• 제목/요약/키워드: Post-annealing treatment

검색결과 164건 처리시간 0.025초

습식방사 된 PVDF 섬유의 후 처리를 통한 결정구조의 변화 (The Effects of Post-Treatments for Wet Spun PVDF on the Piezoelectric Property)

  • 유성미;오현주;황상균;정용식;황희윤;김성수
    • Composites Research
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    • 제26권2호
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    • pp.123-128
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    • 2013
  • PVDF(polyvinylidene fluoride) 섬유는 습식방사방법을 적용하여 제조하였다. PVDF 분자 내 압전 특성과 밀접한 관련을 갖는 ${\beta}$형태의 결정 함량을 높이기 위하여, 본 연구에서는 습식방사 된 섬유에 1단계 연신, 2단계 어닐링 공정으로 구성하여 후 처리를 도입하였다. 후 처리는 PVDF 고분자의 유리전이 온도($T_g$)와 용융온도($T_m$) 사이의 온도범위에서 진행하여, 최대의 ${\beta}$형태 결정을 생성 할 수 있는 열처리 조건을 최적화 하였다. 제조된 PVDF 섬유 내 분자 배향 특성과 결정 구조를 확인하기 위하여 적외선 분광 광도계(FT-IR)와 X선 회절 분석기(XRD)를 이용하여 분석하였으며, 전자현미경(SEM)을 통하여 섬유의 표면을 관찰하여 섬유의 평균직경을 확인하였다. 분석 결과, 후 처리 공정이 PVDF 결정 구조의 영향을 미치며, ${\beta}$형태의 결정 비율을 증가시킨다는 것을 확인하였다. 더불어 ${\beta}$형태 결정 향상으로 인해 기계적 강도가 증가되었으며, 압전 특성 향상까지 기대할 수 있었다.

PES 필름상에 스퍼터링한 ITO 박막의 열처리에 따른 결정화 거동 및 전기적 특성 변화 (Effects of Post-Annealing on Crystallization and Electrical Behaviors of ITO Thin Films Sputtered on PES Substrates)

  • 소병수;김영환
    • 한국세라믹학회지
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    • 제43권3호
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    • pp.185-192
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    • 2006
  • The effects of annealing on structural and electrical properties of ITO/PES (Indium Tin Oxide/Polyethersulfone) films was investigated. Amorphous ITO thin films were grown on plastic substrates, PES using low temperature DC magnetron sputtering. Various post annealing techniques were attempted to research variations of microstructure and electrical properties: i) conventional thermal annealing, ii) excimer laser annealing, iii) UV irradiation. The electrical properties were obtained using Hall effect measurements and DC 4-point resistance measurement. The microstructural features were characterized by FESEM, XRD, Raman spectroscopy in terms of morphology and crystallinity. Optimized UV treatment exhibits the enhanced conductivity and crystallinity, compared to those of conventional thermal annealing.

증착 후 열처리온도에 따른 SnO2 박막의 수소 검출 민감도 변화 (Effect of Post Deposition Annealing Temperature on the Hydrogen Gas Sensitivity of SnO2 Thin Films)

  • 유용주;김선광;이영진;허성보;이학민;김대일
    • 열처리공학회지
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    • 제25권5호
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    • pp.239-243
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    • 2012
  • $SnO_2$ thin films were prepared on the Si substrate by radio frequency (RF) magnetron sputtering and then post deposition vacuum annealed to investigate the effect of annealing temperature on the structural properties and hydrogen gas sensitivity of the films. The films that annealed at $300^{\circ}C$ show the higher sensitivity than the other films annealed at $150^{\circ}C$. From atomic force microscope observation, it is supposed that post deposition annealing promotes the rough surface and also, increase gas sensitivity of $SnO_2$ films for hydrogen gas. These results suggest that the vacuum annealed $SnO_2$ thin films at optimized temperatures are promising for practical high-performance hydrogen gas sensors.

Al이 도핑된 투명전극용 ZnO 박막의 수소 열처리에 관한 특성연구 (Post-annealing of Al-doped ZnO films in hydrogen atmosphere)

  • 오병윤;정민창;이웅;명재민
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2005년도 춘계학술대회 논문집 디스플레이 광소자 분야
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    • pp.58-61
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    • 2005
  • In an effort to improve the electrical properties of ZnO:Al transparent electrode films, post-annealing treatment in hydrogen atmosphere was attempted with varying annealing time at 573 K for compatibility with typical display device fabrication processes. It was observed that carrier concentrations and mobilities increased with longer annealing time with small changes in crystallinity. This resulted in substantial decrease in resistivity from $4.80{\times}10^{-3}$ to $8.30{\times}10^{-4}{\Omega}cm$ due to increased carrier concentration. Such improvements in electrical properties are attributed to the passivation of the grain boundary surfaces. The optical properties of the films, which changed in accordance with the Burstein-Moss effect, were consistent with the observed changes in electrical properties.

