• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.11a
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• pp.33-33
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• 2007

In PDP industry, the dielectrics and barrier ribs have been required with low dielectric constant, low melting point and Pb-free composition due to the low power consumption, low signal delay time and the environment restriction. We were studied with $B_2O_3-Al_2O_3$-SrO glass systems about optical, thermal and dielectric properties. The glass forming region of the $B_2O_3-Al_2O_3$-SrO glass systems was narrow due to the amount of the glass former $(B_2O_3)$. The glass transition temperature (Tg) of the glasses was at $550{\sim}590^{\circ}C$. The glasses have 6~8 for the dielectric constant. Furthermore, the transmittance of the glasses was over 80% on the range of the visible ray. From the results, the glasses of the $B_2O_3-Al_2O_3$-SrO glass systems should enable to be a good candidate of the PDP devices for information display with low dielectric constant. The aim of this study is to give a fundamental result of new glass system for low dielectric constant in the information display.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.11a
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• pp.200-200
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• 2009

상용의 디스플레이로 널리 사용되고 있는 PDP(Plasma Display Panel)는 LCD와의 시장 경쟁으로 인하여 극한의 원가 경쟁 하에 있다. 따라서 각 공정에 대한 공정단가를 낮추기 위한 다양한 공정 및 소재 연구가 진행되고 있다. 그 가운데 하나가 Address와 Bus 전극으로 사용되고 있는 Ag 전극의 저온 소결이다. 이 공정은 저온소결 소재의 개발과 전극에 접촉하는 유전체 층과 matching이 중요하기 때문에 이들 소재의 동시 개발이 필요한 실정이다. 본 연구에서는 Ag 전극의 저온 소성을 위한 다양한 가능성을 검토하였다. 또한, 유전체와 동시 소결 가능한 소재의 특성 향상 및 저온 소성 연구를 동시에 수행하였다. Glass에 대한 유전체 층의 인쇄와 유전체 위에 전극 입자의 크기제어를 통한 기본 조성의 matching 특성을 비교하고 입자 크기가 전극의 소결 온도에 미치는 영향을 비교 평가 하였다. 유전체 층과의 matching 특성을 향상하기 위하여 유전체 조성의 일부를 전극에 첨가하여 두 소재간의 결합력을 증대시키기 위한 실험을 진행하였다. 그 결과를 바탕으로 저온 동시소성이 가능한 전극 소재의 최적화 실험을 실시하고 그 결과 최적의 전극 소재를 제시하였다.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.703-706
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• 2004

This paper deals with the various sealing conditions in a vacuum and the discharge characteristics. The MgO thin film is prepared by e-beam evaporation method. Sealing process was performed in a vacuum at panel temperature of 430 $^{\circ}C$. We find the cracks on the MgO film surface, which results in higher discharge voltage and lower luminous efficiency. The vacuum in-line sealing technology does not require additional annealing process but induces the MgO cracks because of the high temperature sealing cycle in a vacuum. Therefore we modify the vacuum in-line sealing cycle which the MgO cracks are not found and the good characteristics of plasma displays are found in higher sealing pressure at sealing temperature of 430 $^{\circ}C$.

• Journal of the Korean Ceramic Society
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• v.38 no.4
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• pp.337-342
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• 2001

PDP(Plasma Display Panel)용 녹색 형광체인 Zn$_2$SiO$_4$:Mn에 채-dopant로 Al을 첨가하여 졸-겔법으로 합성하였다. 졸-겔법으로 제조한 형광체는 기존의 고상 반응에 의해 합성된 경우보다 낮은 온도(1000-110$0^{\circ}C$)에서 Zn$_2$SiO$_4$단일상을 형성하였으며, 300-500nm의 비교적 균일한 입자를 얻을 수 있었다. 또한, co-dopant인 Al을 첨가함으로써 발광휘도를 향상시키고, 전광시간을 줄일 수 있었다. 한편, TEOS의 가수분해시 $H_2O$/TEOS 비율을 조절하여 발광의 최적 조건을 조사하였다.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2008.10a
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• pp.3-6
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• 2008

PDP는 어드레스 기간 동안 유전체 위에 축적한 벽전하(Wall-Charge)를 이용하여 화상정보를 입력함으로서 표시방전 셀을 결정할 수 있다. 따라서 벽전하의 해석은 방전 셀 특성을 분석하기 위한 중요한 요소이나 실제 X-Y 전극 간 벽전압은 다른 인가 펄스의 영향과 공간전하의 영향이 작용하여 측정이 쉽지 않다. 본 논문에서는 공간전하의 영향과 다른 인가 펄스의 영향을 고려하여 실제 표시방전 펄스의 방전 조건과 동일한 조건을 만들어 벽전하가 소거된 상황의 방전개시전압을 측정하였으며 측정된 결과를 통해 벽전압을 계산하였다. 또한 공간전하 발생 후 시간을 변화시키면서 방전지연시간과 방전강도를 측정하여 방전 시 발생한 공간전하에 의한 영향을 분석하였다.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.12
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• pp.12-17
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• 2007

