• Title/Summary/Keyword: Planetary Type Reactor

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Numerical Study on Flow and Heat Transfer in a CVD Reactor with Multiple Wafers

  • Jang, Yeon-Ho;Ko, Dong Kuk;Im, Ik-Tae
    • Journal of the Semiconductor & Display Technology
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    • v.17 no.4
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    • pp.91-96
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    • 2018
  • In this study temperature distribution and gas flow inside a planetary type reactor in which a number of satellites on a spinning susceptor were rotating were analyzed using numerical simulation. Effects of flow rates on gas flow and temperature distribution were investigated in order to obtain design parameters. The commercial computational fluid dynamics software CFD-ACE+ was used in this study. The multiple-frame-of-reference was used to solve continuity, momentum and energy conservation equations which governed the transport phenomena inside the reactor. Kinetic theory was used to describe the physical properties of gas mixture. Effects of the rotation speed of the satellites was clearly seen when the inlet flow rate was small. Thickness of the boundary layer affected by the satellites rotation became very thin as the flow rate increased. The temperature field was little affected by the incoming flow rate of precursors.

Numerical Study on Wafer Temperature Considering Gap between Wafer and Substrate in a Planetary Reactor (Planetary 형 반응기에서 웨이퍼와 기판 사이의 틈새가 웨이퍼 온도에 미치는 영향에 대한 연구)

  • Ramadan, Zaher;Jung, Jongwan;Im, Ik-Tae
    • Journal of the Semiconductor & Display Technology
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    • v.16 no.3
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    • pp.1-7
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    • 2017
  • Multi-wafer planetary type chemical vapor deposition reactors are widely used in thin film growth and suitable for large scale production because of the high degree of growth rate uniformity and process reproducibility. In this study, a two-dimensional model for estimating the effect of the gap between satellite and wafer on the wafer surface temperature distribution is developed and analyzed using computational fluid dynamics technique. The simulation results are compared with the results obtained from an analytical method. The simulation results show that a drop in the temperature is noticed in the center of the wafer, the temperature difference between the center and wafer edges is about $5{\sim}7^{\circ}C$ for all different ranges of the gap, and the temperature of the wafer surface decreases when the size of the gap increases. The simulation results show a good agreement with the analytical ones which is based on one-dimensional heat conduction model.

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