• Title/Summary/Keyword: Optical Fabrication

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Fabrication of ATO thin film for IR-cut off by sol-gel method (솔-젤 법에 의한 적외선 차단 ATO 박막 제조)

  • Kim, Jin-Ho;Lee, Kwang-Hee;Lee, Mi-Jai;Hwang, Jonghee;Lim, Tae-Young
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.23 no.5
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    • pp.230-234
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    • 2013
  • IR cut-off thin films consisted of ATO nanoparticles were successfully fabricated by sol-gel method. The coating solution was synthesized with organic/inorganic hybrid binder and ATO colloidal solution and ATO thin films were coated on a slide glass with the withdrawal speed of 5~40 mm/s. As the withdrawal speed increased from 5 mm/s to 40 mm/s, the thickness of coating thin films also increased from $1.05{\mu}m$ to $4.25{\mu}m$ and the IR cut-off in wavelength of 780~2500 nm increased from 49.5 % to 66.7 %. In addition, the pencil hardness of ATO thin films dried at $80^{\circ}C$ was ca. 5H and the coating films were not removed after a cross cutter tape test because of the hybrid binder synthesized with tetraethylorthosilicate and methyltrimethoxysilane. The surface morphologies, optical properties and film thickness of prepared thin films with a different withdrawal speed were measured by field emission scanning electron microscope (FE-SEM), UV-Vis spectrophotometer, and Dektak.

Fabrication and characterization of boron free E-glass fiber compositions (붕소를 함유하지 않는 E-glass fiber의 제조 및 특성에 대한 연구)

  • Lee, Ji-Sun;Lim, Tae-Young;Lee, Yo-Sep;Lee, Mi-Jai;Hwang, Jonghee;Kim, Jin-Ho;Hyun, Soong-Keun
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.23 no.1
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    • pp.44-50
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    • 2013
  • E-glass fiber is the most widely used glass fiber for reinforced composite materials of aircrafts, automobiles and leisure equipments. But recently researches are being progressed to reduce boric oxide from 8 % to 0 (zero), as is called 'Boron free E-glass', because of increasing material cost, environmental problem, and improving chemical resistance and mechanical properties of E-glass fiber. In this study, we fabricated the bulk glass and fiber glass of 'Boron free E-glass (BF) compositions', and characterized thermal properties and optical properties. 'Boron free E-glass (BF)' was obtained by the melting of mixed batch materials at $1550^{\circ}C$ for 2 hrs with different $Al_2O_3$ compositions 5~10 %. We obtained transparent clear glass with high visible light transmittance value of 81~86 %, and low thermal expansion coefficient of $4.2{\sim}4.9{\times}10^{-6}/^{\circ}C$ and softening point of $907{\sim}928^{\circ}C$. For the chemical resistance test of 'BF' fiber samples, we identified that the higher alumina contents gives the better corrosion resistance of glass fiber.

Fabrication of a Schottky Type Ultraviolet Photodetector Using GaN Layer (GaN를 이용한 Schottky diode형 자외선 수광소자의 제작)

  • Seong, Ik-Joong;Lee, Suk-Hun;Lee, Chae-Hyang;Lee, Yong-Hyun;Lee, Jung-Hee;Hahm, Sung-Ho
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.36D no.6
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    • pp.28-34
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    • 1999
  • We fabricated a planar ultra-violet photodetector whose ohmic and schottky contacts were respectively formed with evaporated Al and Pt on the GaN layer. To examine the applicability of the device to the UV sensor, we investigated its electrical and optical characteristics. The GaN layer on the sapphire waver had $7.8{\times}10^{16}cm^{-3}$ of doping concentnation and the $138 cm^2/V{\cdot}s$ of electron mobility and it absorbed the spectrum of the light below 325 nm wavelength. It had the responsivity of 2.8 A/W of at 325 nm, and the signal to noise ratio(SNR) of $4{\times}10^4$, and the noise equivalent power(NEP) of $3.5{\times}10^9$W under 5 V reverse bias. These results confirmed that the GaN schottky diode had a solar blind properly when it was applied to the UV photodetector.