The effects of the evaporation rate of MgO films using an electron beam on the MgO properties and the discharge characteristics of a plasma display panel(PDP) were investigated and analyzed. Mgo films were deposited with the various MgO evaporation rates. The MgO properties such as the crystal orientation, the surface roughness, and the film structure, were inspected using XRD(X-ray diffractometry), AFM(atomic force microscopy). From the experiments and Paschen law, the maximum value of the secondary, electron emission coefficient $(\gamma)$ was obtained at the evaporation rate of $5\AA/sec$. The minimum firing voltage and the maximum luminous efficiency were obtained at an evaporation rate of $5\AA/sec$. In the MgO film deposited at $5\AA/sec$, the (200) orientation and $F^+$ center were most intensive. The XRD results and cathode-luminescence(CL) spectra show the $\gamma$ values are correlated with $F/F^+$ centers of the molecular structure of MgO films.

• Journal of the Korean Vacuum Society
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• v.16 no.3
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• pp.181-186
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• 2007

We have investigated and analyzed the effects of the evaporation rate of MgO films on the MgO properties and the discharge characteristics of a plasma display panel(PDP). The MgO properties such as the crystal orientation, the surface roughness, the film structure, and cathode-luminescence (CL) spectra were inspected using XRD (X-ray diffraction), AFM(atomic force microscopy). And the discharging characteristics of the PDP such as the firing voltage, discharging current, and luminescence were measured using a vacuum chamber with oscilloscope (TDS 540C), current probe (TCP-312A), color meter (CS-100A) and etc. From the experiments results we confirmed the optimum evaporation rate at $5{\AA}/sec$, the MgO properties were shown to be strongly dependent on the evaporation rate, and the MgO properties had an effecton the optical and electrical characteristics. In other words, if the evaporation rates increase than $5{\AA}/sec$, the intensity of (200) orientation and cathode-luminescence (CL) spectra reduce, and the firing vlotage was increased. So the luminuous efficiency grows worse.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.40 no.6
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• pp.39-47
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• 2003

This paper proposes the new narrow erase method to erase wall charges formed in an AC plasma display panel (PDP) cell. In the Proposed method, sustain switching timing is adjusted for inducing a weak discharge. Then, after the narrow erase, tile voltage of the X electrode is set to differ from that of the Y electrode. For the proposed method, the measured maximum address voltage margin was 38.3V at Y_Reset voltage of 100V and sustain voltage of 180∼185V. However, for the prior method, in which the X and Y electrodes we set to be of equal voltage after the narrow erase, the measured maximum address voltage margin was 31.3V at Y_Reset voltage of 150V and sustain voltage of 180V. This result shows that the measured maximum voltage margin for the proposed method is greater than that for the prior method by ∼7V(22%).

• Journal of KIEE
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• v.11 no.1
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• pp.41-45
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• 2001

The addressing time should be reduced by modifying cell structure and/or driving method in order to replace the dual scan system by single scan and increase the luminance in large ac plasma display panel(PDP). In this paper, the effects of the dielectric layer thickness and the barrier rib height on the addressing time of ac PDP are investigated. It is found out that the addressing time was decreased with decreasing thickness of dielectric layer on the front glass and thickness of white dielectric layer on the rear glass. The decreasing rate were 160ns/10${\mu}{\textrm}{m}$ and 270nsd/10${\mu}{\textrm}{m}$, respectively. Also in case of decreasing the height of barrier rib, addressing time was decreased at the rate of 550ns/10${\mu}m$.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07b
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• pp.857-860
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• 2003

Tin doped indium oxide(ITO) and Al doped zinc oxide(ZnO:Al) films, which are widely used as a transparent conductor in optoelectronic devices such as solar cell, liquid crystal display, plasma display panel, thermal heater, and other sensors, were prepared by using the capacitively coupled DC magnetron sputtering method. The electrical and optical properties of both the ITO and ZnO:Al thin films were investigated as functions of substrate temperature, working gas pressure and deposition time. ITO and ZnO:Al films with the the present experimental conditions of temperature and pressure showed resistivity of $2.36{\times}10^{-4}{\Omega}-cm,\;9.42{\times}10^{-4}{\Omega}-cm$ and transmittance of 86.28%, 90.88% in the wavelength range of the visible spectrum, respectively.