Comparative Analysis of Flicker Noise and Reliability of NMOSFETs with Plasma Nitrided Oxide and Thermally Nitrided Oxide (Plasma Nitrided Oxide와 Thermally Nitrided Oxide를 적용한 NMOSFET의 Flicker Noise와 신뢰성에 대한 비교 분석)
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- Journal of the Korean Institute of Electrical and Electronic Material Engineers
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- v.24 no.12
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- pp.944-948
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- 2011