• Title/Summary/Keyword: Ohmic

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The Effective Capacitance of a Constant Phase Element with Resistors in Series

  • Byoung-Yong, Chang
    • Journal of Electrochemical Science and Technology
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    • v.13 no.4
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    • pp.479-485
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    • 2022
  • The power of energy storage devices is characterized by capacitance and the internal resistance. The capacitance is measured on an assumption that the charges are stored at the electrode interface and the electric double layer behaves like an ideal capacitor. However, in most cases, the electric double layer is not ideal so a constant phase element (CPE) is used instead of a capacitor to describe the practical observations. Nevertheless, another problem with the use of the CPE is that CPE does not give capacitance directly. Fortunately, a few methods were suggested to evaluate the effective capacitance in the literature. However, those methods may not be suitable for supercapacitors which are modeled as an equivalent circuit of a CPE and resistor connected in series because the time constant of the equivalent circuit is not clearly studied. In this report, in order to study the time constant of the CPE and find its equivalent capacitor, AC and DC methods are utilized in a complementary manner. As a result, the time constants in the AC and DC domains are compared with digital simulation and a proper equation is presented to calculate the effective capacitance of a supercapacitor, which is extended to an electrochemical system where faradaic and ohmic processes are accompanied by imperfect charge accumulation process.

Resistive Switching Effects of Zinc Silicate for Nonvolatile Memory Applications

  • Im, Minho;Kim, Jisoo;Park, Kyoungwan;Sok, Junghyun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.35 no.4
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    • pp.348-352
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    • 2022
  • Resistive switching behaviors of a co-sputtered zinc silicate thin film (ZnO and SiO2 targets) have been investigated. We fabricated an Ag/ZnSiOx/highly doped n-type Si substrate device by using an RF magnetron sputter system. X-ray diffraction pattern (XRD) indicated that the Zn2SiO4 was formed by a post annealing process. A unique morphology was observed by scanning electron microscope (SEM) and atomic force microscope (AFM). As a result of annealing process, 50 nm sized nano clusters were formed spontaneously in 200~300 nm sized grains. The device showed a unipolar resistive switching process. The average value of the ratio of the resistance change between the high resistance state (HRS) and the low resistance state (LRS) was about 106 when the readout voltage (0.5 V) was achieved. Resistance ratio is not degraded during 50 switching cycles. The conduction mechanisms were explained by using Ohmic conduction for the LRS and Schottky emission for the HRS.

Characteristic analysis of components of a high temperature superconducting power supply using YBCO coated conductor (YBCO CC을 사용한 초전도전원장치의 요소특성 해석)

  • Yoon, Yong-Soo;Cho, Dae-Ho;Park, Dong-Kuen;Yang, Seong-Eun;Kim, Ho-Min;Chung, Yoon-Do;Bae, Duck-Kwon;Ko, Tae-Kuk
    • Progress in Superconductivity and Cryogenics
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    • v.11 no.3
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    • pp.40-45
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    • 2009
  • Many superconductor applications such as MRI and SMES must be operated in persistent current mode to eliminate the electrical ohmic loss. This paper presents the characteristic analysis of the high temperature superconducting (HTS) power supply made of YBCO coated conductor (CC). In this research, we have manufactured the HTS power supply to charge the 0.73 mH HTS double-pancake magnet made of YBCO CC. Among the all design parameters, the heater triggerring time and magnet applying time were the most important factors for the best performance of the HTS power supply. In this paper, three-dimensional simulation through finite element method (FEM) was used to study the heat transfer in YBCO CC and the magnetic field of the magnetic circuit. Based upon these results, the final operational sequence could be determined to generate the pumping current. In the experiment, the maximum pumping current reached about 16 A.

Asymmetric Metal-Semiconductor-Metal Al0.24Ga0.76N UV Sensors with Surface Passivation Effect Under Local Joule Heating

  • Byeong-Jun Park;Sung-Ho Hahm
    • Journal of Sensor Science and Technology
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    • v.32 no.6
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    • pp.425-431
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    • 2023
  • An asymmetric metal-semiconductor-metal Al0.24Ga0.76N ultraviolet (UV) sensor was fabricated, and the effects of local Joule heating were investigated. After dielectric breakdown, the current density under a reverse bias of 2.0 V was 1.1×10-9 A/cm2, significantly lower than 1.2×10-8 A/cm2 before dielectric breakdown; moreover, the Schottky behavior of the Ti/Al/Ni/Au electrode changed to ohmic behavior under forward bias. The UV-to-visible rejection ratio (UVRR) under a reverse bias of 7.0 V before dielectric breakdown was 87; however, this UVRR significantly increased to 578, in addition to providing highly reliable responsivity. Transmission electron microscopy revealed interdiffusion between adjacent layers, with nitrogen vacancies possibly formed owing to local Joule heating at the AlGaN/Ti/Al/Ni/Au interfaces. X-ray photoelectron microscopy results revealed decreases in the peak intensities of the O 1s binding energies associated with the Ga-O bond and OH-, which act as electron-trapping states on the AlGaN surface. The reduction in dark current owing to the proposed local heating method is expected to increase the sensing performance of UV optoelectronic integrated devices, such as active-pixel UV image sensors.

