• Journal of Digital Contents Society
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• v.13 no.4
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• pp.491-500
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• 2012

In this paper, a new loopback BIST structure which is effective to test RF transceiver chip and LNA(Low Noise Amplifier) in the chip is presented. Because the presented BIST structure uses a baseband processor in the chip as a tester while the system is under testing mode, the developed test technique has an advantage of performing test application and test evaluation in effectiveness. The presented BIST structure can change high frequency test output signals to a low frequency signals which can make the CUT(circuits under test) tested easily. By using this technique, the necessity of RF test equipment can be mostly reduced. The test time and test cost of RF circuits can be cut down by using proposed BIST structure, and finally the total chip manufacturing costs can be reduced.

• Journal of Astronomy and Space Sciences
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• v.16 no.2
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• pp.191-198
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• 1999

Results of RF compatibility test between KOMPSAT(Korea Multi-Purpose SATellite) and TTC(Tracking, Telemetry, and Command) station are described. S/C(Spacecreft) RF Test, telemetry test, command test, ranging test, and tracking receiver test were performed with respect to pass/fail criteria. To provide physical RF interface between KOMPSAT and TTC equipment, direct low cable and antenna-to-antenna interface were implemented. Through RF compatibility test, it was fully demonstrated that KOMPSAT and TTC equipment are functionally workable.

• Journal of Satellite, Information and Communications
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• v.1 no.2
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• pp.45-50
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• 2006

A satellite and ground stations which are developed in a program are tested whether the interface between the satellite and ground is well established before satellite operations. These compatibility tests are performed when the satellite is connected with the ground stations after all satellite and ground stations requirements are verified. The content of the RF compatibility test is to check whether the interface requirements which are described on the Interface Control Document are well developed. During the early operation phase and tentative contingency operations of the satellite, KARI ground station uses other oversea ground stations which are located worldwide according to contract between the KARI and the contractor. Since oversea ground stations were not developed for the designated space program, system integrator should check whether the oversea ground stations are satisfied with interface requirements. Using the RF suitcase, RF interface and the content of RF communication can directly be verified during RF compatibility test on oversea ground station without KARI ground station's support. The RF compatibility test using RF suitcase was performed oversea ground stations as well as KARI ground station located on Korea. The content of RF compatibility test was standardized in order to be used at any oversea ground stations, especially fitted for the operations concept of launch and early operations phase. The test content would be RF characteristics, protocol, command loop test, telemetry loop test, and ground station interface test.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• v.9 no.1
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• pp.1004-1007
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• 2005

This paper presents a programmable RF BIST (Built-in Self-Test) circuit for low noise amplifiers. We have developed a new on-chip RF BIST circuit that measures RF parameters of low noise amplifier (LNA) using only DC measurements. The BIST circuit contains test amplifier with programmable capacitor banks and RF peak detectors. The test circuit utilizes output DC voltage measurements and these measured values are translated into the LNA specifications such as input impedance and gain using the mathematical equations. Our on-chip BIST can be self programmed for 1.8GHz, 2.4GHz and 5.25GHz LNA for GSM, Bluetooth and IEEE802.11g standards.

• Aerospace Engineering and Technology
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• v.7 no.2
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• pp.176-186
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• 2008

As determined single coaxial cable for the interface between satellite and ground station in COMS RF compatibility test, RF supporting unit was required to allow signals in different frequency-band to be exchanged in the single coaxial cable. In addition, the path loss between satellite and ground station in normal operation should be simulated through two RF supporting units connected to the ends of single coaxial cable. As an effort to design RF supporting unit, level diagram was firstly conducted on the basis of measured data for each element. From the level diagram, it was found that single coaxial cable connected with two RF supporting units properly represented the path loss between satellite and ground station After RF supporting unit was integrated on aluminum plate, it was tested that input signal level at each test cap linked with MODCS and TC&R was tunable within the required dynamic range. RF supporting unit, now completely integrated, will be applied in the upcoming COMS RF compatibility test.

