• 제목/요약/키워드: Optical diffraction

검색결과 1,397건 처리시간 0.03초

대역 내 기준 파장을 갖는 근적외선 그리즘 실리콘 광 면 센서 분광기 설계 및 제작 (Design and Fabrication of an NIR Grism Si Optical Area Sensor Spectrometer with In-band Reference Wavelength)

  • 송재원
    • 센서학회지
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    • 제26권1호
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    • pp.28-34
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    • 2017
  • An NIR grism Si optical area sensor spectrometer with in-band reference wavelength is designed and fabricated. It is composed of a transmission type diffraction grating (spatial density 300 line/mm), a rectangular N-BK7 prism (apex angle 30 degree), NIR filter(cutoff wavelength 720 nm), an imaging convex lens(focal length 50 mm F1.8) and an IR modified DSLR camera (Canon EOS40D) of Si optical area sensor ($3,888{\times}2,592$ pixels, pixel size $5.710{\mu}m$). "In-band reference wavelength function" is implemented using non-dispersive 0th diffraction order optical beam. The NIR grism spectrometer is tested in a laboratory using a halogen lamp and a Neon lamp. And the spectrometer is used in an astronomy field for obtaining the planet Jupiter NIR spectrum. In-band reference wavelength i.e. un-deviation wavelength is 846 nm, an wavelength resolution is 0.3027 nm/pixel, an wavelength resolving power is 2,794 and an wavelength range is 650~1,000 nm.

회절 격자를 이용한 레이저 엔코더의 광 신호처리 (Optical Signal Processing of Laser Encoder Using Diffraction Grating)

  • 김수진;은재정;최평석
    • 융합신호처리학회 학술대회논문집
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    • 한국신호처리시스템학회 2000년도 추계종합학술대회논문집
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    • pp.145-148
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    • 2000
  • Position-determining capacity is a very important condition in equipments for manufacturing semi-conductor or various instruments to measure physical displacement quantities of a moving object in submicron such as a distance of movement, direction, etc. and the accuracy of total system is influenced by detecting accuracy of these equipments. Therefore in this paper we have optically made up laser linear encoder based on optical diffraction principle to measure these displacement quantities and have processed optical signal using hardware-setup. In consequence we had acquired displacement for movement of scale using a diffraction grating by the accuracy of 0.5${\mu}{\textrm}{m}$ and had digitalized moving quantities of scale.

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도체와 유전체가 복합된 쐐기에 의한 E-편파된 전자파의 회절, II:확장된 회절계수 (E-polarized electromagnetic diffraction by a composite wedge, II:Extended diffraction coefficients)

  • 김세윤;김상욱
    • 전자공학회논문지D
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    • 제34D권7호
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    • pp.1-7
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    • 1997
  • The physical optical solution to the E-polarized diffraction by a composite wedge consisting of perfect conductor and lossless dielectric cannot sayisfy not only the boundary conditions at the wedge interfaces but also the edge condition at the wedge tip. Its diffraction coefficients are extended outside the composite wedge to become the exact solution to the perfectly conducting wedge as its relative dielectric constant increases to infinite or decreases to 1. It is assured that the extended diffraction coefficients approach zero in the arificially complementary region of the composite wedge.

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Optical Interconnection Using Binary Phase Holograms

  • Kim, Myung-Soo
    • 한국광학회:학술대회논문집
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    • 한국광학회 1991년도 광학 및 양자전자학 워크샵
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    • pp.41-46
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    • 1991
  • A block quantized binary phase hologram is introduced for optical interconnection and encoded with a simulated alogorithm to achieve high diffraction efficiency and superession of unwanted spots. The block quantized binary phase holograms encoded with the algorithm are fabricated with electron beam lithography and chemical etching. the fabricated holograms showed excellent perfoemances for optical interconnection.

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비접촉식 방법에 의한 원통형 물체의 지름 측정 (Diameter Measurement of Cylindrical Objects by Non-Contact Method)

  • 임복룡;김석원
    • 한국광학회지
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    • 제16권3호
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    • pp.177-181
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    • 2005
  • 원통형 물체의 지름을 측정하는 방법에는 여러 가지가 있지만 본 연구에서는 두 가지 비접촉식 방법인 기하광학적 방법과 간섭${\cdot}$회절 방법으로 원통형 물체의 지름을 측정하였다. 기하광학적인 방법은 원통형 렌즈를 이용하여 기울인 레이저 광선을 원통형 물체의 옆면에 비추어 나타나는 곡선을 CCD 카메라로 포착하고 이 곡선을 기하학적인 방법으로 계산하는 것이며 간섭${\cdot} $회절에 의한 방법은 스크린에 나타난 물체에 의한 레이저광의 간섭${\cdot}$회절무늬를 측정하고 분석하는 방법이다. 버니어 캘리퍼스로 측정한 평균 지름이 $0.05\;mm\;\~\;100.50\;mm$ 인 원통형 물체를 기하광학적 방법과 간섭${\cdot}$회절 방법으로 측정한 결과 각각의 상대오차가 $2\%$$1\%$범위 이내였고 다량의 물체 지름을 신속히 측정하는데 응용될 수 있음을 확인하였다.