• 대한전기학회논문지
• /
• 제43권3호
• /
• pp.504-514
• /
• 1994

Combinational automatic test pattern generators (CATPG) have already been commercialized because their algorithms are well known and practical, while sequential automatic test pattern generators(SATPG) have been regarded as impractical because they are computationally complex. A technique to use CATPG instead of SATPG for test generation of sequential circuits is proposed. Redesign of seauential circuits such as Level Sensitive Scan Design (LSSD) is inevitable to use CATPG. Various partial scan techniques has been proposed to avoid full scan such as LSSD. It ha sbeen reported that SATPG is required to use partial scan techniques. We propose a technique to use CATPG for a new partial scan technique, and propose a new CATPG algorithm for the partially scanned circuits. The partial scan technique can be another choice of design for testability because it is computationally advantageous.

• 전자공학회논문지B
• /
• 제30B권5호
• /
• pp.82-89
• /
• 1993

In this paper, we proposed the autonomous algorithm of pseudo-exhaustive testing for the multi-level combinational logic circuits. For the processing of shared-circuit that existed in each cone-circuit when it backtracked the path from PO to PI of CUT at the conventional verification testing, the dependent relation of PI-P0 is presented by a dependence matrix so it easily partitioned the sub-circuits for the pseudo-exhaustive testing. The test pattern of sub-circuit's C-inputs is generated using a binary counter and the test pattern of I-inputs is synthesized using a singular cover and consistency operation. Thus, according to the test patterns presented with the recipe cube, the number of test pattrens are reduced and it is possible to test concurrently each other subcircuits. The proposed algorithm treated CUT's net-list to the source file and was batch processed from the sub-circuit partitioning to the test pattern generation. It is shown that the range of reduced ration of generated pseudo-exhaustive test pattern exhibits from 85.4% to 95.8% when the average PI-dependency of ISACS bench mark circuits is 69.4%.

• 전자공학회논문지A
• /
• 제32A권12호
• /
• pp.229-240
• /
• 1995

This paper proposes a new weighted random pattern testing technique to detect path delay faults in combinational logic circuits. When computing the probability of signal transition at primitive logic elements of CUT(Circuit Under Test) by the primary input, the proposed technique uses the information on the structure of CUT for initialization vectors and vectors generated by pseudo random pattern generator for test vectors. We can sensitize many paths by allocating a weight value on signal lines considering the difference of the levels of logic elements. We show that the proposed technique outperforms existing testing method in terms of test length and fault coverage using ISCAS '85 benchmark circuits. We also show that the proposed testing technique generates more robust test vectors for the longest and near-longest paths.

• 전자공학회논문지C
• /
• 제34C권8호
• /
• pp.39-48
• /
• 1997

The fast redundancy identification is required to perform an efficient test pattern genration. Due to the reconvergent fanouts which make the dependency among objectives and the fault propagation blocking, there may exist redundnat faults in the cirucit. This paper presents the isomorphism identification and the pseudo dominator algorithms which are useful to identify redundant faults in combinational circuits. The isomorphism identification algorithm determines whether mandatory objectives required for fault detection cannot be simultaneously satisfied from primary input assignments or not using binary decision diagrma. The pseudo dominator algorithm determines whether faults propagation is possible or not by considering all paths at a given fanout node. Several experiments using ISCAS 85 benchmark circuits demonstrate the efficiency and practicability of the algorithms.

• 대한전자공학회논문지
• /
• 제27권9호
• /
• pp.1442-1447
• /
• 1990

In this paper we propose the search algorithm of the boundary nodes that defined as the circuit segmentation when CUT is tested by pseudo-exhaustive testing. The algorithm treats the testability values of the nodes in CUT as the population composed of teh raw data, and after examines the level of significance a and then estimate the confidence interval of teh testability values. Thus One can easily searched the c9oundary nodes and PO of sub circuits. The proposed algorithm has been implemented under UNIX OS with C-language, applied to the combinational logic CUT. As a result, it is shown that the pseudo-exhaustive test patterns are least generated when \ulcornerhas 0.786. We confirmed that the rate of test pattern is 1.22%, compared with exhaustive test.