• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.453-455
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• 2004

The effect of rapid thermal annealing (RTA) treatment on the growth characteristics of CNTs was investigated. We observed that Ni catalyst film was agglomerated by RTA treatment, resulting in the formation of Ni nanoparticles. The well aligned CNTs were grown from the Ni nanoparticles by plasma enhanced chemical vapor deposition (PECVD). It is shown that the size and distribution of the nanoparticles depend mainly on the annealing temperature and initial thickness of the metal layer. Also, it was found that CNTs grown through optimal RTA treatment had the more improved field emission characteristics than those of as-grown CNTs.

• Journal of the Korean Vacuum Society
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• v.4 no.1
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• pp.85-90
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• 1995

본 연구에서는 투명 전극으로의 응용을 목적으로 PECVD법에 의해 증착된 B이 첨가된 ZnO 박막의 전기 및 광학적 특성을 살펴보았다. B을 첨가하지 않은 ZnO 박막은 비저항이 수 $\Omega$-cm 정도의 값을 가지고 있었으며 시간에 따른 비저항의 변화가 컸으나, 2% B2H6을 5-16sccm의 유량범위에서 첨가한 경우에는 5-9X10-2 $\Omega$-cm의 비저항을 가지고 시간 경과에 따른 비저항의 변화가 아주 작은 ZnO 박막을 얻을 수 있었다. Van der Pauw법에 의한 Hall 계수의 측정 결과에 의하면, B을 첨가하지 않은 ZnO 박막의 전자 농도는 1017/㎤정도였으나 B을 첨가함으로써 최고 1020/㎤까지 증가하였다. 그러나 B이 첨가되기 전에는 박막의 전하 나르게 이동도가 $4extrm{cm}^2$/V.sec 이었으나, B참가에 의해 $0.7\textrm{cm}^2$/V.sec 이하로 감소하였다. B을 첨가한 경우와 첨가하지 않은 경우의 ZnO 박막은 모두 가시광성영역에서 90%이상의 광투과율을 가지고 있었으며, B을 첨가한 경우는 전자농도가 증가함에 따라 광학적 밴드 갭이 3.3eV로부터 3.55eV로 증가하는 거동을 보였다.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08b
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• pp.1632-1635
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• 2007

We developed a novel growth method of CNTs on metal substrate for device applications, deposited by a triode direct current plasma enhanced chemical vapor deposition (dc-PECVD). With resist-assisted patterning (RAP) method, we had grown CNTs on metal substrate, which were strongly bonded with metal substrate.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.11a
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• pp.15-16
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• 2006

The thermal stability of nickel silicide with compressively and tensilely stressed nitride capping layer has been investigated in this study. The Ni (10 nm) and Ni/Co/TiN (7/3/25 nm) structures were deposited on the p-type Si substrate. The stressed capping layer was deposited using plasma enhanced chemical vapor deposition (PECVD) after silicide formation by one-step rapid thermal process (RTP) at $500^{\circ}C$ for 30 sec. It was found that the thermal stability of nickel silicide depends on the stress induced by the nitride capping layer. In the case of Ni (10 nm) structure, the high compressive sample shows the best thermal stability, whereas in the case of Ni/Co/TiN (7/3/25 nm) structure, the high compressive sample shows the worst thermal stability.

• Journal of the Korean Ceramic Society
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• v.52 no.1
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• pp.72-76
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• 2015

150-nm-thick In-Zn-Tin-Oxide (IZTO) films were deposited by RF magnetron sputtering after a 10 to 50-nm-thick $SiO_2$ buffer layer was deposited by plasma enhanced chemical vapor deposition (PECVD) on polyethylene terephthalate (PET) substrates. The electrical, structural, and optical properties of the IZTO/$SiO_2$/PET films were analyzed with respect to the thickness of the $SiO_2$ buffer layer. The mechanical properties were outstanding at a $SiO_2$ thickness of 50 nm, with a resistivity of $1.45{\times}10^{-3}{\Omega}-cm$, carrier concentration of $8.84{\times}10^{20}/cm^3$, hall mobility of $4.88cm^2/Vs$, and average IZTO surface roughness of 12.64 nm. Also, the transmittances were higher than 80%, and the structure of the IZTO films were amorphous, regardless of the $SiO_2$ thickness. These results indicate that these films are suitable for use as a transparent conductive oxide for transparency display devices.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.15 no.10
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• pp.883-888
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• 2002

SiC direct bonding technology is very attractive for both SiCOI(SiC-on-insulator) electric devices and SiC-MEMS(micro electro mechanical system) fields because of its application possibility in harsh environments. This paper presents pre-bonding techniques with variation of HF pre-treatment conditions for SiC wafer direct bonding using PECVD(plasma enhanced chemical vapor deposition) oxide. The PECYD oxide was characterized by XPS(X-ray photoelectron spectrometer) and AFM(atomic force microscopy). The characteristics of the bonded sample were measured under different bonding conditions of HF concentration and an applied pressure. The bonding strength was evaluated by the tensile strength method. The bonded interface was analyzed by using SEM(scanning electron microscope). Components existed in the interlayer were analyzed by using FT-IR(fourier transform infrared spectroscopy). The bonding strength was varied with HF pre-treatment conditions before the pre-bonding in the range of 5.3 kgf/cm$^2$to 15.5 kgf/cm$^2$.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.229.2-229.2
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• 2014

