• Journal of Applied Reliability
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• v.13 no.2
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• pp.99-107
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• 2013

One-shot device is required to successfully perform its function only once at the moment of use. The reliability of a one-shot device should be expressed as a probability of success. In this paper, we propose a bayesian approach for estimating reliability of one-shot devices with small sample size. We employ a gamma prior to obtain the posterior distribution. Finally, we compare the accuracy of the proposed method with general maximum likelihood method.

• Industry Promotion Research
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• v.7 no.4
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• pp.1-8
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• 2022

There are many one-shot devices that are used once and thrown away. One-shot devices such as firecrackers and ammunition are typical, and they are stored for a while after manufacture and then disposed of after use when necessary. However, unlike general operating systems, these one-shot devices have not been properly evaluated. This study first examines what the government does to secure reliability in the case of ammunition through ammunition stockpile reliability program. Next, in terms of statistical analysis, we show what the reliability analysis methods are for one-shot devices such as ammunition. Specifically, we show that it is possible to know the level of reliability if sampling inspection plan such as KS Q 0001 which is acceptance sampling plan by attributes is used. Next, non-parametric and parametric methods are introduced as ways to determine the storage reliability of ammunition. Among non-parametric methods, Kaplan-Meier method can be used since it can also handle censored data. Among parametric methods, Weibull distribution can be used to determine the storage reliability of ammunition.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.16 no.9
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• pp.771-774
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• 2003

In this paper, the programming characteristics of the multi-bit devices based on SONOS structure are investigated. Our devices have been fabricated by 0.35 $\mu\textrm{m}$ complementary metal-oxide-semiconductor (CMOS) process with LOCOS isolation. In order to achieve the multi-bit operation per cell, charges must be locally frapped in the nitride layer above the channel near the source-drain junction. Programming method is selected by Channel Hot Electron (CUE) injection which is available for localized trap in nitride film. To demonstrate CHE injection, substrate current (Isub) and one-shot programming curve are investigated. The multi-bit operation which stores two-bit per cell is investigated. Also, Hot Hole(HH) injection for fast erasing is used. The fabricated SONOS devices have ultra-thinner gate dielectrics and then have lower programming voltage, simpler process and better scalability compared to any other multi-bit storage Flash memory. Our programming characteristics are shown to be the most promising for the multi-bit flash memory.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.21 no.12
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• pp.339-345
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• 2020

In the field of defense, one-shot devices such as missiles are stored for a long period of time after they are manufactured, so it is essential to predict their storage life. A study was conducted to find the shelf life of a Li-ion battery used in one-shot devices. To do this, a Li-ion battery that has been used in weapon systems for more than 5 years was secured. A non-functional test was performed on the battery to check for external changes or failures. After the non-functional test, a discharge test was performed to measure the performance after storing it. Through the test, the performance was checked, including the initial charging voltage, discharge time, and battery temperature, and the trend of the change was identified. An F-test, One-way ANOVA, and regression analysis were performed to verify the aging, and the shelf life of the battery was estimated by an approximation formula that was derived through a regression analysis. As a result of the ANOVA, the p-value was less than the reference value of 0.05, and the performance of the battery decreased by more than 15% after a certain period of time. This change is assumed to result from the change in physical properties of the lithium polymer cell.

• Journal of the Korea Institute of Military Science and Technology
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• v.20 no.2
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• pp.225-230
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• 2017

To generate mechanical movements in one-shot devices such as missiles and space launch vehicles, pyrotechnic mechanical device(PMD) such as pin pullers using pyrotechnic charge has been widely used. Reliability prediction of pin pullers is crucial to successfully execute target missions for the one-shot devices. Because the pin pullers require destructive tests to evaluate their reliability, one would need about 3,000 samples of success to guarantee a reliability of 99.9 % with a confidence level of 95 %. This paper suggests the application of a probit model using the charge amount as a functional parameter for estimation of functional reliability of pin puller. To guarantee target reliability, we propose estimation methods of the lower bound of functional reliability by applying the probit model. Given lower bound of functional reliability, we quantitatively show that the optimum amount of charge increases as the number of samples decreases. Along with a variety of simulations the validity of our new model via real test results is confirmed.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07a
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• pp.80-83
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• 2003

In this paper, the programming characteristics of the multi-bit devices based on SONOS structure are investigated. Our devices have been fabricated by $0.35\;{\mu}m$ complementary metal-oxide-semiconductor (CMOS) process with LOCOS isolation. In order to achieve the two-bits per cell operation, charges must be locally trapped in the nitride layer above the channel near the junction. Channel hot electron (CHE) injection for programming can operate in multi-bit using localized trap in nitride film. CHE injection in our devices is achieved with the single power supply of 5 V. To demonstrate CHE injection, substrate current (Isub) and one-shot programming curve were investigated. The multi-bit operation which stores two-bit per cell is investigated with a reverse read scheme. Also, hot hole injection for fast erasing is used. Due to the ultra-thin gate dielectrics, our results show many advantages which are simpler process, better scalability and lower programming voltage compared to any other two-bit storage flash memory. This fabricated structure and programming characteristics are shown to be the most promising for the multi-bit flash memory.