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PEMOCVD of Ti(C,N) Thin Films on D2 Steel and Si(100) Substrates at Low Growth Temperatures

  • Kim, Myung-Chan;Heo, Cheol-Ho;Boo, Jin-Hyo;Cho,Yong-Ki;Han, Jeon-Geon
    • Proceedings of the Korean Vacuum Society Conference
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    • 1999.07a
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    • pp.211-211
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    • 1999
  • Titanium nitride (TiN) thin films have useful properties including high hardness, good electrical conductivity, high melting point, and chemical inertness. The applications have included wear-resistant hard coatings on machine tools and bearings, decorative coating making use of the golden color, thermal control coatings for widows, and erosion resistant coatings for spacecraft plasma probes. For all these applications as feature sizes shrink and aspect ratios grow, the issue of good step coverage becomes increasingly important. It is therefore essential to manufacture conformal coatings of TiN. The growth of TiN thin films by chemical vapor deposition (CVD) is of great interest for achieving conformal deposition. The most widely used precursor for TiN is TiCl4 and NH3. However, chlorine impurity in the as-grown films and relatively high deposition temperature (>$600^{\circ}C$) are considered major drawbacks from actual device fabrication. To overcome these problems, recently, MOCVD processes including plasma assisted have been suggested. In this study, therefore, we have doposited Ti(C, N) thin films on Si(100) and D2 steel substrates in the temperature range of 150-30$0^{\circ}C$ using tetrakis diethylamido titanium (TDEAT) and titanium isopropoxide (TIP) by pulsed DC plamsa enhanced metal-organic chemical vapor deposition (PEMOCVD) method. Polycrystalline Ti(C, N) thin films were successfully grown on either D2 steel or Si(100) surfaces at temperature as low as 15$0^{\circ}C$. Compositions of the as-grown films were determined with XPS and RBS. From XPS analysis, thin films of Ti(C, N) with low oxygen concentration were obtained. RBS data were also confirmed the changes of stoichiometry and microhardness of our films. Radical formation and ionization behaviors in plasma are analyzed by optical emission spectroscopy (OES) at various pulsed bias and gases conditions. H2 and He+H2 gases are used as carrier gases to compare plasma parameter and the effect of N2 and NH3 gases as reactive gas is also evaluated in reduction of C content of the films. In this study, we fond that He and H2 mixture gas is very effective in enhancing ionization of radicals, especially N resulting is high hardness. The higher hardness of film is obtained to be ca. 1700 HK 0.01 but it depends on gas species and bias voltage. The proper process is evident for H and N2 gas atmosphere and bias voltage of 600V. However, NH3 gas highly reduces formation of CN radical, thereby decreasing C content of Ti(C, N) thin films in a great deal. Compared to PVD TiN films, the Ti(C, N) film grown by PEMOCVD has very good conformability; the step coverage exceeds 85% with an aspect ratio of more than 3.

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Fabrication of superhydrophobic $TiO_2$ thin films by wet process (습식 공정법에 의한 초발수 $TiO_2$ 박막 제조)

  • Kim, Jin-Ho;Jung, Hyun-Ho;Hwang, Jong-Hee;Lim, Tae-Young;Choi, Duk-Gun;Cheong, Deock-Soo;Kim, Sae-Hoon
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.19 no.5
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    • pp.262-267
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    • 2009
  • Superhydrophobic $TiO_2$ thin films were successfully fabricated on a glass substrate by wet process. Layer-by-layer (LBL) deposition and liquid phase deposition (LPD) methods were used to fabricate the thin films of micro-nano complex structure with a high roughness. To fabricate superhydrophobic $TiO_2$ thin films, the (PAH/PAA) thin films were assembled on a glass substrate by LBL method and then $TiO_2$ nanoparticles were deposited on the surface of (PAH/PAA) thin film by LPD method, Subsequently, hydrophobic treatment using fluoroalkyltrimethoxysilane (FAS) was carried out on the surface of prepared $TiO_2$ thin films. The $TiO_2$ thin film fabricated with 45 minutes immersion time on $(PAH/PAA)_{10}$ showed the RMS roughness of 65.6nm, water contact angel of $155^{\circ}$ and high transmittance of above 80% (>650nm in wavelength) after the hydrophobic treatment. The Surface morphologies, optical properties and contact angel of prepared thin films with different experimental conditions were measured by field emission scanning electron microscope (FE-SEM), atomic force microscope (AFM), UV-Vis spectrophotometer and contact angle meter.

