• Structural Monitoring and Maintenance
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• v.6 no.1
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• pp.67-84
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• 2019

Digital Image Correlation technique (DIC) is a non-contact optical method for rapid structural health monitoring of critical infrastructure. An innovative approach to DIC is presented using QR (Quick Response) code based random speckle pattern. Reinforced Cement Concrete (RCC) beams of size $1800mm{\times}150mm{\times}200mm$ are tested in flexure. DIC is used to extract Moment (M) - Curvature (${\kappa}$) relationships using random speckle patterns and QR code based random speckle patterns. The QR code based random speckle pattern is evaluated for 2D DIC measurements and the QR code speckle pattern performs satisfactorily in comparison with random speckle pattern when considered in the context of serving a dual purpose. Characteristics of QR code based random speckle pattern are quantified and its applicability to DIC is explored. The ultimate moment-curvature values computed from the QR code based random speckled pattern are found to be in good agreement with conventional measurements. QR code encrypts the structural information which enables integration with building information modelling (BIM).

• JSTS:Journal of Semiconductor Technology and Science
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• v.17 no.1
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• pp.147-155
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• 2017

A new endurance test-pattern generation on NAND-flash memory is proposed to improve test cost. We mainly focus on the correlation between the data-pattern and the device error-rate during endurance testing. The novelty is the development of testing method using quasi-random pattern based on device architectures in order to increase the test efficiency during time-consuming endurance testing. It has been proven by the experiments using the commercial 32 nm NAND flash-memory. Using the proposed method, the error-rate increases up to 18.6% compared to that of the conventional method which uses pseudo-random pattern. Endurance testing time using the proposed quasi-random pattern is faster than that of using the conventional pseudo-random pattern since it is possible to reach the target error rate quickly using the proposed one. Accordingly, the proposed method provides more low-cost testing solutions compared to the previous pseudo-random testing patterns.

• Journal of Korea Multimedia Society
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• v.18 no.1
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• pp.71-80
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• 2015

Many researches have been studied to overcome the weak points in authentication schemes of mobile devices such as pattern-authentication that is vulnerable for smudge-attack. Since random-pattern-lock authenticates users by drawing figure of predefined-shape, it can be a method for robust security. However, the authentication performance of random-pattern-lock is influenced by input noise and individual characteristics sign pattern. We introduce an optimization method of user input direction to increase the authentication accuracy of random-pattern-lock. The method uses the likelihood of each direction given an data which is angles of line drawing by user. We adjusted recognition range for each direction and achieved the authentication rate of 95.60%.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2007.06a
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• pp.803-806
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• 2007

Since the different characteristics from the PRNG (Pseudo Random Number Generator) or various deterministic devices such as arithmetic processing units, new concepts and test methods should be suggested in order to test TRNG (Ture Random Number Generator). Deterministic devices can be covered by ATPG (Automatic Test Pattern Generation), which uses patterns generated by cyclic shift registers due to its hardware oriented characteristics, pure random numbers are not possibly tested by automatic test pattern generation due to its analog-oriented characteristics. In this paper, we studied and analyzed a hardware/software combined test method named Diehard test, in which we apply continuous pattern variation to check the statistics. We also point out the considerations when making random number tests.

• Design & Manufacturing
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• v.14 no.1
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• pp.63-68
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• 2020

Ultra-high brightness and thin displays need to optical micro-patterns which can uniformly diffuse the lights and low loss. The micro random patterns have characteristics to rise the optical efficiency such as light extraction, uniform diffusion. For this reason, various fabrication processes are studied for random patterns. In this study, the micro random patterns were machined by diamond turning which used a controlled cutting tool path with random cutting depth. The machined patterns had random shape and directionality along the circumferential direction. The average width and length of machined random pattern according to rotation radius were 40.13㎛~55.51㎛ and 37.25㎛~59.49㎛, and these results were compared with the designed result. Also, the machining error according to rotation radius in diamond turning using randomly controlled cutting depth was discussed.

• Journal of the Korean Society for Precision Engineering
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• v.20 no.7
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• pp.120-127
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• 2003

A novel three degrees of freedom sensing method utilizing binary grid pattern image and vision camera is presented. The binary grid pattern image is designed by Pseudo-Random Binary Arrays and referenced to encode in-plane position of a moving stage of the contact-free planar actuator. First, the yaw motion of the stage is detected using fast image processing and then the other planar positions, x and y, are decoded with a sequence of images. This method can be applied to the system that needs feedback of in-plane position, with advantages of a good accuracy and high resolution comparable with the encoder, a relatively compact structure, no friction, and a low cost. In this paper, all the procedures of the above sensing mechanism are described in detail, including simulation and experiment results.

• Bulletin of the Korean Chemical Society
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• v.34 no.1
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• pp.164-166
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• 2013

Using a simple random walk model, this study simulated the growth of a self-assembled monolayer (SAM) pattern generated by dip-pen nanolithography (DPN). In this model, the SAM pattern grew mainly via the serial pushing of molecules deposited from the tip. This study examined various SAM patterns, such as lines, crosses and letters, by changing the tip scan speed.

• Korean journal of applied entomology
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• v.32 no.2
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• pp.134-138
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• 1993

Larval densities and spatial distribution patterns of beet armyWorm, Spodoptera exigua, were studied in the welsh onion field located in Asan from June to November, 1991. During the period, there were two denslty-peaks;mid August and mid~late September. The larvae showed clumped distribution patterns. but the patterns changed into random as larval density decreased in Oct.ober. Each larval instar showed clumped pattern expect 6th instar surveyed on September 25, which distributed in a random pattern. The larval distribution pattern were also influenced by the host plants;clumped pattern on such host. as red pepper and welsh onion, versus random pattern on such hosts as chrysanthemum, peanut and soybean.

• Proceedings of the Korean Operations and Management Science Society Conference
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• 2005.05a
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• pp.848-853
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• 2005

3D geometric modeling of an object of interest has been intensively investigated in many fields including CAD/CAM and computer graphics. Traditionally, CAD and geometric modeling tools are widely used to create geometric models that have nearly the same shape of 3D real objects or satisfy designers intent. Recently, with the help of the reverse engineering (RE) technology, we can easily acquire 3D point data from the objects and create 3D geometric models that perfectly fit the scanned data more easily and fast. In this paper, we present 3D geometric model generation based on a stereo vision system (SVS) using random pattern projection. A triangular mesh is considered as the resulting geometric model. In order to obtain reasonable results with the SVS-based geometric model generation, we deal with many steps including camera calibration, stereo matching, scanning from multiple views, noise handling, registration, and triangular mesh generation. To acquire reliable stere matching, we project random patterns onto the object. With experiments using various random patterns, we propose several tips helpful for the quality of the results. Some examples are given to show their usefulness.

• Journal of Electrical Engineering and information Science
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• v.3 no.1
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• pp.8-13
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• 1998

Often ESOP(Exclusive Sum of Products) expressions provide more compact representations of logic functions and implemented circuits are known to be highly testable. Motivated by the merits of using XOR(Exclusive-OR) gates in circuit design, ESOP(Exclusive Sum of Products) expressions are considered s the input to the logic synthesis for random pattern testability. The problem of interest in this paper is whether ESOP expressions provide better random testability than corresponding SOP expressions of the given function. Since XOR gates are used to collect product terms of ESOP expression, fault propagation is not affected by any other product terms in the ESOP expression. Therefore the test set for a fault in ESOP expressions becomes larger than that of SOP expressions, thereby providing better random testability. Experimental results show that in many cases, ESOP expressions require much less random patterns compared to SOP expressions.