• 제목/요약/키워드: On-chip Packaging

검색결과 318건 처리시간 0.026초

WiFi용 스위치 칩 내장형 기판 기술에 관한 연구 (The Fabrication and Characterization of Embedded Switch Chip in Board for WiFi Application)

  • 박세훈;유종인;김준철;윤제현;강남기;박종철
    • 마이크로전자및패키징학회지
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    • 제15권3호
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    • pp.53-58
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    • 2008
  • 본 연구에서는 상용화된 2.4 GHz 영역대에서 사용되어지는 WiFi용 DPDT(Double Pole Double throw) switch 칩을 laser 비아 가공과 도금 공정을 이용하여 폴리머 기판내에 내장시켜 그 특성을 분석하였으며 통상적으로 실장되는 wire 본딩방식으로 패키징된 기판과 특성차이를 분석 비교하였다. 폴리머는 FR4기판과 아지노 모토사의 ABF(Ajinomoto build up film)를 이용하여 패턴도금법으로 회로를 형성하였다. ABF공정의 최적화를 위해 폴리머의 경화정토를 DSC (Differenntial Scanning Calorimetry) 및 SEM (Scanning Electron microscope)으로 분석하여 경화도에 따라 도금된 구리패턴과의 접착력을 평가하였다. ABF의 가경화도가 $80\sim90%$일 경우 구리층과 최적의 접착강도를 보였으며 진공 열압착공정을 통해 기공(void)없이 칩을 내장할 수 있었다. 내장된 기관과 와이어 본딩된 기판의 측정은 S 파라미터를 이용하여 삽입손실과 반사손실을 비교 분석하였으며 그 결과 삽입손실은 두 경우 유사하게 나타났지만 반사손실의 경우 칩이 내장된 경우 6 GHz 까지 -25 dB 이하로 안정적으로 나오는 것을 확인할 수 있었다.

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집적화된 CMOS 센서의 팩키징 연구 및 특성 평가 (The Study and characteristics of integrated CMOS sensor's packaging)

  • 노지형;권혁빈;신규식;조남규;문병무;이대성
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2009년도 제40회 하계학술대회
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    • pp.1551_1552
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    • 2009
  • In this paper, we presented the packaging technologies of CMOS ISFET(Ion Sensitive Field Effect Transistor) pH sensor using post-CMOS process and MCP(Multi Chip Packaging). We have proposed and developed two types of packaging technology. one is one chip, which sensing layer is deposited on the gate metal of standard CMOS ISFET, the other is two chip type, which sensing layer is separated from CMOS ISFET and connected by bonding wire. These proposed packaging technologies would make it easy to fabricate CMOS ISFET pH sensor and to make variety types of pH sensor.

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Flexible wireless pressure sensor module

  • Shin Kyu-Ho;Moon Chang-Ryoul;Lee Tae-Hee;Lim Chang-Hyun;Kim Young-Jun
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2004년도 추계 기술심포지움 초록집
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    • pp.3-4
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    • 2004
  • A flexible Packaging scheme, which embedded chip packaging, has been developed using a thinned silicon chip. Mechanical characteristics of thinned silicon chips are examined by bending test and finite element analysis. Thinned silicon chips ($t<50{\mu}m$) are fabricated by chemical etching process to avoid possible surface damages on them. These technologies can be use for a real-time monitoring of blood pressure. Our research targets are implantable blood pressure sensor and its telemetric measurement. By winding round the coronary arteries, we can measure the blood pressure by capacitance variation of blood vessel.

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CNT-Ag 복합패드가 Cu/Au 범프의 플립칩 접속저항에 미치는 영향 (Effect of CNT-Ag Composite Pad on the Contact Resistance of Flip-Chip Joints Processed with Cu/Au Bumps)

  • 최정열;오태성
    • 마이크로전자및패키징학회지
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    • 제22권3호
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    • pp.39-44
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    • 2015
  • 이방성 전도접착제를 이용하여 Cu/Au 칩 범프를 Cu 기판 배선에 플립칩 실장한 접속부에 대해 CNT-Ag 복합패드가 접속저항에 미치는 영향을 연구하였다. CNT-Ag 복합패드가 내재된 플립칩 접속부가 CNT-Ag 복합패드가 없는 접속부에 비해 더 낮은 접속저항을 나타내었다. 각기 25 MPa, 50 MPa 및 100 MPa의 본딩압력에서 CNT-Ag 복합패드가 내재된 접속부는 $164m{\Omega}$, $141m{\Omega}$$132m{\Omega}$의 평균 접속저항을 나타내었으며, CNT-Ag 복합패드를 형성하지 않은 접속부는 $200m{\Omega}$, $150m{\Omega}$$140m{\Omega}$의 평균 접속저항을 나타내었다.

유한요소 해석을 이용한 팬아웃 웨이퍼 레벨 패키지 과정에서의 휨 현상 분석 (Warpage Analysis during Fan-Out Wafer Level Packaging Process using Finite Element Analysis)