• Journal of Broadcast Engineering
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• v.11 no.2 s.31
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• pp.207-221
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• 2006

A fully automatic and computationally efficient method is proposed for intelligent display of soccer video on small multimedia mobile devices. The rapid progress of the multimedia signal processing has contributed to the extensive use of multimedia devices with a small LCD panel. With these emerging small mobile devices, the video sequences captured for standard- or HDTV broadcasting may give the small-display-viewers uncomfortable experiences in understanding what is happening in a scene. For instance, in a soccer video sequence taken by a long-shot camera technique, the tiny objects (e.g., soccer ball and players) may not be clearly viewed on the small LCD panel. Thus, an intelligent display technique is needed for small-display-viewers. To this end, one of the key technologies is to determine region of interest (ROI), which is a part of the scene that viewers pay more attention to than other regions. In this paper, the focus is on soccer video display for mobile devices. Instead of taking visual saliency into account, we take domain-specific approach to exploit the characteristics of the soccer video. The proposed scheme includes three modules; ground color learning, shot classification, and ROI determination. The experimental results show the propose scheme is capable of intelligent video display on mobile devices.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.11a
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• pp.35-38
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• 2002

In this paper, the characteristics of channel hot electron (CHE) injection for the write operation in a NOR-type SONOS flash memory with common source line were investigated. The thicknesses of he tunnel oxide, the memory nitride， and the blocking oxide layers for the gate insulator of the fabricated SONOS devices were $34{\AA}$, $73{\AA}$, and $34{\AA}$, respectively. The SONOS devices compared to floating gate devices have many advantages, which are a simpler cell structure, compatibility with conventional logic CMOS process and a superior scalability. For these reasons, the introduction of SONOS device has stimulated. In the conventional SONOS devices, Modified Folwer-Nordheim (MFN) tunneling and CHE injection for writing require high voltages, which are typically in the range of 9 V to 15 V. However CHE injection in our devices was achieved with the single power supply of 5 V. To demonstrate CHE injection, substrate current (Isub) and one-shot programming curve were investigated. The memory window of about 3.2 V and the write speed of $100{\mu}s$ were obtained. Also, the disturbance and drain turn-on leakage during CHE injection were not affected in the SONOS array. These results show that CHE injection can be achieved with a low voltage and single power supply, and applied for the high speed program of the SONOS memory devices.

• ETRI Journal
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• v.40 no.4
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• pp.421-434
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• 2018

The application of deep neural networks (DNNs) to connect the world with cyber physical systems (CPSs) has attracted much attention. However, DNNs require a large amount of memory and computational cost, which hinders their use in the relatively low-end smart devices that are widely used in CPSs. In this paper, we aim to determine whether DNNs can be efficiently deployed and operated in low-end smart devices. To do this, we develop a method to reduce the memory requirement of DNNs and increase the inference speed, while maintaining the performance (for example, accuracy) close to the original level. The parameters of DNNs are decomposed using a hybrid of canonical polyadic-singular value decomposition, approximated using a tensor power method, and fine-tuned by performing iterative one-shot hybrid fine-tuning to recover from a decreased accuracy. In this study, we evaluate our method on frequently used networks. We also present results from extensive experiments on the effects of several fine-tuning methods, the importance of iterative fine-tuning, and decomposition techniques. We demonstrate the effectiveness of the proposed method by deploying compressed networks in smartphones.

• Journal of Applied Reliability
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• v.4 no.2
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• pp.105-119
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• 2004

Reliability program is essential to the development of space systems like launch vehicles and satellites, as they are non-repairable after launch and the failure of a launch vehicle resulted in catastrophic consequences for the mission. Foreign advanced space organizations have developed and implemented their own reliability management programs for launch vehicles from the conceptual design stage to the detail processes for the individual components, procedures and test reports. A study on the launch failures and the reliability analysis methods for one-shot devices contained in this paper will contribute to the reliability improvement for Korean launch vehicle and components.