• Title/Summary/Keyword: Precision Engineering

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칼만필터를 이용한 3점식 정도측정에 관한 연구

  • Lee, Yeong-Jin;Joun, Seung-Yun;Jung, Keum-Young;Kim, Jong-Hwa;Bae, Jong-Il;Lee, Man-Hyung
    • Journal of the Korean Society for Precision Engineering
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    • v.18 no.2
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    • pp.72-78
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    • 2001

  • Roundness measurement method using three displacement sensors makes in-process roundness measurement possible on the NC machine because it eliminates the vibration signal and eccentricity signal from measured roundness signal from the workpiece. But there are noises in measured signals, it isn't possible to measure the roundness with high precision. In this study, a high precision in-process roundness measurement system is development, which can eliminate vibrations of the spindle by using three displacement sensors and which can also estimate the noisy roundness measurement signals by applying Kalman filter.

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Improvement of the Optical Characteristics of Vision System for Precision Screws Using Ray Tracing Simulation (광선추적을 이용한 정밀나사 비전검사용 광학계의 결상특성 향상)

  • Baek, Soon-Bo;Lee, Ki-Yean;Joo, Won-Jong;Park, Keun;Ra, Seung-Woo
    • Journal of the Korean Society for Precision Engineering
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    • v.28 no.9
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    • pp.1094-1102
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    • 2011

  • Recent trends for the miniaturization and weight reduction of portable electronic parts is the use of subminiature components. Assembly of the miniaturized components requires subminiature screws of which pitch sizes are in a micrometer scale. To produce such a subminiature screw with high precision threads, not only a precision forming technology but also high-precision measurement technique is required. In the present work, a vision inspection system is developed to measure the thread profile of a subminiature screw. Optical simulation based on a ray tracing method is used to design and analyze the optical system of the vision inspection apparatus. Through this simulation, optical performance of the developed vision inspection system is optimized. The image processing algorithm for the precision screw inspection is also discussed.

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