  • 김금택;권대일
    • 마이크로전자및패키징학회지
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    • 제25권1호
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    • pp.41-45
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    • 2018
  • 기술의 발전과 전자기기의 소형화와 함께 반도체의 크기는 점점 작아지고 있다. 이와 동시에 반도체 성능의 고도화가 진행되면서 입출력 단자의 밀도는 높아져 패키징의 어려움이 발생하였다. 이러한 문제를 해결하기 위한 방법으로 산업계에서는 팬아웃 웨이퍼 레벨 패키지(FO-WLP)에 주목하고 있다. 또한 FO-WLP는 다른 패키지 방식과 비교해 얇은 두께, 강한 열 저항 등의 장점을 가지고 있다. 하지만 현재 FO-WLP는 생산하는데 몇 가지 어려움이 있는데, 그 중 한가지가 웨이퍼의 휨(Warpage) 현상의 제어이다. 이러한 휨 변형은 서로 다른 재료의 열팽창계수, 탄성계수 등에 의해 발생하고, 이는 칩과 인터커넥트 간의 정렬 불량 등을 야기해 대량생산에 있어 제품의 신뢰성 문제를 발생시킨다. 이러한 휨 현상을 방지하기 위해서는 패키지 재료의 물성과 칩 사이즈 등의 설계 변수의 영향에 대해 이해하는 것이 매우 중요하다. 이번 논문에서는 패키지의 PMC 과정에서 칩의 두께와 EMC의 두께가 휨 현상에 미치는 영향을 유한요소해석을 통해 알아보았다. 그 결과 특정 칩과 EMC가 특정 비율로 구성되어 있을 때 가장 큰 휨 현상이 발생하는 것을 확인하였다.

Self-Assembling Adhesive Bonding by Using Fusible Alloy Paste for Microelectronics Packaging

  • Yasuda, Kiyokazu
    • 마이크로전자및패키징학회지
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    • 제18권3호
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    • pp.53-57
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    • 2011
  • In the modern packaging technologies highly condensed metal interconnects are typically formed by highcost processes. These methods inevitably require the precise controls of mutually dependant process parameters, which usually cause the difficulty of the change in the layout design for interconnects of chip to-chip, or chip-to-substrate. In order to overcome these problems, the unique concept and methodology of self-assembly even in micro-meter scale were developed. In this report we focus on the factors which influenced the self-formed bumps by analyzing the phenomenon experimentally. In case of RMA flux, homogenous pattern was obtained in both plain surface and cross-section surface observation. By using RA flux, the phenomena were accelerated although the self-formtion results was inhomogenous. With ussage of moderate RA flux, reaction rate of the self-formation was accelerated with homogeneous pattern.

Multilayer thin Film technology as an Enabling technology for System-in-Package (SIP) and "Above-IC" Processing

  • Beyne, Eric
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2003년도 International Symposium
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    • pp.93-100
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    • 2003
  • The continuing scaling trend in microelectronic circuit technology has a significant impact on the different IC interconnection and packaging technologies. These latter technologies have not kept pace with the IC scaling trends, resulting in a so-called“interconnect technology gap”. Multilayer thin film technology is proposed as a“bridge”- technology between the very high density IC technology and the coarse standard PCB technology. It is also a key enabling technology for the realisation of true“System-in-a-Package”(SIP) solutions, combining multiple“System-on-a-Chip”(SOC) IC's with other components and also integrating passive components in its layers. A further step is to use this technology to realise new functionalities on top of active wafers. These additional“above-IC”processed layers may e.g. be used for low loss, high speed on chip interconnects, clock distribution circuits, efficient power/ground distribution and to realize high Q inductors on chip.

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Flip Chip Interconnection Method Applied to Small Camera Module

  • Segawa, Masao;Ono, Michiko;Karasawa, Jun;Hirohata, Kenji;Aoki, Makoto;Ohashi, Akihiro;Sasaki, Tomoaki;Kishimoto, Yasukazu
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2000년도 2nd Korea-Japan Advanceed Semiconductor Packaging Technology Seminar
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    • pp.39-45
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    • 2000
  • A small camera module fabricated by including bare chip bonding methods is utilized to realize advanced mobile devices. One of the driving forces is the TOG (Tape On Glass) bonding method which reduces the packaging size of the image sensor clip. The TOG module is a new thinner and smaller image sensor module, using flip chip interconnection method with the ACP (Anisotropic Conductive Paste). The TOG production process was established by determining the optimum bonding conditions for both optical glass bonding and image sensor clip bonding lo the flexible PCB. The bonding conditions, including sufficient bonding margins, were studied. Another bonding method is the flip chip bonding method for DSP (Digital Signal Processor) chip. A new AC\ulcorner was developed to enable the short resin curing time of 10 sec. The bonding mechanism of the resin curing method was evaluated using FEM analysis. By using these flip chip bonding techniques, small camera module was realized.

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High frequency measurement and characterization of ACF flip chip interconnects

  • 권운성;임명진;백경욱
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2001년도 추계 기술심포지움
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    • pp.146-150
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    • 2001
  • Microwave model and high-frequency measurement of the ACF flip-chip interconnection was investigated using a microwave network analysis. S-parameters of on-chip and substrate were separately measured in the frequency range of 200 MHz to 20 GHz using a microwave network analyzer HP8510 and cascade probe. And the cascade transmission matrix conversion was performed. The same measurements and conversion techniques were conducted on the assembled test chip and substrate at the same frequency range. Then impedance values in ACF flip-chip interconnection were extracted from cascade transmission matrix. ACF flip chip interconnection has only below 0.1nH, and very stable up to 13 GHz. Over the 13 GHz, there was significant loss because of epoxy capacitance of ACF. However, the addition of SiO$_2$filler to the ACF lowered the dielectric constant of the ACF materials resulting in an increase of resonance frequency up to 15 GHz. High frequency behavior of metal Au stud bumps was investigated. The resonance frequency of the metal stud bump interconnects is higher than that of ACF flip-chip interconnects and is not observed at the microwave frequency band. The extracted model parameters of adhesive flip chip interconnects were analyzed with the considerations of the characteristics of material and the design guideline of ACA flip chip for high frequency applications was provided.

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