• Proceedings of the Korean Society of Soil and Groundwater Environment Conference
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• 2005.04a
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• pp.163-166
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• 2005

[ $TiO_2$ ] 광촉매에 의한 분해 반응의 활성을 높이기 위한 다양한 연구가 진행되었다. 광촉매 반응은 1차 반응을 따랐으며 초기농도가 높을수록 분해효율이 감소하는 경향을 보였다. 본 연구에서는 산화제로 과산화수소가 주입되었을 경우 분해효율을 조사하였으며, 과산화수소를 주입하였을 경우가 그렇지 않은 경우보다 더 높은 분해효율을 보였다. 또한 과산화수소 주입량을 달리했을 때, 주입량이 증가할수록 효율이 높아지다가 일정량 이상에서는 오히려 효율이 감소하는 것으로 나타났다. 따라서 과산화수소 최적첨가량이 존재함을 알 수 있었다. 한편 $TiO_2$에 전이금속을 첨가하여 전이금속이 $TiO_2$ 촉매의 분해효율에 미치는 영향을 알아보았다. Pt(0.5%)-$TiO_2$가 가장 높은 분해효을을 보였으며, Pt첨가함량이 더 큰 Pt(2%)-$TiO_2$는 함량이 증가했음에도 불구하고 큰 차이는 아니지만 오히려 효율이 감소하였다. 따라서 촉매표면에서 전자와 정공이 생성되었을 때, Pt가 전자를 포획함으로써 전자와 정공의 재결합율을 감소시켜 OH라디칼을 생성할 수 있는 정공이 많아져 반응효율을 증가되는 것을 알 수 있었고, 금속에 따른 최적 첨가함량이 존재함을 알 수 있다. 반면에 Pd를 첨가했을 경우는 첨가 함량에 관계없이 모두 분해효율이 오히려 감소하는 경향을 나타냈으며 이는 전이금속 고유의 성질이나, 또는 대상물질에 따라 각기 다른 경향이 존재함을 나타내며 추가적인 연구가 필요하다고 사료된다.

• Journal of Industrial Technology
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• v.28 no.A
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• pp.19-22
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• 2008

In recent years, much attention has been paid to "Photocatalytic oxidation" as an alternative technique, where the pollutants are degraded by UV-irradiation in the presence of a semiconductor suspension such as titanium dioxide. $TiO_2$ is the most often used photocatalyst due to its considerable photocatalytic activity, high stability, non-environmental impact and low cost. 1n this research, the photocatalytic degradation of humic acid, acetaldehyde and methylene blue in $UV/TiO_2$ systems has been stydied. The effect of calcination temperature for manufacturing of $TiO_2$ photocatalysts and type of photocatalysts on photodegradation has been investigated. Photocatalysts with various metal ions(Mn, Fe, Cu and Pt) loading are tested to evaluate the effects of metal ions impurities on photodegradation. The photodegradation efficiency with $Pt-TiO_2$ or $Fe-TiO_2$ or $Cu-TiO_2$ is higher than Degussa P-25 powder. However, the photodegradation efficiency with $Mn-TiO_2$ is lower than Degussa P-25 powder. The photocatalytic properties of the nanocrystals were strongly dependent upon the crystallinity, particle size, standard reduction potential of various transition metal and electronegativity of various transition metal. As a result photocatalysts with various metal ion loading evaluated the effect of photodegradation.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.07a
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• pp.58-61
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• 2001

Metal-insulator-semiconductor (MIS) C-V properties with high dielectric AIN thin films showed no hysteresis and good interface properties. The dielectric constant of the AIN film calculated from the capacitance at the accumulation region in the capacitance-voltage(C-V) characteristics was about 8. The C-V characteristics of MFIS capacitor showed a hysteresis loop due to the ferroelectric nature of the LiNbO$_3$ thin films. Typical dielectric constant value of LiNbO$_3$ film of MFIS device was about 23. The memory window width was about 1.2V at the gate voltage of $\pm$5 V ranges. Typical gate leakage current density of the MFIS structure was the order of 10$^{-9}$ A/cm$^2$ at the range of within $\pm$500 kV/cm. The ferroelectric capacitors showed no polarization degradation up to about 10$^{11}$ switching cycles when subjected to symmetric bipolar voltage pulse(peak-to-peak 8V, 50% duty cycle) in the 500kHz.

• Journal of Korean Society of Water and Wastewater
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• v.25 no.4
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• pp.555-564
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• 2011

The photocatalytic degradation of trichloroethylene (TCE) in $TiO_2$ aqueous suspension has been studied. $TiO_2$ photocatalysts are prepared by a sol-gel method. The dominant anatase-structure on $TiO_2$ particles is observed after calcining the $TiO_2$ get at $500^{\circ}C$ for 1hr. The Langmuir-Hinshelwood model is applicable to describe the photodegradation, which indicates that adsorptionof the solute on the surface of $TiO_2$ particles plays an important role in photodegradation. Photocatalysts with various transition metals (Nd, Pd and Pt) loading are tested to evaluate the effect of transition metal impurities on photodegradation. The photodegradation efficiencies with $TiO_2$ including Pt, Pd and Nd are lower than pure $TiO_2$ powder. The effect of pH is investigated and the maximum photodegradation efficiency is obtained at pH 7. In addition, the intermediates such as dichloromethane, chloroform, and trichloroethane are detected during the photodegradation of TCE.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.719-722
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• 2003

This work investigates the device degradation p-channel PD SOI devices at various applied voltages as well as stress temperatures with respect to Body-Contact SOI (BC-SOI) and Floating-Body SOI (FB-SOI) MOSFETs. It is observed that the drain current degradation at the gate voltage of the maximum gate current is more significant in FB-SOI devices than in BC-SOI devices. For a stress at the gate voltage of the maximum gate current and elevated temperature, it is worth noting that the $V_{PT}$ Will be decreased by the amount of the HEIP plus the temperature effects. For a stress at $V_{GS}$ = $V_{DS}$ . the drain current decreases moderately with stress time at room temperature but it decreases significantly at the elevated temperature due to the negative bias temperature instability.

