• Title/Summary/Keyword: Quarter wave plate

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Ultra Thin Reflective Flexible Liquid Crystal Display

  • Liu, Kang-Hung;Kuo, Chia-Wei;Ku, Chun-Kang;Chang, Chih-Yuan;Liao, Chi-Chang
    • 한국정보디스플레이학회:학술대회논문집
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    • 2008.10a
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    • pp.1080-1082
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    • 2008
  • An ultra-thin reflective flexible LCD film has been demonstrated. The 30% thickness of the display can be reduced by applying a quarter-wave-plate film as upper substrate. A low temperature alignment material and special designed photo spacer were applied in this new display. The bending behavior was improved by reduced thickness.

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Real-time Measurement of Full Field Retardation Near Quarter Wavelength

  • Liu, Longhai;Zeng, Aijun;Yuan, Qiao;Zhu, Linglin;Fang, Ruifang;Huang, Huijie
    • Journal of the Optical Society of Korea
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    • v.16 no.4
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    • pp.457-461
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    • 2012
  • A real-time method to measure full field retardation near quarter wavelength is proposed. The circularly polarized beam passes through a sample with a large aperture. The measuring beam then goes through a quarter-wave plate and is then split by a Wollaston prism. An image with two sub-images is then detected by a high-speed image sensor. The full field retardation near quarter wavelength can be obtained in real time by processing the image. The measured retardation is independent of the fast axis angle of the sample and the fluctuation of the initial intensity. In experiments, a wedge waveplate is measured with different fast axis angle and initial intensity, and the full field retardations are acquired. The maximum and standard deviation of the full field retardation is $1.5^{\circ}$ and $0.4^{\circ}$. The validity of the method is verified.

Current-Controlled Wavelength-Tunable Fiber Comb Filter based on Polarization-Diversity Loop Configuration (전류 조절로 파장 튜닝 가능한 편광상이 배치구조 기반 광섬유 빗살 필터)

  • Choi, Dae-Ho;Lee, Yong-Wook
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.24 no.12
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    • pp.33-37
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    • 2010
  • In this paper, we have demonstrated absolute wavelength tuning in an optical fiber comb filter based on a polarization-diversity loop configuration by controlling the current injected into enameled wires wound on polarization-maintaining fibers (PMF's), that is, adjusting Joule heat generated from enameled wires. The proposed fiber comb filter consists of a polarization beam splitter, a half-wave plate, a quarter-wave plate, and PMF's. And we observed wavelength change of spectral dips in transmission spectra of the fabricated filter by varying an input current applied to enameled wires. The absolute wavelength of the filter could be controlled in proportional to the square of the input current with good linearity, and the rate of the wavelength shift with respect to the input current was measured as 36.79[nm/$A^2$].

고자장, 저온 환경의 UHV surface magneto-optical Kerr effect 장비 구축 및 Fe/Cr(001)계의 자성특성 연구

  • Park, Yong-Seong;O, Yong-Rok;Hong, Ji-Sang;Kim, Won-Dong;Hwang, Chan-Yong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.400-400
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    • 2010
  • 우리는 기본 진공 $10^{-11}\;Torr$의 UHV surface magneto-optical Kerr effect (SMOKE) 시스템을 quarter-wave plate를 사용하였던 기존의 방식에서 PEM (photo elastic modulator)를 사용하는 방식으로 장비의 기능을 향상시켰다. 기존 quarter-wave plate를 사용하는 방식의 경우 Kerr signal을 구하기 위해 편광자와 검광자를 수직으로 두어 광량을 0으로 만들어야 한다. 그러나 금속의 경우 대부분 가시광선 영역에서 큰 반사율 때문에 측정되는 광량이 편광자와 검광자를 거치면서 넓은 각도 범위에서 최소값을 갖기 때문에 정확한 영점을 잡는 데 한계가 있다. 이러한 단점을 해결하기 위하여 우리는 PEM을 이용한 위상변조방식을 사용하였다. 위상변조 방식은 Kerr signal과 관계된 양을 PEM을 이용하여 50 kH ($1{\omega}$)와 100 kH ($2{\omega}$)의 진동 주파수에 공조시키고 이를 Lock-in-amplifier를 사용하여 탐지하기 때문에 좋은 sensitivity를 얻을 수 있을 뿐 아니라 Kerr ellipticity와 Kerr rotation을 동시에 측정할 수 있다. 자화에 필요한 전자석은 순철로 된 코어를 제작하여 챔버에 부착하였고 10 A에서 최대 7 kOe의 고자장을 얻을 수 있어 포화자화가 큰 물질에 대해서도 필요한 자성영역까지 측정이 가능하게 하였다. 또 저온 측정을 위해 SMOKE 샘플 홀더를 개조하여 액체 질소를 이용하여 100 K 근방의 영역에서 온도를 제어할 수 있도록 저온 장치를 구성하였다. 여기에서 샘플 근처에 위차한 e-beam heater가 장착된 고온 부분과 액체 질소 냉각, 온도감지를 위한 센서, cartridge heater가 장착된 저온 부분을 sapphire plate로 분리하여 저온용 cartridge heater의 파손을 최소화하였다. 이러한 SMOKE 시스템을 구성한 후에 우리는 Fe/Cr(001)시스템의 자성특성에 대해 연구하였다. Fe/Cr 시스템은 Fe/Cr/Fe의 exchange coupling이나 bulk Cr의 복잡한 자성 특성 때문에 주목을 받아왔다. 이 연구에서 우리는 저온 및 상온에서 Cr(001) 단결정 위에 증착된 Fe 박막의 자성 특성을 보고한다.