Behavior of Charged Particles do $(Sr_{0.85}{\cdot}Ca_{0.15})_mTiO_3$ Grain Boundary Layer Ceramics ($(Sr_{0.85}{\cdot}Ca_{0.15})_mTiO_3$ 입계층 세라믹의 하전입자 거동)

  • 김진사;정동효;김상남;박재세;최운식;이준용
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1995.11a
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    • pp.209-212
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    • 1995
  • In this paper, the $(Sr_{0.85}{\cdot}Ca_{0.15})TiO_3$ of paraelectric grain boundary layer (GBL) ceramics were fabricated. The characteristics of electrical conduction and the thermally stimulated current(TSC) were measured respectively. The region I below 200[V/cm] shows the ohmic conduction, the region II between 200[V/cm] and 1000[V/cm] can be explained by the Pool-Frenkel emission theory, and the region III above 2000[V/cm] is dominated by the tunneling effect. As a result, The origins of these peaks are that the ${\alpha}$ peak observed at $-20[^{\circ}C]$ looks like to be ascribed to the ionization excitation from donor level in the grain, and the ${\alpha}^{\prime}$ peak observed at $-20[^{\circ}C]$ appears to show up by detrap of the trapped carrier of border between the oxidation layer and the grain, and the ${\beta}$ peak observed at $80[^{\circ}C]$ seems to be resulted from hopping conduction of existing carrier in the trap site of the border between the oxidation and second phase.

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Effect of $Dy_2O_3$ Additive on the Nonohmic Characteristics of ZnO-$Pr_6O_{11}$-CoO-Based Ceramic Varistor (ZnO-$Pr_6O_{11}$-CoO계 세라믹 바리스터의 비옴성 특성에 $Dy_2O_3$ 첨가제의 영향)

  • Park, Choon-Hyun;Yoon, Han-Soo;Nahm, Choon-Woo
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1692-1695
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    • 1999
  • The nonohmic characteristics of ZnO-$Pr_6O_{11}$-CoO-based ceramic varistor doped with $Dy_2O_3$ in the range $0.0\sim2.0mol%$ sintered at $1300^{\circ}C$ and $1350^{\circ}C$ were investigated. 98.5 ZnO-$0.5Pr_6O_{11}$-1.0CoO varistor sintered at $130^{\circ}C$ exhibited higher nonlinear coefficient of 36 than the established Pr-based varistor. The four-component-system varistor such as 96.5 ZnO-$0.5Pr_6O_{11}$-1.0CoO-$2.0Dy_2O_3$ exhibited very highly nonohmic characteristics, which has nonlinear coefficient of 53.9. 98.5ZnO-$0.5Pr_6O_{11}$-1.0CoO varistor sintered at $1350^{\circ}C$, in contrast with that of $1300^{\circ}C$, exhibited approximately ohmic characteristics but nonlinear coefficient of varistor doped with 0.5mol% $Dy_2O_3$ showed higher nonlinear coefficient of probably 35. Consequently, it can be confirmed that $Dy_2O_3$ acted as additive of improvement on nonlinear coefficient. It is estimated that $Dy_2O_3$ will be used as additive of improvement on nonlinear coefficient to develop a goof ZnO varistor.

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AlGaAs/InGaAs/GaAs PHEMT power PHEMT with a 0.2 ${\mu}{\textrm}{m}$ gate length for MIMIC power amplifier. (MIMIC 전력증폭기에 응용 가능한 0.2 ${\mu}{\textrm}{m}$ 이하의 게이트 길이를 갖는 전력용 AlGaAs/InGaAs/GaAs PHEMT)

  • 이응호
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.27 no.4B
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    • pp.365-371
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    • 2002
  • In this paper, the fabricated power PHEMT devices for millimeter-wave that is below a gate-length of 0.2 $\mu\textrm{m}$ using electronic beam lithography technologies, and the DC and frequency characteristics and an output power characteristics were Measured at the various bias conditions. The unit process that is used in PHEMT's manufacture used that low-resistance ohmic contact, air-bridge and back-side lapping process technologies, and so on. The fabricated power PHEMT have an S521 gain of 4 dB and a maximum transconductance(gm) of 317 mS/mm, an unilateral current gain(fT) of 62 GHz, a maximum oscillation frequency(fmax) of 120 GHz at 35 GHz, and a maximum power output(Pmax) of 16 dBm, a power gain(GP) of 4 dB and a drain efficiency(DE) of 35.5 %.

