• Convergence Security Journal
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• v.24 no.3
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• pp.59-65
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• 2024

This research proposes an accelerated aging test procedure for Static Random Access Memory Physically Unclonable Functions (SRAM PUFs). PUFs utilize semiconductor process variations to serve as a hardware security feature, akin to semiconductor device fingerprints. Thus, the proposed accelerated aging test simulates a semiconductor's 10-year lifecycle, enabling the prediction of PUF characteristics after a decade of use, which is crucial for verifying the safety and stability of SRAM PUFs. This research introduces test procedures that simulate 10 years of aging in approximately 9 days by setting temperature and voltage higher than operational environments. These procedures allow for the quantitative evaluation of SRAM PUF characteristics. This research is expected to contribute to the advancement of design and maintenance testing techniques for systems based on SRAM PUFs.

• Convergence Security Journal
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• v.23 no.5
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• pp.143-150
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• 2023

Applications on physically unclonable circuits (PUFs) for implementing and utilizing security protocols with hardware is on the rise. PUFs have the capability to perform functions such as authentication, prevention of replication, and secure storage of critical information in integrated circuits and security systems. Through the implementation of physically unclonable circuits, a wide range of security features, including confidentiality, integrity, and availability, can be applied. Therefore, PUFs are promising candidate to build secure integrated circuits and hardware systems. However, in order that PUFs possess security features, PUFs should possess characteristics such as unpredictability, uniqueness, and robustness characteristics. This study provides a detailed explanation and introduction of the methods to characterize the PUF properties. By applying the results, it becomes possible to quantitatively evaluate the characteristics of implemented PUFs and assess their availabilities for security system applications.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.37 no.5
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• pp.527-532
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• 2024

Physically Unclonable Functions (PUFs) provide a high level of security for private keys using unique physical characteristics of hardware. However, fabricating PUF chips requires numerous semiconductor processes, leading to high costs, which limits their applications. In this work, we introduce a low-cost manufacturing method for PUF security chips. First, surface roughening through wet-etching is utilized to create random variables. Additionally, physical vapor deposition is added to further enhance randomness. After PUF chip fabrication, both Hamming distance (HD) and Hamming weight (HW) are extracted and compared to verify the fabricated chip. It is confirmed that the PUF chip using two different multiple process variables demonstrates superior uniqueness and uniformity compared to the PUF security chip fabricated using only a single process variable.