A LSI/VLSI Logic Design Structure for Testability and its Application to Programmable Logic Array Design (Test 용역성을 고려한 LSI/VLSI 논리설계방식과 Programmable Logic Array에의 응용)
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- Journal of the Korean Institute of Telematics and Electronics
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- v.21 no.3
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- pp.26-33
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- 1984