• 제목/요약/키워드: Optical interferometry

검색결과 279건 처리시간 0.032초

흘로그램 간섭계를 이용한 광픽업 베이스의 미소 열변형 측정 (Measurement of Micro Thermal Deformation of Optical Pick-up Base Using Holographic Interferometry)

  • 서영민;강신일
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2002년도 춘계학술대회 논문집
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    • pp.191-194
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    • 2002
  • In optical pick-up, optical components such as objective lens, collimator, mirror, laser diode and photo diode are mounted on the pick-up base. These components must keep their original position during operation for proper transmittance of information from laser diode to optical disk and back to photo diode. However, micro thermal deformation of pick-up base which is induced by thermal environment during operation can deteriorate the performance of optical pick-up. Therefore, it is important to measure and analyze the thermal deformation behavior of pick-up base under thermal environment. In the present study, a measurement system using holographic interferometry was designed to measure micro thermal deformation of pick up base. The measurement system was verified by using the deformation of cantilever with prescribed motion actuated by PZT with 1 nm resolution. Interferometric measurement was compared quantitatively with that induced by PZT actuator. Finally, micro thermal deformation of pick-up base under actual thermal environment was measured using the present holographic interferometry and the results were analysed.

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A Study on Displacement Measurement by A Laser Interferometry using Common-path Fiber-optical Devices

  • Lee, Seok-Soon;Lee, Dong-Wook;Park, Min-Hyeok;Choi, Jin-Gyu;Nam, Kwang-Sik;Zhao, Shang
    • International Journal of Aerospace System Engineering
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    • 제1권1호
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    • pp.29-33
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    • 2014
  • A displacement measurement system that uses fiber-optical common-path interferometry has been developed. The system includes fiber-optic devices and a collimator attached to a linear translation stage. The interferometry effect was detected with a photodetector whose signal was measured on an oscilloscope. Experiments showed that vibration of the stage disturbed the signal by causing nanoscale interference. Under stable conditions, the measured distance was the almost the same as the value calculated from the linear translation stage parameters.

광위상간섭에 의한 경면의 정밀 형상측정 (Precision Profile Measurement of Mirror Surfaces by Phase Shifting Interferometry)

  • 김승우;공인복;민선규
    • 대한기계학회논문집
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    • 제16권8호
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    • pp.1530-1535
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    • 1992
  • 본 연구에서는 초정밀 경면의 표면형상을 비접촉식으로 측정하기 위한 광위상 간섭법(phase shifting interferometry)에 관한 연구결과를 기술하였다. 리닉(lin- nik) 광학계를 이용한 광위상간섭에 대한 기본 측정원리를 정립하고 표면측정을 위한 간섭무늬처리 영상해석 알고리즘을 개발하였다. 그리고 실제적인 경면의 측정을 통 하여 개발한 광학계 및 측정 알고리즘의 타당성을 검증하였다.

시각 암호와 간섭계를 이용한 광 암호화 (Optical Encryption based on Visual Cryptography and Interferometry)

  • 이상수;서동환;김종윤;박세준;신창목;김수중;박상국
    • 한국광학회:학술대회논문집
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    • 한국광학회 2000년도 하계학술발표회
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    • pp.126-127
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    • 2000
  • In this paper, we proposed an optical encryption method based in the concept of visual cryptography and interferometry. In our method a secret binary image was divided into two sub-images and they were encrypted by 'XOR' operation with a random key mask. Finally each encrypted image was changed into phase mask. By interference of these two phase masks the original image was obtained. Compared with general visual encryption method, this optical method had good signal-to-noise ratio due to no need to generate sub-pixels like visual encryption.

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2-step 위상 천이 디지털 간섭계를 이용한 이진 데이터 암호화 및 복호화 (Encryption and decryption of binary data with 2-step phase-shifting digital interferometry)

  • 변현중;길상근;하승호
    • 한국광학회:학술대회논문집
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    • 한국광학회 2006년도 동계학술발표회 논문집
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    • pp.335-336
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    • 2006
  • We propose a method of encryption and decryption of binary data using 2-step phase-shifting digital interferometry. This technique reduces the number of interferograms in the phase-shifting interferometry. The binary data has been expressed with random code and random phase. We remove the dc-term of the phase-shifting digital interferogram to restore the original binary data. Simulation results shows that the proposed technique can be used for binary data encryption and decryption.

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Shearing Interferometry: Recent Research Trends and Applications

  • Ki-Nam Joo;Hyo Mi Park
    • Current Optics and Photonics
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    • 제7권4호
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    • pp.325-336
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    • 2023
  • We review recent research related to shearing interferometry, reported over the last two decades. Shearing interferometry is categorized as azimuthal, radial, or lateral shearing interferometers by its fundamental principle to generate interference. In this review the research trends for each technique are provided, with a summary of experimental results containing theoretical background, the optical configuration, analysis, and perspective on its application fields.

광위상간섭을 이용한 표면측정 기술현황 (State-of-the-Art of the Surface Metrology using Optical Phase Measuring Interferometry)

  • 김승우
    • 한국광학회:학술대회논문집
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    • 한국광학회 2000년도 제11회 정기총회 및 00년 동계학술발표회 논문집
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    • pp.182-187
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    • 2000
  • 빛은 공간상에서 전파되는 특성상 전자기파(electromagnetic wave)로 규정될 수 있다. 빛의 파동성은 여러 형태의 간섭을 유발한다. 이중 정밀 길이측정에는 광위상간섭(phase measuring interferometry)의 원리가 대표적으로 이용된다. 그림1은 광위상간섭의 기본원리를 Michelson 광학계를 이용하여 설명하고 있다. 하나의 동일한 광원으로부터 출발된 광속(optical beam)은 광분할기(beam splitter)에 의해 두 개로 별도 광속으로 분활 된다. (중략)

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전자 스페클 패턴 간섭계를 이용한 형상 측정 (Surface contouring using Electronic Speckle Pattern Interferometry)

  • 김계성;유원재;강영준
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 1995년도 추계학술대회 논문집
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    • pp.397-401
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    • 1995
  • ESPI(Electronic Speckle Pattern Interfermetry) is an optical technique to measure surface deforamtion of engineering components and materials in industrial ares. This optical method is capable of providing full-field results with high spatial resolution, high speed and is the non-contact technique. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The contouring method by modified dual-beam speckle pattern interferometry is proposed. We introduce a shift of the illumination beams through optical fiber in order to obtain the contour fringe patterns. The speckle pattern correlation technique is suitable for providing measurement range from millimeters to several centimeters. The complete geometric analysis of the contoretical and experimental results are obtained.

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Roughness Measurement Performance Obtained with Optical Interferometry and Stylus Method

  • Rhee Hyug-Gyo;Lee Yun-Woo;Lee In-Won;Vorburger Theodore V.
    • Journal of the Optical Society of Korea
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    • 제10권1호
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    • pp.48-54
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    • 2006
  • White-light scanning interferometry (WLI) and phase shifting interferometry (PSI) are increasingly used for surface topography measurements, particularly for areal measurements. In this paper, we compare surface profiling results obtained from above two optical methods with those obtained from stylus instruments. For moderately rough surfaces ($Ra{\approx}500\;nm$), roughness measurements obtained with WLI and the stylus method seem to provide close agreement on the same roughness samples. For surface roughness measurements in the 50 nm to 300 nm range of Ra, discrepancies between WLI and the stylus method are observed. In some cases the discrepancy is as large as 109% of the value obtained with the stylus method. By contrast, the PSI results are in good agreement with those of the stylus technique.