact with each other, which results in the degradation of the surface by the heat and friction and finally the formation of black wear marks on the surface after a several hundred hours test. Once the black wear marks appear on the surface, the electric resistance of the probe increases sharply and so the integrity of the probe is severely damaged. In this experiment, TiN coating, which has excellent electric conductances and good wear-resistance, has been applied on the surface of collect and needle pins for preventing the surface damages. In order to achieve the homogeneous coating with a good adhesion property, special coating substrate stages and jigs were designed and applied during coating. TiN has been deposited using 99.999% Titanium target by a DC reactive sputtering method. According to the components and jigs, processing parameters, such as DC power, RF bias and the flow rate ratio of Ar and N$_2$ used as reactive gases, has been controlled to obtain good TiN films. Detailed problems and solutions for applying the new substrate stages and jigs will be discussed.

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The Influence of $O_2$ Gas on the Etch Characteristics of FePt Thin Films in $CH_4/O_2/Ar$ gas

  • Lee, Il-Hoon;Lee, Tea-Young;Chung, Chee-Won
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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    • pp.408-408
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    • 2012
  • It is well known that magnetic random access memory (MRAM) is nonvolatile memory devices using ferromagnetic materials. MRAM has the merits such as fast access time, unlimited read/write endurance and nonvolatility. Although DRAM has many advantages containing high storage density, fast access time and low power consumption, it becomes volatile when the power is turned off. Owing to the attractive advantages of MRAM, MRAM is being spotlighted as an alternative device in the future. MRAM consists of magnetic tunnel junction (MTJ) stack and complementary metal- oxide semiconductor (CMOS). MTJ stacks are composed of various magnetic materials. FePt thin films are used as a pinned layer of MTJ stack. Up to date, an inductively coupled plasma reactive ion etching (ICPRIE) method of MTJ stacks showed better results in terms of etch rate and etch profile than any other methods such as ion milling, chemical assisted ion etching (CAIE), reactive ion etching (RIE). In order to improve etch profiles without redepositon, a better etching process of MTJ stack needs to be developed by using different etch gases and etch parameters. In this research, influences of $O_2$ gas on the etching characteristics of FePt thin films were investigated. FePt thin films were etched using ICPRIE in $CH_4/O_2/Ar$ gas mix. The etch rate and the etch selectivity were investigated in various $O_2$ concentrations. The etch profiles were studied in varying etch parameters such as coil rf power, dc-bias voltage, and gas pressure. TiN was employed as a hard mask. For observation etch profiles, field emission scanning electron microscopy (FESEM) was used.

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산소 유량비 변화에 따른 AlN 박막의 구조, 표면 및 광학적 특성 (Structural, Morphological, and Optical Properties of AlN Thin Films Subjected to Oxygen Flow Ratio)

  • 조신호;김문환
    • 한국진공학회지
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    • 제19권4호
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    • pp.287-292
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    • 2010
  • 산소 유량비 변화에 따른 라디오파 반응성 마그네트론 스퍼터링 방법으로 성장된 AlN 박막의 구조, 표면 및 광학적 특성을 조사하였다. AlN 박막은 기판 온도 $300^{\circ}C$에서 성장되었으며, 반응성 가스로 질소와 산소 가스를 사용하였다. 산소 유량비는 공급되는 질소와 산소 혼합 가스양에 대한 산소의 유량비로 선택하여 0%, 10%, 15%, 20%, 25%, 30%로 제어하였다. 성장된 AlN 박막의 구조, 표면과 광학적 특성은 각각 X-선 회절장치, 전자주사현미경과 자외선-가시광 분광기를 사용하여 조사하였다. 산소 유량비 10%로 증착된 AlN 박막은 350~1,100 nm 파장 영역에서 평균 91.3%의 투과율과 4.30 eV의 광학 밴드갭 에너지를 나타내었다. 실험 결과는 산소 유량비를 변화시킴으로써 AlN 박막을 선택적으로 성장시킬 수 있음을 제시한다.