• Bulletin of the Korean Chemical Society
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• v.22 no.11
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• pp.1183-1191
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• 2001

The metallorganic chemical vapor deposition (MOCVD) method has been used to prepare TiO2 thin films for the degradation of hazardous organic compounds, such as 2-chlorophenol (2-CP). The effect of supporting materials and metal doping on the photocatalytic activity of TiO2 thin films also has been studied. TiO2 thin films were coated onto various supporting materials, including stainless steel cloth(SS), quartz glass tube (QGT), and silica gel (SG). Transition metals, such as Pd(II), Pt(IV), Nd(III) and Fe(III), were doped onto TiO2 thin film. The results indicate that Nd(Ⅲ) doping improves the photodegradation of 2-CP. Among all supporting materials studied, SS(37 ${\mu}m)$ appears to be the best support. An optimal amount of doping material at 1.0 percent (w/w) of TiO2-substrate thin film gives the best photodegration of 2-CP.

• Transactions of the Korean hydrogen and new energy society
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• v.18 no.2
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• pp.157-163
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• 2007

During PEMFC operation, low current and low humidity conditions accelerate the degradation of perfluorosulfonic acid membrane. But, there have been no studies that clearly explain why these conditions accelerate the membrane degradation. In this study, the hydrogen permeability through the membrane, I-V polarization of MEA, fluoride emission rate(FER) in effluent water were measured during cell operation under low current densities and low relative humidity(RH). The experimental results were evaluated with oxygen radical mechanism the most commonly known for membrane degradation. It seems that low RH of anode is a good condition for $H{\cdot}$ radical formation on the Pt catalyst and the low current condition accelerates the $H{\cdot}$ to form $HO_2{\cdot}$ radical attacking the polymer membrane.

• Journal of the Korean Chemical Society
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• v.17 no.4
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• pp.298-305
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• 1973

Following results were obtained for the mechanical degradation of polystyrene (for polystyrene itself and when blended with rubber) by roll mastication. 1) The rate of mechanical degradation for polystyrene itself can be represented by the second-order rate equation proposed by Goto. $-\frac{dP_t}{dt} = k_s(P_t-P_{\infty})^2$ Where Pt is the degree of polymerization of the degraded polymer at t minutes and $P{\infty}$ is the final degree of polymerization. 2) The mechanical degradation of polystyrene component in the polystyrene-rubber (SBR, BR) blend system occurred similarly as that of polystyrene itself. 3) Under the experimental conditions the mechanical degradation rate of the polystyrene component of the polystyrene-rubber, (SBR, BR) blend system followed approximately the same second-order equation as that for polystyrene itself.

• Korean Chemical Engineering Research
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• v.54 no.3
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• pp.305-309
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• 2016

Recently, there are many efforts focused on development of more economical non-fluorinated membranes for PEMFCs (Proton Exchange Membrane Fuel Cells). In this study, to test the durability of sPEEK MEA (Membrane and Electrode Assembly), ADT (Accelerated Degradation Test) of MEA degradation was done at the condition that membrane and electrode were degraded simultaneously. Before and after degradation, I-V polarization curve, hydrogen crossover, electrochemical surface area, membrane resistance and charge transfer resistance were measured. Although the permeability of hydrogen through sPEEK membrane was low, sPEEK membrane was weaker to radical evolved at low humidity and OCV condition than fluorinated membrane such as Nafion. Performance after MEA degradation for 144 hours and 271 hours were reduced by 15% and 65%, respectively. It was showed that the main cause of rapid decrease of performance after 144 hours was shorting due to Pt/C particles in the pinholes.

• Journal of the Microelectronics and Packaging Society
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• v.12 no.1 s.34
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• pp.21-26
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• 2005

The field effect transistors (FETs) were fabricated ell $Y_2O_3/Si(100)$ substrates by the conventional memory processes and sol-gel process using $(Bi,La)Ti_3O_{12}(BLT)$ ferroelectric gate materials. The remnant polarization ($2Pr = Pr^+-Pr^-$) int Pt/BLT/Pt/Si capacitors increased from $22 {\mu}C/cm^2$ to $30{\mu}C/ cm^2$ at 5V as the annealing temperature increased from $700^{\circ}C$ to $750^{\circ}C$. There was no drastic degradation in the polarization values after applying the retention read pulse for $10^{5.5}$ seconds. The capacitance-voltage data of $Pt/BLT/Y_2O_3/Si$ capacitors at 5V input voltage showed that the memory window voltage decreased from 1.4V to 0.6V as the annealing temperature increased from $700^{\circ}C$ to $750^{\circ}C$. The leakage current of the $Pt/BLT/Y_2O_3/Si$ capacitors annealed at $750^{\circ}C$ was about $510^{-8}A/cm^2$ at 5V. From the drain currents versus gate voltages ($V_G$) for $Pt/BLT/Y_2O_3/Si(100)$ FET devices, the memory window voltages increased from 0.3V to 0.8V with increasing tile $V_G$ from 3V to 5V.