Electrical Properties of $V_{1.9}W_{0.1}O_5$ Thin Films with Annealing Temperature
(열처리 온도에 따른 $V_{1.9}W_{0.1}O_5$ 박막의 유전특성)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2008.11a
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- pp.239-240
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- 2008