Graphene, an allotrope of carbon, is a two-dimensional material having a unique electro-mechanical property that shows significant change of the electrical conductance under the applied strain. In addition of the extraordinary mechanical strength [1], graphene becomes a prospective candidate for pressure sensor technology [2]. However, very few investigations have been carried out to demonstrate characteristics of graphene sensor as a device form. In this study, we demonstrate a pressure sensor using graphene double layer as an active channel to generate electrical signal as the response of the applied vertical pressure. For formation of the active channel in the pressure sensor, two single graphene layers which are grown on Cu foil (25 um thickness) by the plasma enhanced chemical vapor deposition (PECVD) are sequentially transformed to the poly-di-methyl-siloxane (PDMS) substrate. Dry and wet transfer methods are individually employed for formation of the double layer graphene. This sensor geometry results a switching characteristic which shows ~900% conductivity change in response to the application of pulsed pressure of 5 kPa whose on and off duration is 3 sec. Additionally, the functional reliability of the sensor confirms consistent behavior with a 200-cycle test.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.35 no.11A
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• pp.1091-1096
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• 2010

Stiction in microelectromechanical systems (MEMS) has been a major failure mechanism. Especially, in RF MEMS switches, moving parts often suffered in-use and release related stiction problems. Some materials and methods have been used to prevent this problem. Diamond-like carbon (DLC) has not only been used as a protective material owing to its good mechanical properties but also has been used as a hydrophobic material. Its properties could be controlled by post annealing treatment in various conditions. We synthesized DLC films using a radio frequency plasma enhanced chemical vapor deposition (RF PECVD) method on silicon substrates using methane ($CH_4$) and hydrogen ($H_2$) gas. Then, the change of the hydrophobic property of the films was investigated undervarious annealing temperatures in nitrogen and in oxygen ambient. The films, that were annealed above $700^{\circ}C$ in nitrogen ambient, showed a high contact angle of water (> $90^{\circ}$) even though their mechanical property was sacrificed to some degree. The structural variation and the changes of the hydrophobic and mechanical properties of the DLC films were analyzed by Raman spectrum, contact angle measurement, surface profiler, and a nanoindentation test.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.308-308
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• 2011

최근 초발수성 표면은 자동차 표면을 비롯해 안경 렌즈 등 여러 분야에서 사용되고 점차 그 필요성이 대두되고 있다. 이러한 초발수성 표면 제작은 주로 자연 상태에서 초발수 특성을 보이는 연 잎을 모방하는 방법으로 이루어지고 있다. 연 잎의 표면을 살펴보면 표면에 마이크로-나노 구조의 돌기가 존재하고 그 위에 표면에너지가 낮은 물질이 코팅되어 있는 구조이다. 본 연구에서는 이를 응용하여 금속 표면에 마이크로-나노 구조물을 형성하고 그 위에 발수 특성을 지닌 물질을 코팅하는 방법을 이용하여 초발수성 금속 표면을 개발하였다. 이는 건축 외장재, 자동차 및 내연 기관 부품, 모바일 기기 등의 가전제품 외장재 등 발수 특성을 필요로 하는 분야에 적용 가능하고, 이에 대한 수요가 급증하고 있다. 마이크로-나노 구조 형성은 기계적 가공 및 이온 빔 식각 방법을 이용하였다. 그리고 그 위에 plasma enhanced chemical vapor deposition (PECVD) 방법을 이용하여 표면에너지가 낮은 fluorinated carbon 혹은 diamond-like-carbon (DLC)를 코팅하였다. 본 연구의 결과, 표면 처리 이전 물과의 접촉각이 $60^{\circ}$ 정도를 보이는 steel 기판이 표면 처리 이후에는 $140^{\circ}$ 이상의 접촉각을 보임으로써 초발수 특성의 표면이 형성되었음을 확인할 수 있었다.

• Journal of the Korean Ceramic Society
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• v.52 no.3
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• pp.224-227
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• 2015

In this work, the properties of Indium-Zinc-Tin-Oxide (IZTO) thin films, deposited on polyethylene naphthalate (PEN) with a $SiO_2$ buffer layer, were analyzed with different working pressures. After depositing the $SiO_2$ buffer layer on PEN substrates by plasma-enhanced chemical vapor deposition (PECVD), the IZTO thin films were deposited by RF magnetron sputtering with 1 to 7-mTorr working pressure. All the IZTO thin films show an amorphous structure, regardless of the working pressure. The best morphological, electrical, and optical properties are obtained at 3-mTorr working pressure, with a surface roughness of 2.112-nm, a sheet resistance of $8.87-{\Omega}/sq$, and a transmittance at 550-nm of 88.44%. These results indicate that IZTO thin films deposited on PEN have outstanding electrical and optical properties, and the PEN plastic substrate is a suitable material for display devices.