Design and fabrication of a high power LED searchlight (고출력 LED 탐조등의 설계 및 제작)

  • Kim, Se-Jin;Kim, Sun-Jae;Ha, Hee-Ju;Kil, Gyung-Suk;Kim, Il-Kwon
    • Journal of Advanced Marine Engineering and Technology
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    • v.38 no.6
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    • pp.737-743
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    • 2014
  • This paper dealt with a retrofit high power LED searchlight to replace conventional 1kW halogen searchlights. The design specification meets KDS 6230-1046-1 and KS V 8469. An optical lens with the beam angle of $6^{\circ}$ was used to meet the luminous intensity of 800,000cd at $0^{\circ}$ in horizontal line. Heat dissipation of the LED searchlight adopted a free air cooling type which does not use a fan or a heat-pipe. From the test results, power consumption of the prototype LED searchlight was 148W which was saved by 85% comparing a halogen searchlight of 1kW. Luminous intensity was 945,000cd at $0^{\circ}$ in horizontal line, satisfying KS V 8469. Luminous efficacy was improved by 4.7 times higher than that of the halogen searchlights. Beam angle, color temperature, and color rendering index(CRI) was $5.4^{\circ}$, 5,500K, and 70, respectively. Surface temperature of the LED searchlight was below $60^{\circ}C$ and surrounding temperature of the SMPS installed inside was below $50^{\circ}C$ which were satisfied with the IEC 60092-306.

Fabrication and Dosimetry Characteristics of Intracavitary Cones for Radiotherapy (방사선 강내치료를 위한 소조사면 전자선cone의 선량분포 특성)

  • 나수경;권수일
    • Progress in Medical Physics
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    • v.12 no.1
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    • pp.95-102
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    • 2001
  • The intracavitary cones were designed which were made of stainless steel and have scratched inside cone to be generated electron scatter and designed to be attached easily to the LINAC collimator and controlled cones length to be contacted smoothly between the patient and the cone tip. Two types of intracavitary cones were designed. One is the straight end cones with circular opening on the distal end and the other is 30 degree beveled end cones with elliptical opening on the distal end. Each type of intracavitary cone ranged in daimeter from 2.5 cm to 3.5 cm and required a separate set of lower trimmer annulias cone diameter. The film phantom was designed with an internal cassette that accurately aligned the film edge with the film phantom surface. Film optical density data were measured by photodensitometer(Wellhofer 700i) Dosimetry measurements were made to commission the LINAC for 6 - 20 MeV electron using the intracavitary cones. Isodose curves were measured for all energy and cones combinations. Output is defined as the maximum dose per MU along the clinical central axis in water at 113 cm SSD. Calibration output, defined to be the output for the 15cm$\times$15cm diameter straight cone, was adjusted to 1.00 cGy/MU at each energy according to the TG-21 protocol.

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Electrical Characteristic of IGZO Oxide TFTs with 3 Layer Gate Insulator

  • Lim, Sang Chul;Koo, Jae Bon;Park, Chan Woo;Jung, Soon-Won;Na, Bock Soon;Lee, Sang Seok;Cho, Kyoung Ik;Chu, Hye Yong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.344-344
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    • 2014
  • Transparent amorphous oxide semiconductors such as a In-Ga-Zn-O (a-IGZO) have advantages for large area electronic devices; e.g., uniform deposition at a large area, optical transparency, a smooth surface, and large electron mobility >10 cm2/Vs, which is more than an order of magnitude larger than that of hydrogen amorphous silicon (a-Si;H).1) Thin film transistors (TFTs) that employ amorphous oxide semiconductors such as ZnO, In-Ga-Zn-O, or Hf-In-Zn-O (HIZO) are currently subject of intensive study owing to their high potential for application in flat panel displays. The device fabrication process involves a series of thin film deposition and photolithographic patterning steps. In order to minimize contamination, the substrates usually undergo a cleaning procedure using deionized water, before and after the growth of thin films by sputtering methods. The devices structure were fabricated top-contact gate TFTs using the a-IGZO films on the plastic substrates. The channel width and length were 80 and 20 um, respectively. The source and drain electrode regions were defined by photolithography and wet etching process. The electrodes consisting of Ti(15 nm)/Al(120 nm)/Ti(15nm) trilayers were deposited by direct current sputtering. The 30 nm thickness active IGZO layer deposited by rf magnetron sputtering at room temperature. The deposition condition is as follows: a rf power 200 W, a pressure of 5 mtorr, 10% of oxygen [O2/(O2+Ar)=0.1], and room temperature. A 9-nm-thick Al2O3 layer was formed as a first, third gate insulator by ALD deposition. A 290-nm-thick SS6908 organic dielectrics formed as second gate insulator by spin-coating. The schematic structure of the IGZO TFT is top gate contact geometry device structure for typical TFTs fabricated in this study. Drain current (IDS) versus drain-source voltage (VDS) output characteristics curve of a IGZO TFTs fabricated using the 3-layer gate insulator on a plastic substrate and log(IDS)-gate voltage (VG) characteristics for typical IGZO TFTs. The TFTs device has a channel width (W) of $80{\mu}m$ and a channel length (L) of $20{\mu}m$. The IDS-VDS curves showed well-defined transistor characteristics with saturation effects at VG>-10 V and VDS>-20 V for the inkjet printing IGZO device. The carrier charge mobility was determined to be 15.18 cm^2 V-1s-1 with FET threshold voltage of -3 V and on/off current ratio 10^9.