PEMOCVD of Ti(C,N) Thin Films on D2 Steel and Si(100) Substrates at Low Growth Temperatures

  • Kim, Myung-Chan;Heo, Cheol-Ho;Boo, Jin-Hyo;Cho,Yong-Ki;Han, Jeon-Geon
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 1999년도 제17회 학술발표회 논문개요집
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    • pp.211-211
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    • 1999
  • Titanium nitride (TiN) thin films have useful properties including high hardness, good electrical conductivity, high melting point, and chemical inertness. The applications have included wear-resistant hard coatings on machine tools and bearings, decorative coating making use of the golden color, thermal control coatings for widows, and erosion resistant coatings for spacecraft plasma probes. For all these applications as feature sizes shrink and aspect ratios grow, the issue of good step coverage becomes increasingly important. It is therefore essential to manufacture conformal coatings of TiN. The growth of TiN thin films by chemical vapor deposition (CVD) is of great interest for achieving conformal deposition. The most widely used precursor for TiN is TiCl4 and NH3. However, chlorine impurity in the as-grown films and relatively high deposition temperature (>$600^{\circ}C$) are considered major drawbacks from actual device fabrication. To overcome these problems, recently, MOCVD processes including plasma assisted have been suggested. In this study, therefore, we have doposited Ti(C, N) thin films on Si(100) and D2 steel substrates in the temperature range of 150-30$0^{\circ}C$ using tetrakis diethylamido titanium (TDEAT) and titanium isopropoxide (TIP) by pulsed DC plamsa enhanced metal-organic chemical vapor deposition (PEMOCVD) method. Polycrystalline Ti(C, N) thin films were successfully grown on either D2 steel or Si(100) surfaces at temperature as low as 15$0^{\circ}C$. Compositions of the as-grown films were determined with XPS and RBS. From XPS analysis, thin films of Ti(C, N) with low oxygen concentration were obtained. RBS data were also confirmed the changes of stoichiometry and microhardness of our films. Radical formation and ionization behaviors in plasma are analyzed by optical emission spectroscopy (OES) at various pulsed bias and gases conditions. H2 and He+H2 gases are used as carrier gases to compare plasma parameter and the effect of N2 and NH3 gases as reactive gas is also evaluated in reduction of C content of the films. In this study, we fond that He and H2 mixture gas is very effective in enhancing ionization of radicals, especially N resulting is high hardness. The higher hardness of film is obtained to be ca. 1700 HK 0.01 but it depends on gas species and bias voltage. The proper process is evident for H and N2 gas atmosphere and bias voltage of 600V. However, NH3 gas highly reduces formation of CN radical, thereby decreasing C content of Ti(C, N) thin films in a great deal. Compared to PVD TiN films, the Ti(C, N) film grown by PEMOCVD has very good conformability; the step coverage exceeds 85% with an aspect ratio of more than 3.

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Surface properties of Nb oxide thin films prepared by rf sputtering

  • 박주연;강용철
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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    • pp.306.2-306.2
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    • 2016
  • Niobium oxide thin films were synthesized by reactive rf magnetron sputtering. The target was metallic niobium with 2 inch in diameter and the substrate was n-type Si wafer. To control the surface properties of the films, Nb oxide thin films were obtained at various mixing ratios of argon and oxygen gases. Nb oxide thin films were analyzed with alpha step, scanning electron microscopy (SEM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS). The result of alpha step showed that the thickness of Nb oxide thin films were decreased with increasing the oxygen gas ratios. SEM images showed that the granular morphology was formed at 0% of oxygen gas ratio and then disappeared at 20 and 75% of oxygen gas ratio. The amorphous Nb oxide was observed by XRD at all films. The oxidation state of Nb and O were studied with high resolution Ni 2p and O 1s XPS spectra. And the change in the chemical environment of Nb oxide thin films was investigated by XPS with Ar+ sputtering.

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Gasification from Surface during Discharge and Thermal Processes in Plasma Display Panel (PDP)

  • Soh, Hyun;Lee, Sang-Moo;Kim, Young-Chai
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.495-498
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    • 2004
  • PDP use the mixture of inert gases to generate a discharge inside display pixels. Inside of PDP, there exist highly reactive conditions in the gap between two glass panels. MgO layer and phosphor have been investigated as a function of discharge and thermal process. Impurities such as CO, $CO_2$, OH and $H_2O$ in discharge region may deteriorate the characteristics of PDP operation during life time. Change of impurity generation of various MgO and phosphor surfaces were measured by using x-ray photoelectron spectroscopy(XPS) and quadropole mass spectrometer (QMS). Carbon containing species such as C, CO and $CO_2$ were drastically increased on the surfaces during discharge and thermal treatment. Carbon impurities on the MgO and phosphor are the dominant factor for their instability.