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Printed Folded Antenna for Dual-Band WLAN Operations

  • Chae, Gyoo-Soo;Cho, Young-Ki
    • Journal of electromagnetic engineering and science
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    • v.4 no.3
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    • pp.124-127
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    • 2004
  • A novel printed inverted-F antenna for dual-band WLAN is presented. The proposed design is based on the folded quarter-wave antennas, which have a conductor plate having two arms. An extremely thin prototype antenna is fabricated according to the simulation result. The obtained antenna can perform in IEEE802.11a, b(2.4~2.484 GHz and 5.15~5.35 GHz bands) and be adopted for laptop applications. All the measurements are performed in the actual test fixture.

Wave Screening Effectiveness of Infilled Trenches (방진벽의 표면가 산란효과)

  • 이종세
    • Proceedings of the Earthquake Engineering Society of Korea Conference
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    • 1997.04a
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    • pp.152-159
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    • 1997
  • An analytical method is developed to study the propagation of surface waves across infilled trenches. The Green's function technique is used to estimate the reflection and transmission coefficients of Rayleigh waves across a semi-infinite plate inserted between two homogeneous quarter-spaces. After validating the method against experimental data, influence of the material contrast and the angle of incidence on the screening effectiveness of an infilled trench is examined.

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Analysis of compensation principle for wide viewing angle characteristics of an OCB cell by the $Poincar\acute{e}$ sphere representation

  • Lee, Seong-Ryong;Yoon, Tae-Hoon;Kim, Jae-Chang
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.167-170
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    • 2006
  • In this paper, we study how the viewing angle characteristics of a bend cell can be compensated by uniaxial films such as positive a-plate, negative c-plate and circular polarizer. Especially, it is confirmed how the circular polarizer composed of a quarter-wave plate and a linear polarizer enhances the viewing angle characteristics by the $Poincar\acute{e}$ sphere representation. Also, additional compensation film is designed to improve the viewing angle characteristics of the cell by the $Poincar\acute{e}$ sphere representation.

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Polarization Phase-shifting Technique for the Determination of a Transparent Thin Film's Thickness Using a Modified Sagnac Interferometer

  • Kaewon, Rapeepan;Pawong, Chutchai;Chitaree, Ratchapak;Bhatranand, Apichai
    • Current Optics and Photonics
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    • v.2 no.5
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    • pp.474-481
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    • 2018
  • We propose a polarization phase-shifting technique to investigate the thickness of $Ta_2O_5$ thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized beams traveling in opposite directions, and a quarter-wave plate is inserted into the common path to create an unbalanced phase condition. The linearly polarized light beams are transformed into two circularly polarized beams by transmission through a quarter-wave plate placed at the output of the interferometer. The proposed setup, therefore, yields rotating polarized light that can be used to extract a relative phase via the self-reference system. A thin-film sample inserted into the cyclic path modifies the output signal, in terms of the phase retardation. This technique utilizes three phase-shifted intensities to evaluate the phase retardation via simple signal processing, without manual adjustment of the output polarizer, which subsequently allows the thin film's thickness to be determined. Experimental results show that the thicknesses obtained from the proposed setup are in good agreement with those acquired by a field-emission scanning electron microscope and a spectroscopic ellipsometer. Thus, the proposed interferometric arrangement can be utilized reliably for non-contact thickness measurements of transparent thin films and characterization of optical devices.

Systematic Error Correction in Dual-Rotating Quarter-Wave Plate Ellipsometry using Overestimated Optimization Method (최적화 기법을 이용한 두 개의 회전하는 사분파장판으로 구성된 타원편광분석기에서의 체계적인 오차 보정)

  • Kim, Dukhyeon;Cheong, Hai Du;Kim, Bongjin
    • Korean Journal of Optics and Photonics
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    • v.25 no.1
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    • pp.29-37
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    • 2014
  • We have studied and demonstrated general, systematic error-correction methods for a dual rotating quarter-wave plate ellipsometer. To estimate and correct 5 systematic error sources (three offset angles and two unexpected retarder phase delays), we used 11 of the 25 Fourier components of the ellipsometry signal obtained in the absence of an optical sample. Using these 11 Fourier components, we can determine the errors from the 5 sources with nonlinear optimization methods. We found systematic errors ${\epsilon}_3$, ${\epsilon}_4$, ${\epsilon}_5$) are more sensitive to the inverted Mueller matrix than retarder phase delay errors (${\epsilon}_1$, ${\epsilon}_2$) because of their small condition numbers. To correct these systematic errors we have found that error of any variety must be less than 0.05 rad. Finally, we can use the magnitudes of these errors to correct the Mueller matrix of optical components. From our experimental ellipsometry signals, we can measure phase delay and the rotational angular position of its fast axis for a half-wave plate.

Anaysis of the photoelastic of CR lens using circular polariscope (원편광기를 이용한 CR 렌즈의 광 탄성 해석 연구)

  • Kim, Yong-Geun
    • Journal of Korean Ophthalmic Optics Society
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    • v.6 no.2
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    • pp.11-16
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    • 2001
  • The polariscope to measure :he stress in lens was made up quarter-wave plate polarizer and we analyzed two components of light's wave $E_1$ and $E_2$ following the steps. It is clear that the principal-stress difference ${\sigma}_1-{\sigma}_2$ can be determined in 2-D model if fringe order N is measured each point in sample moreover. the optical axes of sample coincide with the principal-stress directions. The birefringence acted to a light wave and a phase retardation were in proportioned to the principal-stressed difference (${\sigma}_1-{\sigma}_2$) and the intensity of final light wave was proportioned to $sin^2({\Delta}/2)$, when ${\Delta}/2=n^{\pi}$ (n=0, 1, 2, ...) and the extinction occurs. As a experimental result, the extinction band shifted owing to a magnitude of lens' external stress.

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