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Characterization and Formation Mechanism of Zr-Cu and Zr-Cu-Al Metallic Glass Thin Film by Sputtering Process

  • Lee, Chang-Hun;Sun, Ju-Hyun;Moon, Kyoung-Il;Shin, Seung-Yong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.271-272
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    • 2012
  • Bulk Metallic Glasses (BMGs or amorphous alloy) exhibit high strength and good corrosion resistance. Applications of thin films and micro parts of BMGs have been used a lot since its inception in the research of BMGs. However, Application and fabrication of BMGs are limited to make structural materials. Thin films of BMGs which is sputtered on the surface of structural materials by sputtering process is used to improve limits about application of BMGs. In order to investigate the difference of properties between designed alloys and thin films, we identified that thin films deposited on the surface that have the characteristic of the amorphous films and the composition of designed alloys. Zr-Cu (Cu=30, 35, 38, 40, 50 at.%) and Zr-Cu-Al (Al=10 at.% fixed, Cu=26, 30, 34, 38 at.%) alloys were fabricated with Zr (99.7% purity), Cu (99.997% purity), and Al (99.99% purity) as melting 5 times by arc melting method before rods 2mm in diameter was manufactured. In order to analyze GFA (Glass Forming Ability), rods were observed by Optical Microscopy and SEM and $T_g$, $T_x$, ($T_x$ is crystallization temperature and $T_g$ is the glass transition temperature) and Tm were measured by DTA and DSC. Powder was manufactured by Gas Atomizer and target was sintered using powder in large supercooled liquid region ($=T_x-T_g$) by SPS(Spark Plasma Sintering). Amorphous foil was prepared by RSP process with 5 gram alloy button. The composition of the foil and sputtered thin film was analyzed by EDS and EPMA. In the result of DSC curve, binary alloys ($Zr_{62}Cu_{38}$, $Zr_{60}Cu_{40}$, $Zr_{50}Cu_{50}$) and ternary alloys ($Zr_{64}Al_{10}Cu_{26}$, $Zr_{56}Al_{10}Cu_{34}$, $Zr_{52}Al_{10}Cu_{38}$) have $T_g$ except for $Zr_{70}Cu_{30}$ and $Zr_{60}Al_{10}Cu_{30}$. The compositions with $T_g$ made into powders. Figure shows XRD data of thin film showed similar hollow peak.

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Electrooptic Modulator with InAs Quantum Dots (InAs/InGaAs 양자점을 이용한 전계광학변조기)

  • Ok, Seong-Hae;Moon, Yon-Tae;Choi, Young-Wan;Son, Chang-Wan;Lee, Seok;Woo, Deok-Ha;Byun, Young-Tae;Jhon, Young-Min;Kim, Sun-Ho;Yi, Jong-Chang;Oh, Jae-Eung
    • Korean Journal of Optics and Photonics
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    • v.17 no.3
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    • pp.278-284
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    • 2006
  • We have fabricated and measured electrooptic modulator using coupled stack InAs/InGaAs quantum dots. The height of the quantum dot is 16 nm and quantum dots are stacked including an InGaAs capping layer. The peak wavelength of photoluminescence is 1260 nm at room temperature and 1158 nm at 12 K. The operation characteristics of the quantum dots show high modulation efficiency of electrooptic modulator at 1550 nm compared to that of existing III-V bulk and MQW type semiconductor. The measured switching voltage ($V\pi$) is 540 and 600 mV, for TE mode and TM mode, respectively. From the results, the modulation efficiency can be determined as 333.3 and $300^{\circ}/V{\cdot}mm$ for TE and TM modes. The results reported here may lead to the design and fabrication of a novel electrooptic modulator with low switching voltage and high efficiency.