• 세라미스트
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• 제22권4호
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• pp.350-356
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• 2019

Recently, transition metal dichalcogenide (TMDC) monolayers have been the subject of research exploring the physical phenomenon generated by low dimensionality and high symmetry. One of the keys to understanding new physical observations is the electronic band structure of 2D TMDCs. Angle-resolved photoelectron spectroscopy (ARPES) is, to this point, the best technique for obtaining information on the electronic structure of 2D TMDCs. However, through ARPES research, obtaining the long-range well-ordered single crystal samples always proves a challenging and obstacle presenting issue, which has been limiting towards measuring the electronic band structures of samples. This is particularly true in general 2D TMDCs cases. Here, we introduce the approach, with a mathematical framework, to overcome such ARPES limitations by employing the high level of symmetry of 2D TMDCs. Their high symmetry enables measurement of the clear and sharp electronic band dispersion, which is dominated by the band dispersion of single-crystal TMDCs along the two high symmetry directions Γ-K and Γ-M. In addition, we present two important studies and observations for the direct measuring of the exciton binding energy and charge transfer of 2D TMDCs, both being established by the above novel approach.

• 한국재료학회지
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• 제18권6호
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• pp.313-317
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• 2008

[ $LaFeO_3$ ] powders were synthesized using a method involving solution combustion, and the surface properties of these powders were examined by x-ray photoelectron spectroscopy. As the amount of fuel increased during the synthesis, the $LaFeO_3$ powders became amorphous with a large plate-like shape. It was found that the O 1s spectra were composed of two types of photoelectrons by deconvolutioning the spectra. Photoelectrons with higher binding energy come from adsorbed oxygen ($O^-$) whereas those with lower energy come from lattice oxygen ($O^{2-}$). The ratio of adsorbed and lattice oxygen increased as the ratio of the fuel and nitrate (${\Phi}$) increased. The binding energy of both types of oxygen increased as ${\Phi}$ increased due to the formation of carbonates.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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• pp.118-120
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• 2009

We reported that the evidence of oxygen doping to copper-phthalocyanine (CuPc) by $O_2$-plasma treatment to Au electrode of inverted top emitting organic light emitting diodes (ITOLEDs). The operation voltage of OLEDs at 150 mA/$cm^2$ decreased from 16.1 to 10.3 V as oxygen atoms indiffued to CuPc layer using $O_2$-plasma. Synchrotron radiation photoelectron spectroscopy results showed that a new bond of Cu-O appeared and the energy difference between the highest occupied molecular orbital and $E_F$ is lowered by 0.20 eV after plasma treatment. Thus the hole injection barrier was lowered, reducing the turn-on voltage and increasing the quantum efficiency of OLEDs.

• 한국진공학회지
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• 제1권1호
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• pp.100-105
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• 1992

Au/V, Au/Ti의 이중구조 박막을 대기 중에서 $500^{\circ}C$에서 열처리한 후 Auger electron spectroscopy(AES)와 X-ray photoelectron spectroscepy(XPS)를 이용하여 분석 하였다. 열처리 과정에서 Au와 SiO2 기판 사이의 V-와 Ti- 하층박막은 Au 표면 위에 산화 물을 형성하였다. 산화물의 화학조성은 Au/V, Au/Ti 박막에서 V2O5와 TiO2로 각각 판명되었다.

• 센서학회지
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• 제5권1호
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• pp.51-56
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• 1996

Structural properties of rf sputtered boron nitride films were studied as a function of deposition parameters such as nitrogen pressure, substrate temperature and substrate bias using X-ray photoelectron spectroscopy and Auger electron spectroscopy. Composition and information on chemical bonding of resultant films was determined by XPS. XPS core level spectra showed that ratio of boron to nitrogen varied from 3.11 to 1.45 with respect to partial nitrogen pressure. Curve fitting of XPS spectra revealed three kinds of bonding mechanism of boron in the films. XPS peak positions of both B 1s and N 1s shifted to higher energy with higher nitrogen pressure as well as increase in substrate bias voltage. AES was used to see possible contamination of films by carbon or oxygen as well.

• 대한화학회지
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• 제66권5호
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• pp.341-348
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• 2022

In this work, radio frequency magnetron sputtering was used to deposit zinc selenide thin films on p-type silicon (100) wafers and glass substrates in a high vacuum chamber. Several surface characterization instruments were implemented to study the thin films. X-ray photoelectron spectroscopy results revealed that oxidized Zn bound to Se (Zn-Se) at 1022.7 ± 0.1 eV becomes the dominant oxidized species when Se concentration exceeds 70%. Scanning electron microscopy coupled with energy dispersive spectroscopy showed that incorporating Se in Zn thin films will lead to formation of ZnSe grains on the surface. Contact angle measurements indicated that ZnSe-60 exhibited the lowest total surface free energy value of 24.94 mN/m. Lastly, ultraviolet-visible spectrophotometry and ultraviolet photoelectron spectroscopy data evinced that the energy band gap gradually increases with increasing Se concentration with ZnSe-70 having the highest work function value of 4.91 eV.

• 한국광과학회:학술대회논문집
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• 한국광과학회 2004년도 학술대회지
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• pp.40-40
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• 2004

• 한국진공학회:학술대회논문집
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• 한국진공학회 1994년도 제6회 학술발표회 논문개요집
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• pp.46-47
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• 1994

• 세라미스트
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• 제5권2호
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• pp.52-59
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• 2002

• 한국진공학회:학술대회논문집
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• 한국진공학회 2008년도 제35회 하계학술대회 초록집
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• pp.227-227
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• 2008