• Title/Summary/Keyword: Psi ($\Psi$)

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INFINITE SERIES ASSOCIATED WITH PSI AND ZETA FUNCTIONS

  • KIM, YONGSUP
    • Honam Mathematical Journal
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    • v.22 no.1
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    • pp.53-60
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    • 2000
  • We evaluate some interesting families of infinite series expressed in terms of the Psi (or Digamma) and Zeta functions by analyzing the well-known identity associated with $_3F_2$ due to Watson. Some special cases are also considered.

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Experience in Ultrasonic Flaw Estimation and its Excavation on the Weldments of Nuclear Pressure Vessels (원전 압력용기 용접부 초음파탐상, 결함크기 평가 및 결함 수리 경험)

  • Lee, J.P.;Park, D.Y.;Lim, H.T.;Kim, B.C.;Joo, Y.S.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.11 no.1
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    • pp.52-60
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    • 1991
  • The importance and role of preservice and inservice inspection(PSI/ISI) for nuclear power plant components are intimately related to plant design, safety, reliability and operation etc.. The Korea Atomic Energy Research Institute(KAERI) has been performing PSI/ISI in Korea since the PSI of Kori nuclear power plant, unit 1 had been performed in 1977. KAERI has localized PSI/ISI technology and has done much experience in ultrasonic flaw detection, evaluation and its excavation on the weldments of large pressure vessels. The results of flaw estimation using ultrasonic examination are compared with the actual flaw sizes revealed by field excavation. KAERI's experience regarding PSI/ISI was described and some discussions were added.

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DVB-T PSI(Program Specific Information) Parser using Design of Ali M3330 MPEG-2 decoder processor (ALi M3330 MPEG-2 디코더 프로세서를 이용한 DVB-T PSI(Program Specific Information) 해석기 설계)

  • Jun, Do-Young;Kim, Min-Sung;Kim, Su-Hyun;You, Hong-Yean;Hong, Sung-Hoon
    • Proceedings of the KIEE Conference
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    • 2007.04a
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    • pp.278-280
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    • 2007
  • In this paper, wd design the Program Specific Information (PSI) parser and its On-Screen Display (OSD) on the middleware of ALi M3330 MPEG-2 decoder processor to analyze DVB-T Transport Stream(TS) information. To test the functional operation of the designed parser, we implement the DVB-T test board including the RF-tuner using ALi M3330 MPEP-2 decoder processor and confirm the correct operation using the input TS stream generated by DVB-T stream generator. The developed PSI parser could be used for the test environment, various channel extension, and the development of DVB-T reception module.

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Fast Genetic Variation among Coliphage Quasispecies Revealed by a Random Amplified Polymorphic DNA (RAPD) Analysis

  • Kwon, Oh-Sik;Lee, Jae-Yung
    • Journal of Microbiology
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    • v.34 no.2
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    • pp.166-171
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    • 1996
  • Genetic analysis was conducted on newly isolated coliphages form soil by using a RAPD assay. From the initial result, the coliphages were turned out to be different form one another but were closely related to .psi..lambda. due to the fact that they shared the samed RAPD maker in which other T phage testings failed to show. By using the primers EC01 or EC02, a fast genetic mutation of .psi.C1 was found by producing specific RAPD markers on the phages from the first filial progeny to the second filial progeny. When we made a RAPD assay with combined primers (EC01, EC05 and EC08), the genetic mutation was again confirmed in .psi.C1. The assay detection showed mutations in other coliphages such as .psi.C2 and .psi.C3 by revealing specific RAPD bands among different progeny phages, where genetic instability of the coliphages in implied.

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TOEPLITZ TYPE OPERATOR IN ℂn

  • Choi, Ki Seong
    • Journal of the Chungcheong Mathematical Society
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    • v.27 no.4
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    • pp.697-705
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    • 2014
  • For a complex measure ${\mu}$ on B and $f{\in}L^2_a(B)$, the Toeplitz operator $T_{\mu}$ on $L^2_a(B,dv)$ with symbol ${\mu}$ is formally defined by $T_{\mu}(f)(w)=\int_{B}f(w)\bar{K(z,w)}d{\mu}(w)$. We will investigate properties of the Toeplitz operator $T_{\mu}$ with symbol ${\mu}$. We define the Toeplitz type operator $T^r_{\psi}$ with symbol ${\psi}$, $$T^r_{\psi}f(z)=c_r\int_{B}\frac{(1-{\parallel}w{\parallel}^2)^r}{(1-{\langle}z,w{\rangle})^{n+r+1}}{\psi}(w)f(w)d{\nu}(w)$$. We will also investigate properties of the Toeplitz type operator with symbol ${\psi}$.

Optical Characterization of DBR Porous Silicon by Changing of Applied Current Density (전류세기의 변화에 따른 DBR 다공성 실리콘의 광학적 특성)

  • Choi, Tae-Eun;Park, Jaehyun
    • Journal of Integrative Natural Science
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    • v.2 no.2
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    • pp.82-85
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    • 2009
  • Distributed Bragg reflector (DBR) porous silicon (PSi) was generated by an electrochemical etching a bragg structure into a silicon wafer through electrode current in aqueous ethanolic HF solution. DBR PSi exhibiting unique reflectivity was successfully obtained by an electrochemical etching of silicon wafer using square current waveform. The multilayered photonic crystals of DBR PSi exhibited the reflection of a specific wavelength with high reflectivity in the optical reflectivity spectrum. In this work, we have developed a method to create refractive index in Si substrate through intensity of an electric current. The electrochemical process allows for precise control of the structural properties of DBR PSi such as thickness of the porous layer, porosity, and average pore diameter. The number of reflection peak of DBR PSi and its pore size increased as the intensity of electric current increased. This might be a demonstration for the fabrication of specific reflectors or filters.

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Fabrication and Characterization of Optically Encoded Porous Silicon Smart Particles

  • Sohn, Honglae
    • Journal of Integrative Natural Science
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    • v.7 no.4
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    • pp.221-226
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    • 2014
  • Optically encoded porous silicon smart particles were successfully fabricated from the free-standing porous silicon thin films using ultrasono-method. DBR PSi was prepared by an electrochemical etch of heavily doped $p^{{+}{+}}$-type silicon wafer. DBR PSi was prepared by using a periodic pseudo-square wave current. The surface-modified DBR PSi was prepared by either thermal oxidation or thermal hydrosilylation. Free-standing DBR PSi films were generated by lift-off from the silicon wafer substrate using an electropolishing current. Free-standing DBR PSi films were ultrasonicated to create DBR-structured porous smart particles. Optical characteristics of porous smart particles were measured by FT-IR spectroscopy. The surface morphology of porous smart particles was determined by FE-SEM.