• 제목/요약/키워드: Random Pattern

검색결과 603건 처리시간 0.024초

QR code as speckle pattern for reinforced concrete beams using digital image correlation

  • Krishna, B. Murali;Tezeswi, T.P.;Kumar, P. Rathish;Gopikrishna, K.;Sivakumar, M.V.N.;Shashi, M.
    • Structural Monitoring and Maintenance
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    • 제6권1호
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    • pp.67-84
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    • 2019
  • Digital Image Correlation technique (DIC) is a non-contact optical method for rapid structural health monitoring of critical infrastructure. An innovative approach to DIC is presented using QR (Quick Response) code based random speckle pattern. Reinforced Cement Concrete (RCC) beams of size $1800mm{\times}150mm{\times}200mm$ are tested in flexure. DIC is used to extract Moment (M) - Curvature (${\kappa}$) relationships using random speckle patterns and QR code based random speckle patterns. The QR code based random speckle pattern is evaluated for 2D DIC measurements and the QR code speckle pattern performs satisfactorily in comparison with random speckle pattern when considered in the context of serving a dual purpose. Characteristics of QR code based random speckle pattern are quantified and its applicability to DIC is explored. The ultimate moment-curvature values computed from the QR code based random speckled pattern are found to be in good agreement with conventional measurements. QR code encrypts the structural information which enables integration with building information modelling (BIM).

Low Cost Endurance Test-pattern Generation for Multi-level Cell Flash Memory

  • Cha, Jaewon;Cho, Keewon;Yu, Seunggeon;Kang, Sungho
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제17권1호
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    • pp.147-155
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    • 2017
  • A new endurance test-pattern generation on NAND-flash memory is proposed to improve test cost. We mainly focus on the correlation between the data-pattern and the device error-rate during endurance testing. The novelty is the development of testing method using quasi-random pattern based on device architectures in order to increase the test efficiency during time-consuming endurance testing. It has been proven by the experiments using the commercial 32 nm NAND flash-memory. Using the proposed method, the error-rate increases up to 18.6% compared to that of the conventional method which uses pseudo-random pattern. Endurance testing time using the proposed quasi-random pattern is faster than that of using the conventional pseudo-random pattern since it is possible to reach the target error rate quickly using the proposed one. Accordingly, the proposed method provides more low-cost testing solutions compared to the previous pseudo-random testing patterns.

랜덤 패턴 인증 방식의 개발을 위한 우도 기반 방향입력 최적화 (Likelihood-based Directional Optimization for Development of Random Pattern Authentication System)

  • 최연재;이현규;이상철
    • 한국멀티미디어학회논문지
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    • 제18권1호
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    • pp.71-80
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    • 2015
  • Many researches have been studied to overcome the weak points in authentication schemes of mobile devices such as pattern-authentication that is vulnerable for smudge-attack. Since random-pattern-lock authenticates users by drawing figure of predefined-shape, it can be a method for robust security. However, the authentication performance of random-pattern-lock is influenced by input noise and individual characteristics sign pattern. We introduce an optimization method of user input direction to increase the authentication accuracy of random-pattern-lock. The method uses the likelihood of each direction given an data which is angles of line drawing by user. We adjusted recognition range for each direction and achieved the authentication rate of 95.60%.

TRNG (순수 난수 발생기)의 테스트 기법 연구 (Test Methods of a TRNG (True Random Number Generator))

  • 문상국
    • 한국정보통신학회:학술대회논문집
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    • 한국해양정보통신학회 2007년도 춘계종합학술대회
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    • pp.803-806
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    • 2007
  • TRNG (True Random Number Generator)를 테스트 하는 방법은 PRNG (Pseudo Random Number Generator)나 산술연산기를 비롯한 결정적 (deterministic) 소자에 대한 테스트와는 많이 틀려서, 새로운 개념과 방법론이 제시되어야 한다. 하드웨어적으로 결정적인 소자들은 패턴을 사용한 테스트 (ATPG; automatic test pattern generation)에 의해 커버가 될 수 있지만, 순수 난수는 발생 결과의 아날로그적인 특성에 의하여 자동 패턴 생성 방식에 의해 소자를 테스트하기가 불가능하다. 본 논문에서는 하드웨어와 소프트웨어를 결합한 테스트 방식으로 테스트 패턴에 연속적인 패턴의 변화를 주면서 통계적으로 관찰하는 방식인 Diehard test라는 테스트 방식을 연구, 분석하고, 순수 난수의 테스트 시 고려해야 할 주안점을 제안한다.

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절삭 깊이의 무작위 제어를 적용한 다이아몬드 선삭공정에서 소재회전 반경에 따른 미세패턴의 크기변화 분석 연구 (A study on size variation of micro-pattern according to turning radius of workpiece in diamond turning with controlled random cutting depth)

  • 정지영;한준세;최두선;제태진
    • Design & Manufacturing
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    • 제14권1호
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    • pp.63-68
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    • 2020
  • Ultra-high brightness and thin displays need to optical micro-patterns which can uniformly diffuse the lights and low loss. The micro random patterns have characteristics to rise the optical efficiency such as light extraction, uniform diffusion. For this reason, various fabrication processes are studied for random patterns. In this study, the micro random patterns were machined by diamond turning which used a controlled cutting tool path with random cutting depth. The machined patterns had random shape and directionality along the circumferential direction. The average width and length of machined random pattern according to rotation radius were 40.13㎛~55.51㎛ and 37.25㎛~59.49㎛, and these results were compared with the designed result. Also, the machining error according to rotation radius in diamond turning using randomly controlled cutting depth was discussed.