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ECR plasma로 전처리된 Cu seed층 위에 전해도금 된 Cu 막에 대한 Annealing의 효과 (Effects of Post-deposition Annealing on the Copper Films Electrodeposited on the ECR Plasma Cleaned Copper Seed Layer)

  • 이한승;권덕렬;박현아;이종무
    • 한국재료학회지
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    • 제13권3호
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    • pp.174-179
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    • 2003
  • Thin copper films were grown by electrodeposition on copper seed layers which were grown by sputtering of an ultra-pure copper target on tantalum nitride-coated silicon wafers and subsequently, cleaned in ECR plasma. The copper films were then subjected to ⅰ) vacuum annealing, ⅱ) rapid thermal annealing (RTA) and ⅲ) rapid thermal nitriding (RTN) at various temperatures over different periods of time. XRD, SEM, AFM and resistivity measurements were done to ascertain the optimum heat treatment condition for obtaining film with minimum resistivity, predominantly (111)-oriented and smoother surface morphology. The as-deposited film has a resistivity of ∼6.3 $\mu$$\Omega$-cm and a relatively small intensity ratio of (111) and (200) peaks. With heat treatment, the resistivity decreases and the (111) peak becomes dominant, along with improved smoothness of the copper film. The optimum condition (with a resistivity of 1.98 $\mu$$\Omega$-cm) is suggested as the rapid thermal nitriding at 400oC for 120 sec.

CoMn2O4 스피넬 박막의 합성과 후열처리가 박막의 물리적 특성에 미치는 영향 (Growth of Spinel CoMn2O4 Thin Films and Post-growth Annealing Effects on Their Physical Properties)

  • 김두리;김진경;윤세원;송종현
    • 한국자기학회지
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    • 제25권5호
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    • pp.144-148
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    • 2015
  • 스피넬 결정구조를 지니는 $CoMn_2O_4$ 박막을 증착하였으며 이들 박막의 물리적 특성을 후열처리 이전과 이후로 비교 조사하였다. 증착온도인 $720^{\circ}C$보다 낮은 $700^{\circ}C$에서의 후열처리 과정 이후, 열처리 이전의 불분명했던 tetragonal 결정구조가 분명하여졌으며 이는 곧 표면상태의 변화로도 관측되었다. 자성특성의 경우 약 100 K에서 다결정 형태의 벌크에서는 측정할 수 없었던 상전이가 관측되었다. 상전이온도 이상의 온도에서는 전형적인 강자성 특성을 보이는 반면 상전이온도 이하에서는 페리자성 특성을 보였다. 특히 열처리 이후에는 페리자성 특성은 매우 뚜렷하여졌다. 이와 같은 결과는 후열처리과정이 $CoMn_2O_4$ 박막의 물리적 특성을 결정짓는데 필수적임을 의미한다.

Effect of post-annealing on single-walled carbon nanotubes synthesized by arc-discharge

  • Park, Suyoung;Choi, Sun-Woo;Jin, Changhyun
    • Journal of Ceramic Processing Research
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    • 제20권4호
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    • pp.388-394
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    • 2019
  • In this study, high-purity single-walled carbon nanotubes (SWCNTs) were prepared by removing the unreacted metal constituents and amorphous carbon impurities using a post-annealing process. Unlike conventional thermal processing techniques, this technique involved different gas atmospheres for efficient removal of impurities. A heat treatment was conducted in the presence of chlorine, oxygen, and chlorine + oxygen gases. The nanotubes demonstrated the best characteristics, when the heat treatment was conducted in the presence of a mixture of chlorine and oxygen gases. The scanning electron microscopy, transmission electron microscopy, ultraviolet absorbance, and sheet resistance measurements showed that the heat treatment process efficiently removed the unreacted metal and amorphous carbon impurities from the as-synthesized SWCNTs. The high-purity SWCNTs exhibited improved electrical conductivities. Such high-purity SWCNTs can be used in various carbon composites for improving the sensitivity of gas sensors.

Comparison of Resonance Characteristics in FBAR Devices by Thermal Treatments

  • Mai Linh;Song Hae-il;Yoon Giwan
    • Journal of information and communication convergence engineering
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    • 제3권3호
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    • pp.137-141
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    • 2005
  • The paper presents some methods to improve characteristics of film bulk acoustic resonator (FBAR) devices. The FBAR devices were fabricated on Bragg reflectors. Thermal treatments were done by sintering and/or annealing processes. The measurement showed a considerable improvement of return loss $(S_{11})$ and quality factor $(Q_{s/p}).$ These thermal treatment techniques seem very promising for enhancing FBAR resonance performance.

RTA를 이용한 후열처리가 PZT 박막의 강유전 특성에 미치는 영향 (The effect of rapid thermal annealing treatment for ferroelectric properties of PZT thin films)

  • 주필연;박영;정규원;임동건;송준태
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1999년도 추계학술대회 논문집
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    • pp.136-139
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    • 1999
  • The post-annealing treatments on RF (Radio Frequency) magnetron sputtered PZI(Pb$\_$1.05/(Zr$\_$0.52/, Ti$\_$0.48/)O$_3$thin films(4000${\AA}$) have been investigated. for a structure of PZT/Pt/Ti/SiO$_2$/Si Crystallization pproperties of PZT films were strongly dependent on RTA(Rapid Thermal Annealing) annealing temperature. We were able to obtain a perovskite structure of PZT at a low temperature of 600$^{\circ}C$. P-E curves of Pd/PZT/Pt capacitor annealed at 700$^{\circ}C$ demonstrate typical hysteresis loops. The measured values of P$\_$r/, E$\_$c/, by post annealed at 700$^{\circ}C$ were 12.1 ${\mu}$C/$\textrm{cm}^2$, 120KV/cm respectively.

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