• 융합보안논문지
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• 제7권2호
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• pp.49-55
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• 2007

소프트웨어 고장 시간은 테스팅 시간과 관계없이 일정하거나. 단조증가 혹은 단조 감소 추세를 가지고 있다. 이러한 소프트웨어 신뢰모형들을 분석하기 위한 자료척도로 자료에 대한 추세 검정이 개발되어 있다. 추세 분석에는 산술평균 검정과 라플라스 추세 검정등이 있다. 추세분석들은 전체적인 자료의 개요의 정보만 제공한다. 이러한 분석도구를 다시 세분화하여 품질 관리측면에서 분석을 시도 할 필요가 있다. 따라서 본 논문에서는 품질관리 측면에서 사용되는 공정능력지수를 이용한 공정분석을 시도하였다. 소프트웨어 고장 간격 시간은 비음이기 때문에 수명분포가 정규분포를 가정하는 기존의 공정능력분석방법 대신에 정규화 시켜주는 박스-코스 변환을 이용하여 공정 능력 분석을 시도 하였다. 공정능력에 사용된 고장 간격 시간자료는 실제 자료인 SS3을 이용하였고 그 결과를 나열 하였고 이런 결과들의 활용 방안을 제시 하였다.

• Journal of information and communication convergence engineering
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• 제6권3호
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• pp.323-326
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• 2008

Data Envelopment Analysis (DEA) is a theoretically sound framework for performance analysis that offers many advantages over traditional methods such as performance ratios and regression analysis. Largely the result of multidisciplinary research during the last three decades in economics, engineering and management, DEA is best described as an effective new way of visualizing and analyzing performance data. Besides, overseas information technology companies have aggressively tried to enter the domestic market. In the age of globalization and high competition, it is imperative that the system integration (SI) companies need to introduce the performance evaluation models of SI projects, including Capability Maturity Model and Software Process Improvement and Capability Determination, to gain a competitive advantage. Therefore, it makes our research regarding evaluation of SI projects very opportune. The purpose of the study is not only to evaluate efficiency of each project by DEA but also to gain insight into various factors such as project complexity, team members' man-months structure, and process index(project management index) that link to the projects performance.

• Communications for Statistical Applications and Methods
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• 제15권3호
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• pp.451-464
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• 2008

6 시그마는 백만 기회당 3.4개의 결점만을 갖는 최고의 품질수준을 의미한다. 일반적으로 높은 시그마 품질수준은 고객들에게 높은 만족도를 부여하는 것으로 알려져 있다. 공정능력지수들과 시그마 품질수준 $Z_{st}$는 6시그마 산업에서 공정능력을 평가하기 위하여 널리 이용되고 있다 공정능력지수에 관한 대부분의 평가들은 공정능력분석에 대해 경우에 따라 믿기 어려운 상황을 초래할 수도 있는 점 추정에 초점을 두고 있다. 본 논문에서는 현장 실무자들이 공정능력 여부를 결정하기 위하여 사용하고 있는 6시그마 품질수준 $Z_{st}$와 공정능력지수들 $C_p$, $C_{pk}$와 $C_{pm}$에 대하여 몇 가지 통계적 추정문제를 기초로 보다 효율적인 검정 방법에 대하여 제안, 연구하였다. 제안된 붓스트랩 검정 방법에 근거한 모의실험 결과는 공정분포의 정규성 여부에 관계없이 그리고 복잡한 계산 과정 없이 보다 효율적으로 적용될 수 있음을 입증하고 있다.

• 산업경영시스템학회지
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• 제42권1호
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• pp.151-157
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• 2019

This study is about the process capability index (PCI). In this study, we introduce several indices including the index $C_{PR}$ and present the characteristics of the $C_{PR}$ as well as its validity. The difference between the other indices and the $C_{PR}$ is the way we use to estimate the standard deviation. Calculating the index, most indices use sample standard deviation while the index $C_{PR}$ uses range R. The sample standard deviation is generally a better estimator than the range R. But in the case of the panel process, the $C_{PR}$ has more consistency than the other indices at the point of non-conforming ratio which is an important term in quality control. The reason why the $C_{PR}$ using the range has better consistency is explained by introducing the concept of 'flatness ratio'. At least one million cells are present in one panel, so we can't inspect all of them. In estimating the PCI, it is necessary to consider the inspection cost together with the consistency. Even though we want smaller sample size at the point of inspection cost, the small sample size makes the PCI unreliable. There is 'trade off' between the inspection cost and the accuracy of the PCI. Therefore, we should obtain as large a sample size as possible under the allowed inspection cost. In order for $C_{PR}$ to be used throughout the industry, it is necessary to analyze the characteristics of the $C_{PR}$. Because the $C_{PR}$ is a kind of index including subgroup concept, the analysis should be done at the point of sample size of the subgroup. We present numerical analysis results of $C_{PR}$ by the data from the random number generating method. In this study, we also show the difference between the $C_{PR}$ using the range and the $C_P$ which is a representative index using the sample standard deviation. Regression analysis was used for the numerical analysis of the sample data. In addition, residual analysis and equal variance analysis was also conducted.