Characterizing the Thermal Stability of TiSi2 Film by Using the Statistical Experimental Method (통계적 실험 방법을 이용한 티타늄실리사이드의 열적안정성 연구)

  • Cheong, Seong-Hwee;Song, Oh-Sung
    • Korean Journal of Materials Research
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    • v.13 no.3
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    • pp.200-204
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    • 2003
  • A statistical experiment method was employed to investigate the window of the thermal stability of $TiSi_2$films which are popular for Ti-salicide and ohmic layers. The statistical experimental results showed that the first order term of $TiSi_2$thickness and annealing temperature was acceptable as a function of $\Delta$resistivity by 95% reliability criteria, and R-sq value implying a fit accuracy of the model also showed a high value of 93.80%. We found that $\Delta$resistivity of the $TiSi_2$film annealed at $700^{\circ}C$ for 1 hr changed from 3.35 to $0.379\mu$$\Omega$$\cdot$cm with increasing thickness from 185 to $703\AA$, and TEX>$\Delta$resistivity of the $TiSi_2$film with a fixed thickness of 444 $\AA$ changed from 0.074 to 17.12 $\mu$$\Omega$$\cdot$cm with increasing temperature increase from 600 to $800^{\circ}C$. From these results, we report that the process conditions of$ 692^{\circ}C$-1 hr, $715^{\circ}C$-1 hr, and 73$0^{\circ}C$-1 hr for $TiSi_2$($400 \AA$) are stable by the criteria of 1, 2, and 3 $\mu$$\Omega$$\cdot$cm of $\Delta$resistivity, respectively.

Microstructure and Characterization of Ni-C Films Fabricated by Dual-Source Deposition System

  • Han, Chang-Suk;Kim, Sang-Wook
    • Korean Journal of Materials Research
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    • v.26 no.6
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    • pp.293-297
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    • 2016
  • Ni-C composite films were prepared by co-deposition using a combined technique of plasma CVD and ion beam sputtering deposition. Depending on the deposition conditions, Ni-C thin films manifested three kinds of microstructure: (1) nanocrystallites of non-equilibrium carbide of nickel, (2) amorphous Ni-C film, and (3) granular Ni-C film. The electrical resistivity was also found to vary from about $10^2{\mu}{\Omega}cm$ for the carbide films to about $10^4{\mu}{\Omega}cm$ for the amorphous Ni-C films. The Ni-C films deposited at ambient temperatures showed very low TCR values compared with that of metallic nickel film, and all the films showed ohmic characterization, even those in the amorphous state with very high resistivity. The TCR value decreased slightly with increasing of the flow rate of $CH_4$. For the films deposited at $200^{\circ}C$, TCR decreased with increasing $CH_4$ flow rate; especially, it changed sign from positive to negative at a $CH_4$ flow rate of 0.35 sccm. By increasing the $CH_4$ flow rate, the amorphous component in the film increased; thus, the portion of $Ni_3C$ grains separated from each other became larger, and the contribution to electrical conductivity due to thermally activated tunneling became dominant. This also accounts for the sign change of TCR when the filme was deposited at higher flow rate of $CH_4$. The microstructures of the Ni-C films deposited in these ways range from amorphous Ni-C alloy to granular structures with $Ni_3C$ nanocrystallites. These films are characterized by high resistivity and low TCR values; the electrical properties can be adjusted over a wide range by controlling the microstructures and compositions of the films.

The Effects of Composition on the Interface Resistance in Bi-System Glass Frit (Bi 계열 Glass Frit 조성이 계면저항에 미치는 영향)

  • Kim, In Ae;Shin, Hyo Soon;Yeo, Dong Hun;Jeong, Dae Yong
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.26 no.12
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    • pp.858-862
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    • 2013
  • The front electrode should be used to make solar cell panel so as to collect electron. The front electrode is used by paste type, printed on the Si-solar cell wafer and sintered at about $800^{\circ}C$. The paste is composed Ag powder and glass frit which make the ohmic contact between Ag electrode and n-type semiconductor layer. From the previous study, the Ag electrodes which used two commercial glass frit of Bi-system were so different on the interface resistance. The main composition of them was Bi-Zn-B-Si-O and few additives added in one of them. In this study, glass frit was made with the ratio of $Bi_2O_3$ and ZnO on the main composition, and then paste using glass frit was prepared respectively. And, also, the paste using the glass frit added oxide additives were prepared. The change of interface resistance was not large with the ratio of $Bi_2O_3$ and ZnO. In the case of G6 glass frit, 78 wt% $Bi_2O_3$ addition, the interface resistance was $190{\Omega}$ and most low. In the glass frit added oxide, the case of Ca increased over 10 times than it of G6 glass frit on the interface resistance. It was thaught that after sintering, Ca added glass frit was not flowed to the interface between Ag electrode and wafer but was in the Ag electrode.