• Journal of information and communication convergence engineering
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• v.11 no.1
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• pp.56-61
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• 2013

Modern integrated circuits (ICs) are becoming an integrated parts of analog, digital, and radio frequency (RF) circuits. Testing these RF circuits on a chip is an important task, not only for fabrication quality control but also for tuning RF circuit elements to fit multi-standard wireless systems. In this paper, RF test circuits suitable for embedded testing are introduced: RF power detectors, power control circuits, directional couplers, and six-port reflectometers. Various types of embedded RF power detectors are reviewed. The conventional approach and our approach for the RF power control circuits are compared. Also, embedded tunable active directional couplers are presented. Then, six-port reflectometers for embedded RF testing are introduced including a 77-GHz six-port reflectometer circuit in a 130 nm process. This circuit demonstrates successful calibrated reflection coefficient simulation results for 37 well distributed samples in a Smith chart. The details including the theory, calibration, circuit design techniques, and simulations of the 77-GHz six-port reflectometer are presented in this paper.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.15 no.8
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• pp.744-751
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• 2004

This paper presents the implementation of the low cost and high speed RF ATE(Automatic Test Equipment) system, which can be a reasonable solution for reducing the test cost of RF devices. This paper suggests high speed and precise measurement capabilities which are realized by the 16 independent RF ports with high speed switching time and high accuracy digitizer using the industry standard Versus module eXtensions for Instrument(VXI) General Purpose Interface Bus(GPIB) interfaces. Also, the system has the capabilities of quad-site test which can dramatically increase the device throughput. This paper concludes with the demonstration of the implemented ATE system through the setup of RF Power Amplifier Module(PAM), which is under the most competitive market situation.

• Proceedings of the KSRS Conference
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• v.1
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• pp.208-211
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• 2006

The contents of RF test set which can be used for checking the function and performance of 13m antenna installed in KARI site are described in this paper. For the purpose of considering RF test set as the transceiver in COMS, it is designed to retransmit the LRIT and HRIT in L-Band after receiving them in S-Band from 13m antenna. Additionally, this set has a function to turnaround raging tone used for the measurement of distance between satellite and 13m antenna. The required all equipments of RF test set are summarized with configuration. Measurements of several equipments which have already been delivered are described in this paper. The assembled RF test set will be used for the verification of 13m antenna

• Journal of the Korea Institute of Information and Communication Engineering
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• v.8 no.2
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• pp.449-455
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• 2004

This paper presents a novel defect detection method for one chip RF front end with fault detection circuits using input matching measurement. We present a BIST circuit using 40.25{\mu}m$ CMOS technology. We monitor the input transient voltage of the RF front end to differentiate faulty and fault-free RF front end. Catastrophic as well as parametric variation fault models are used to simulate the faulty response of the RF front end. This technique has several advantages with respect to the standard approach based on current test stimulus and frequency domain measurement. Because DUT and fault detection circuits are implemented in the same chip, this test technique only requires use of digital voltmeter (RMS meter) and RF voltage source generator for simpleand inexpensive testing.

• Journal of the Korean Society of Physical Medicine
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• v.16 no.1
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• pp.1-7
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• 2021

PURPOSE: The purpose of this study is to conduct inter-rater and intra-rater reliability tests in patients with low back pain (LBP) using the prone instability test (PIT) and side-lying instability test (SIT). We have analyzed the Korean version Oswestry disability index (K-ODI) correlations and radiograph finding (RF) for validity. METHODS: Individuals (n = 51) (mean age of 40.27 ± 13.28) with LBP for at least over a week were recruited, together with two participating physical therapist examiners. The measurement consisted of PIT, PST, K-ODI, and RF. Sensitivity (Sn), specificity (Sp), positive predictive value, negative predictive value, prevalence index, agreement %, Cohen's kappa, and prevalence-adjusted bias-adjusted kappa (PABAK) were calculated. The PIT and SIT were compared with RF for validity analysis, while PIT, SIT, K-ODI, and RF were calculated for the correlation analysis. RESULTS: The intra-rater reliability test measured for the PIT (kappa = .79, PABAK = .88) and SIT (kappa = .73, PABAK = .84), and inter-rater reliability test measured for the SIT (kappa = .80, PABAK = .88) showed good agreements. The PIT (Sn = .65, Sp = .63) and SIT validities (Sn = .68, Sp = .70) were compared with RF, showing a significant correlation in PIT and RF (r = .69), SIT and RF (r = .73), and PIT and K-ODI (r = .53). CONCLUSION: The SIT is a more comfortable position test than the PIT in patients. Both PIT and SIT have acceptable reliability and validity.