• 산업경영시스템학회지
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• 제18권36호
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• pp.275-285
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• 1995

In recent years there has been increasing interest in the issue of process centering in manufacturing process, The traditional process capability indices Cp, Cpk and Cpu are used to provide measure of process performance, but these indices do not represent the issue of process centering. A new measure of the process capability index Cpm is proposed that takes into account the proximity to the target value as well as the process variation when assessing process performance. However, Cpm only considers acceptance cost for deviation from target value within specification limits, do not includes economic consideration for rejected items. This paper proposes flexible process performance measures that considered quadratic loss function caused by quality deviation within specification limits, rejection cost associated with the disposition of rejected items, and inspection cost. In this model disposition of rejected items are considered under perfect corrective procedures and the absence of perfect corrective procedures.

• 품질경영학회지
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• 제41권2호
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• pp.233-248
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• 2013

Purpose: This study develops heuristic process capability indices (PCIs) using distribution-decomposition methods and evaluates the performances. The heuristic methods decompose the variation of a quality characteristic into upper and lower deviations and adjust the value of the PCIs using decomposed deviations in accordance with the skewness. The weighted variance(WV), new WV(NWV), scaled WV(SWV), and weighted standard deviation(WSD) methods are considered. Methods: The performances of the heuristic PCIs are investigated under the varied situations such as various skewed distributions, sample sizes, and specifications. Results: WV PCI is the best under the normal populations, WSD and SWV PCIs are the best under the low skewed populations, NWV PCI is the best under the moderate and high skewed populations. Conclusion: Comprehensive analysis shows that the NWV method is most adequate for a practical use.

• 한국정밀공학회지
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• 제28권8호
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• pp.894-903
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• 2011

In this paper, the capability index is introduced in order to improve the reliability of new concept machine tools and the method to improve the machine accuracy from the analysis of cutting process, statistical methodology and influence factors are proposed. In addition, the rib structure of bed and column in machine tools is analyzed by using the thermal impact method in order to analogize the rib pattern which has the small thermal deformation under thermal boundary condition. In the analysis of column rib structure, thermal boundary condition is separated to heat conduction and heat transfer to appropriate real boundary condition. Finally, performance chart of bed and column rib structure is provided for designer to estimate each rib pattern and select rib structure appropriating to thermal condition.

• 대한기계학회논문집A
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• 제33권10호
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• pp.1132-1138
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• 2009

The spring constants of primary suspensions for a railway vehicle are optimized by a robust design process, in which the response surface models(RSMs) of their dynamic responses are constructed via the design of experiment(DOE). The robust design process requires an intensive computation to evaluate exactly a probabilistic feasibility for the robustness of dynamic responses with their probabilistic variances for the railway vehicle. In order to overcome the computational process, the process capability index $C_{pk}$ is introduced which enables not only to show the mean value and the scattering of the product quality to a certain extent, but also to normalize the objective functions irrespective of various different dimensions. This robust design, consequently, becomes to optimize the $C_{pk}$ subjected to constraints, i.e. 2, satisfying six sigma. The proposed method shows not only an improvement of some $C_{pk}$ violating the constraints obtained by the conventional optimization, but also a significant decrease of the variance of the $C_{pk}$.

• Communications for Statistical Applications and Methods
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• 제8권3호
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• pp.697-709
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• 2001

In this paper we study two vector-valued process capability indices $C_{p}$=($C_{px}$, $C_{py}$ ) and C/aub pm/=( $C_{pmx}$, $C_{pmy}$) considering process capability indices $C_{p}$ and $C_{pm}$ . First, two asymptotic distributions of plug-in estimators $C_{p}$=($C_{px}$, $C_{py}$ ) and $C_{pm}$ =) $C_{pmx}$, $C_{pmy}$) are derived.. With the asymptotic distributions, we propose asymptotic confidence regions for our indices. Next, obtaining the asymptotic distributions of two bootstrap estimators $C_{p}$=($C_{px}$, $C_{py}$ )and $C_{pm}$ =( $C_{pmx}$, $C_{pmy}$) with our bootstrap algorithm, we will provide the consistency of our bootstrap for statistical inference. Also, with the consistency of our bootstrap, we propose bootstrap asymptotic confidence regions for our indices. (no abstract, see full-text)see full-text)e full-text)

• 유통과학연구
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• 제17권4호
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• pp.51-57
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• 2019

Purpose - This study aims to improve the distribution structure of the OLED market and develop cost-effective optimization techniques. Specifically, it is a study on the optimization of ferric chloride to improve the etch of SUS MASK for OLED. Research design, data, and methodology - Applying the optimal conditions of the experiment, the final confirmation was evaluated for improvement by the Process Capability Index (Cpk). It is possible to derive social performance such as improvement of precision of SUS MASK manufacturing, economic performance such as defect rate, reduction of waste generation and treatment cost, technological achievement such as SUS MASK production technology, improvement of profit structure of technology development and process improvement do. Results - The improvement of the Cpk before the improvement was made was confirmed to be 0.57% with a defect estimate of 25.07% with a failure estimate of 0.57% after the improvement, and 8.84% with a failure estimate of 0.57% level after the improvement. Conclusions - If the conclusions obtained from the specimen experiment are applied to the manufacturing process of SUS MASK, it will be possible to expect excellent cost-effective competitiveness due to the improvement of precision and reduction of defect rate to enhance the OLED market penetration.