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난류연소 유동장에서의 확률밀도함수 전달방정식을 이용한 난류혼합 모델링 (Modeling of Turbulent Molecular Mixing by the PDF Balance Method for Turbulent Reactive Flows)

  • 문희장
    • 한국연소학회지
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    • 제2권1호
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    • pp.39-51
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    • 1997
  • A review of probability density function(PDF) methodology and direct numerical simulation for the purpose of modeling turbulent combustion are presented in this study where particular attention is focused on the modeling problem of turbulent molecular mixing term appearing in PDF transport equation. Existing mixing models results were compared to those evaluated by direct numerical simulation in a turbulent premixed medium with finite rate chemistry in which the initial scalar field is composed of pockets of partially burnt gases to simulate autoignition. Two traditional mixing models, the least mean square estimations(LMSE) and Curl#s model are examined to see their prediction capability as well as their modeling approach. Test calculations report that the stochastically based Curl#s approach, though qualitatively demonstrates some unphysical behaviors, predicts scalar evolutions which are found to be in good agreement with statistical data of direct numerical simulation.

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Surface Characterization of Low Temperature Plasma Treated Wool Fiber - The Effect of the Nature of Gas-

  • Kan, C.W.;Chan, K.;Yuen, C.W.M.
    • Fibers and Polymers
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    • 제5권1호
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    • pp.52-58
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    • 2004
  • Previous investigation results revealed that after the Low Temperature Plasma (LTP) treatment, the hydrophilicity of wool fiber was improved significantly. Such improvement enhances the wool dyeing and finishing processes which might be due to the changes of the wool surface to a more reactive one. In this paper, wool fibers were treated with LTP with different gases, namely, oxygen, nitrogen and gas mixture (25 % hydrogen/75 % nitrogen). Investigations showed that chemical composition of wool fiber surface varied differently with the different plasma gas used. The surface chemical composition of the different LTP-treated wool fibers was evaluated with different characterization methods, namely FTIR-ATR, XPS and saturated adsorption value. The experimental results were thoroughly discussed.

Laser CVD법에 의해 퇴적된 OXYNITRIDE막의 특성에 관한 고찰 (A study on the characteristics of the OXYNITRIDE film deposited by Laser CVD)

  • 김강덕;신상우;정문남;김종관;성영권
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1996년도 하계학술대회 논문집 C
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    • pp.1428-1430
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    • 1996
  • Thin Silicon oxynitride(SiON) films have been chemically deposited using 193nm ArF Excimer Laser CVD, with $Si_{2}H_{8}$, $N_{2}O$, and $NH_3$ as the reactive gases and $N_2$ as the carrier gas. Experimental results show that deposition rate and refractive index have a strong dependence on substrate temperature, chamber pressure, gas ratio, laser power and laser beam height. Electrical characterization of oxynitride films demonstrates that for $NH_{3}/N_{2}O$ flow ratios ranging from 0.25 to 1, the leakage currents, the interface trap density and the capacitances (dielect ric constant) increase and the dielectric breakdown fields decrease

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RF Magnetron Sputtering 법으로 제조된 AIN 박막에 관한 연구 (A study on the AIN thin films fabricated by RF magnetron sputtering)

  • 남창길;최승우;천희곤;조동율
    • 한국진공학회지
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    • 제6권1호
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    • pp.44-49
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    • 1997
  • 반응성 RF 스퍼터링 장치에 반응성 질소와 작업가스 아르곤을 동시에 주입하면서 Al을 스퍼터링하여 AIN박막을 형성하였다. polycarbonate기판이나 이 디스크 표면 위의 micron크기의 pregroove형태의 손상이 일어나지 않을 정도의 저온의 저온을 유지키 위하여 플라즈마(plasma) 자체 온도($100^{\circ}C$이하)로 가열하면서 silicon과 glass기판 위에 AIN박막을 증착시켰다. 여러 증착변수 변화에 따른 박막의 결정성, 단면형상 및 굴절율 변화 등을 분석 하였다.

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