• Title/Summary/Keyword: Optical Interferometry

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2-step Phase-shifting Digital Holographic Optical Encryption and Error Analysis

  • Jeon, Seok-Hee;Gil, Sang-Keun
    • Journal of the Optical Society of Korea
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    • v.15 no.3
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    • pp.244-251
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    • 2011
  • We propose a new 2-step phase-shifting digital holographic optical encryption technique and analyze tolerance error for this cipher system. 2-step phase-shifting digital holograms are acquired by moving the PZT mirror with phase step of 0 or ${\pi}$/2 in the reference beam path of the Mach-Zehnder type interferometer. Digital hologram with the encrypted information is Fourier transform hologram and is recorded on CCD camera with 256 gray-level quantized intensities. The decryption performance of binary bit data and image data is analyzed by considering error factors. One of the most important errors is quantization error in detecting the digital hologram intensity on CCD. The more the number of quantization error pixels and the variation of gray-level increase, the more the number of error bits increases for decryption. Computer experiments show the results to be carried out encryption and decryption with the proposed method and the graph to analyze the tolerance of the quantization error in the system.

Accurate Evaluation of Polarization Characteristics in the Integrated Optic Chip for Interferometric Fiber Optic Gyroscope Based on Path-matched Interferometry

  • Choi, Woo-Seok;Jo, Min-Sik
    • Journal of the Optical Society of Korea
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    • v.13 no.4
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    • pp.439-444
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    • 2009
  • Accurate evaluation of polarization characteristics in the integrated optic chip (IOC) for interferometric fiber optic gyroscope was performed. Spatial distribution of optical wavetrains caused by the polarization parameters such as local polarization cross-coupling and polarization rejection coefficient of the IOC were measured utilizing the path-matched optical coherence domain polarimetry (PM-OCDP). With the analytic model deduced from Jones matrix representation, we could accurately identify the polarization characteristics of the IOC. Both degree of measurement error due to the imperfect equipment conditions in PM-OCDP and birefringence of IOC chip were also characterized.

Determining Two-Sided Surface Profiles of Micro-Optical Elements Using a Dual-Wavelength Digital Holographic Microscope With Liquids

  • Lee, Hong Seok;Shin, Sanghoon;Lee, Heonjoo;Yu, Younghun
    • Journal of the Optical Society of Korea
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    • v.18 no.5
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    • pp.495-499
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    • 2014
  • In this paper, a method is proposed for simultaneously measuring the front and back surface profiles of transparent micro-optical components. The proposed method combines a dual-wavelength digital holographic microscope with liquids to record holograms at different wavelengths, and then numerically reconstructs the three-dimensional phase information to image the front and back sides of the sample. A theoretical model is proposed to determine the surface information, and imaging of an achromatic lens is demonstrated experimentally. Unlike conventional interferometry, our proposed method supports nondestructive measurement and direct observation of both front and back profiles of micro-optical elements.

On-Machine Measurement of an Optical Surface by Hartmann Test (하트만 방법에 의한 광학면의 기상측정)

  • 김용관;오창진;이응석;김옥현
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
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    • 2002.10a
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    • pp.474-480
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    • 2002
  • Aspheric optical lenses and mirrors are widely used in recent. It is more difficult to manufacture and measure the aspherical optics compared to conventional spherical ones. The interferometric optical test is common for the measurement of spherical optical surface. But the application of the interferometry to the measurement of aspheric surface is difficult because it needs a precise null corrector and very careful environmental conditions such as keeping constant temperature, humidity, atmospheric pressure and vibrations. To enhance productivity of optics manufacturing on-machine measurement and correction has been developed in this study. For practical applications, robustness of the measurement method to environments is more important. For the purpose an optical OMM(On-Machine Measurement) system has been developed using Shack-Hartmann test which has robustness to the environment. The wavefront has been reconstructed from the measured data using the primary aberration polynomial function by least square fitting. The measured result of the developed only system gives the maximum deviation only in 200 nm from the result measured by a commercial Fizeau interferometer Wyko 6000.

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Theoretical Considerations on Combined Optical Distance Measurements Using a Femtosecond Pulse Laser

  • Joo, Ki-Nam;Kim, Seung-Woo
    • Journal of the Optical Society of Korea
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    • v.16 no.4
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    • pp.396-400
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    • 2012
  • We introduce a combined technique and the mathematical description for distance measurements using a femtosecond pulse laser in a long range and a fine resolution. For distance measurements, the maximum measurable range can be extended by combining measurement results from several different methods while requiring relationships between the different measurement uncertainties and unambiguity ranges. This paper briefly explains why the uncertainty of a rough measurement technique (RMT) should be, at least, smaller than the half unambiguity range of a fine measurement technique (FMT) in order to combine a FMT with a RMT. Further discussions about the total measurement range, resolution, and uncertainty for various optical measurement techniques are also discussed.