이진 격자 패턴 이미지를 이용한 비접촉식 평면 구동기의 면내 위치(x, y, $\theta$) 측정 방법 (A Novel Measuring Method of In-plane Position of Contact-Free Planar Actuator Using Binary Grid Pattern Image)

  • 정광석;정광호;백윤수
    • 한국정밀공학회지
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    • 제20권7호
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    • pp.120-127
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    • 2003
  • A novel three degrees of freedom sensing method utilizing binary grid pattern image and vision camera is presented. The binary grid pattern image is designed by Pseudo-Random Binary Arrays and referenced to encode in-plane position of a moving stage of the contact-free planar actuator. First, the yaw motion of the stage is detected using fast image processing and then the other planar positions, x and y, are decoded with a sequence of images. This method can be applied to the system that needs feedback of in-plane position, with advantages of a good accuracy and high resolution comparable with the encoder, a relatively compact structure, no friction, and a low cost. In this paper, all the procedures of the above sensing mechanism are described in detail, including simulation and experiment results.

Random Walk Simulation for the Growth of Monolayer in Dip Pen Nanolithography

  • Kim, Hyojeong;Ha, Soojung;Jang, Joonkyung
    • Bulletin of the Korean Chemical Society
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    • 제34권1호
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    • pp.164-166
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    • 2013
  • Using a simple random walk model, this study simulated the growth of a self-assembled monolayer (SAM) pattern generated by dip-pen nanolithography (DPN). In this model, the SAM pattern grew mainly via the serial pushing of molecules deposited from the tip. This study examined various SAM patterns, such as lines, crosses and letters, by changing the tip scan speed.

파 포장에서 파밤나방 유충의 공간분포 (Spatial Distribution Pattern of Beet Armyworm, Spodoptera exigua(Hubner), Larvae in the Welsh Onion Field)

  • 고현관;최재승;엄기백;최귀문;김정화
    • 한국응용곤충학회지
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    • 제32권2호
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    • pp.134-138
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    • 1993
  • 파에서 파밤나방 유충의 시기별 공간분포 양식을 충남 아산군 인주면 파 재배 단지에서 조사하였다. 유충의 발생 최성기는 8월 중순과 9월 중하순으로 2회였고 유충의 공간분포 양식은 2가지 형으로 10월의 임의 분포를 제외하고는 모두 집중 분포를 하고 있었다. 유충의 영기별로 공간 분포 양식을 분석한 결과 각 영기 모두 집중분포를 하고 있었고 집중도는 영기가 낮을수록 높았다. 전남 광주와 무안 지방에서 기주 식물별로 파밤나방 유충의 공간 분포 양식을 조사한 결과 발생량이 많았던 고추, 대파 및 주기주 작물인 쪽파, 배추 무 등에서는 집중 분포를 하였고 녹두, 팥, 땅콩, 상치, 호박, 국화, 콩, 개비름 등 발생량이 적었던 작물에서는 임의 분포를 하였다.

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랜덤 패턴 투영을 이용한 스테레오 비전 시스템 기반 3차원 기하모델 생성 (3D geometric model generation based on a stereo vision system using random pattern projection)

  • 나상욱;손정수;박형준
    • 한국경영과학회:학술대회논문집
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    • 한국경영과학회/대한산업공학회 2005년도 춘계공동학술대회 발표논문
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    • pp.848-853
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    • 2005
  • 3D geometric modeling of an object of interest has been intensively investigated in many fields including CAD/CAM and computer graphics. Traditionally, CAD and geometric modeling tools are widely used to create geometric models that have nearly the same shape of 3D real objects or satisfy designers intent. Recently, with the help of the reverse engineering (RE) technology, we can easily acquire 3D point data from the objects and create 3D geometric models that perfectly fit the scanned data more easily and fast. In this paper, we present 3D geometric model generation based on a stereo vision system (SVS) using random pattern projection. A triangular mesh is considered as the resulting geometric model. In order to obtain reasonable results with the SVS-based geometric model generation, we deal with many steps including camera calibration, stereo matching, scanning from multiple views, noise handling, registration, and triangular mesh generation. To acquire reliable stere matching, we project random patterns onto the object. With experiments using various random patterns, we propose several tips helpful for the quality of the results. Some examples are given to show their usefulness.

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Random Pattern Testability of AND/XOR Circuits

  • Lee, Gueesang
    • Journal of Electrical Engineering and information Science
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    • 제3권1호
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    • pp.8-13
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    • 1998
  • Often ESOP(Exclusive Sum of Products) expressions provide more compact representations of logic functions and implemented circuits are known to be highly testable. Motivated by the merits of using XOR(Exclusive-OR) gates in circuit design, ESOP(Exclusive Sum of Products) expressions are considered s the input to the logic synthesis for random pattern testability. The problem of interest in this paper is whether ESOP expressions provide better random testability than corresponding SOP expressions of the given function. Since XOR gates are used to collect product terms of ESOP expression, fault propagation is not affected by any other product terms in the ESOP expression. Therefore the test set for a fault in ESOP expressions becomes larger than that of SOP expressions, thereby providing better random testability. Experimental results show that in many cases, ESOP expressions require much less random patterns compared to SOP expressions.

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