A comparative study on peak finding algorithms in white light interferometry (백색광 간섭계의 봉우리 찾기 셈법 비교)

  • 민경일;남기봉
    • Korean Journal of Optics and Photonics
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    • v.11 no.6
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    • pp.395-399
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    • 2000
  • In white light interferometry, fast and accurate localization of the fringe visibility is the most essential part in application of the principle. So much attention has been concentrated on speeding up the process, we in this study decided to investigate the results of the various peak-finding algorithms. Of the many approaches, two most simplistic algorithms were selected for their straightforwardness and robustness. Both were equally accurate in measuring the step height of a sample, but the method based on the weighted average technique proved to be truer to the surface topography. A model explaining the shortcomings of the correlation technique is presented. ented.

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A Brief Overview of a Scale Independent Deformation Theory and Application to Diagnosis of Deformational Status of Solid-State Materials

  • Yoshida, Sanichiro
    • Journal of the Korean Society for Nondestructive Testing
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    • v.32 no.2
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    • pp.131-141
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    • 2012
  • A field theoretical approach to deformation and fracture of solid-state material is outlined, and its application to diagnosis of deformational status of metal specimens is discussed. Being based on a fundamental physical principle known as local symmetry, this approach is intrinsically scale independent, and capable of describing all stages of deformation on the same theoretical foundation. This capability enables us to derive criteria that can be used to diagnose transitions from the elastic to plastic regime, and the plastic to fracturing regime. For practical applications of these criteria, an optical interferometric technique known as electronic speckle-pattern interferometry is proved to be quite powerful; it is able to visualize the criteria as a whole image of the object on a real-time basis without numerical processing. It is demonstrated that this method is able to reveal loading hysteresis as well.

Measurement and Analysis of in-plane deformation by laser interferometry (레이저 간섭법을 이용한 면내 변형 측정 및 해석)

  • 노경완;유원재;김동우
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 1997.04a
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    • pp.91-95
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    • 1997
  • ESPI(Electronic Speckle Pattern Interferometry) is new optical measuring method to be able to measure the surface deformations of engineering components and materials in industrial areas. Conventional measuring method of surface deformation such as the strain gauge have many demerits because it is contact and point-to-point measuring one. But ESPI that is non-contact, whole field measuring method can overcome previous disadvantages. The speckle pattern to be formed with interference phenomena of scattering light from rough surfaces illuminated by laser light have phase information of surface In this study we used this interference phenomena and the phase shifting method to measure the in- plane deformation, together with the use of digital equipment to process the information contained in the speckle pattern and to display consequent inter ferograms. Finally we obtained good agreement between the experimenta results and those of FEM..

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Determination of Elastic Modulus by Time Average ESPI and Euler-Bernoulli Equation (Time Average ESPI와 Euler-Bernoulli 방정식에 의한 탄성계수 측정)

  • Kim, Koung-Suk;Lee, Hang-Seo;Kang, Young-June;Kang, Ki-Soo
    • Journal of the Korean Society for Precision Engineering
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    • v.24 no.7 s.196
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    • pp.69-74
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    • 2007
  • The paper proposes a new sonic resonance test for a elastic modulus measurement which is based on time-average electronic speckle pattern interferometry(TA-ESPI) and Euler-Bernoulli equation. Previous measurement technique of elastic constant has the limitation of application for thin film or polymer material because contact to specimen affects the result. TA-ESPI has been developed as a non-contact optical measurement technique which can visualize resonance vibration mode shapes with whole-field. The maximum vibration amplitude at each vibration mode shape is a clue to find the resonance frequencies. The dynamic elastic constant of test material can be easily estimated from Euler-Bernoulli equation using the measured resonance frequencies. The proposed technique is able to give high accurate elastic modulus of materials through a simple experiment set up and analysis.

Development of electronic shearography for vibration analysis (진동해석을 위한 전자전단간섭계의 개발)

  • Kang, Young-June;Kwon, Yong-Ki
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.21 no.12
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    • pp.2047-2054
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    • 1997
  • This paper describes a measuring method of vibration mode shapes by the Electronic Shearography. This method called the speckle interferometer has many merits in practical use, such as low sensitivity to environmental noise, low limit of coherent-length and simple optical configuration. In this study, we developed Michelson-type shearing interferometer provided with a phase stepping mirror and with a bias modulation mirror to quantify the vibration gradient fields. Results of application to a simple cantilever plate show that the vibration amplitude fields obtained are in good agreement with those of the electronic speckle pattern interferometry (ESPI).