• Title/Summary/Keyword: Normal Probe

검색결과 203건 처리시간 0.027초

3차원 음장 분석법을 이용한 진단용 초음파 프로브의 정량적 성능평가 (Quantitative evaluating method for diagnostic ultrasound probe using 3-dimensional acoustic field analysis)

  • 노시철;김주영;박재현;김진수;강정훈;최흥호
    • 센서학회지
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    • 제19권6호
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    • pp.490-496
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    • 2010
  • In this study, in order to overcome the weakness of acoustic field analysis which is generally used for ultrasonic probe performance evaluation, automatic acoustic field measurement system and evaluation parameters were proposed. The comparisons between acoustic field simulation and measured acoustic distribution data of normal and abnormal channels were conducted to evaluate the availability of proposed system and evaluation parameters. First, the impulse response characteristic of sample probe was investigated to classify the normal elements and abnormal elements. And then, normal channels and abnormal channels with abnormal element were chosen. The suggested 12 evaluation parameters were calculated using the acoustic fields of these channels. The availability of proposed automatic acoustic field measurement system and evaluation parameters was confirmed. And the performance evaluation of ultrasonic probe using acoustic field analysis could be easier and faster.

탐침형 정보저장 기술을 위한 실리콘 탐침의 나노 마멸 특성에 관한 연구 (Nano-wear Characteristics of Silicon Probe Tip for Probe Based Data Storage Technology)

  • 이용하;정구현;김대은;유진규;홍승범
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2004년도 추계학술대회 논문집
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    • pp.552-555
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    • 2004
  • The reliability issue of the probe tip/recording media interface is one of the most crucial concerns in the Atomic Force Microscope (AFM)-based recording technology. In this work, the tribological characteristics of the probe/media interface were investigated by performing wear tests using an AFM. The ranges of applied normal load and sliding velocity for the wear test were 10 to 50nN and 2 to 20$\mu$m/s respectively. The damage of the probe tip was quantitatively as well as qualitatively characterized by Field Emission Scanning Probe Microscope (FESEM) analysis and calculated based on Archard s wear equation. It was shown that the wear coefficient of the probe tip was in the order of 10$^{-4}$ ~ 10$^{-3}$ , and significant contamination at the end of the probe tip was observed. Thus in order to implement the AFM-based recording technology, tribological optimization of the probe/media interface must be achieved.

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Modelling and Measurements of Normal and Lateral Stiffness for Atomic Force Microscopy

  • Choi, Jinnil
    • Applied Science and Convergence Technology
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    • 제23권5호
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    • pp.240-247
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    • 2014
  • Modelling and measurements of normal and lateral stiffness for atomic force microscopy (AFM) are presented in this work. Important issues, such as element discretisation, stiffness calibration, and deflection angle are explored using the finite element (FE) model. Elements with various dimension ratios are investigated and comparisons with several mathematical models are reported to verify the accuracy of the model. Investigation of the deflection angle of a cantilever is also shown. Moreover, AFM force measurement experiments with conical and colloid probe tips are demonstrated. The relationships between force and displacement, required for stiffness measurement, in normal and lateral directions are acquired for the conical tip and the limitations of the colloid probe tip are highlighted.

An Extended Numerical Calibration Method for an Electrochemical Probe in Thin Wavy Flow with Large Amplitude Waves

  • Park, Ki-Yong;No, Hee-Cheon
    • 한국원자력학회:학술대회논문집
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    • 한국원자력학회 1998년도 춘계학술발표회논문집(1)
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    • pp.553-558
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    • 1998
  • The calibrating method for an electrochemical Probe, neglecting the effect of the normal velocity on the mass transport, can cause large errors when applied to the measurement of wall shear rates in thin wavy flow with large amplitude waves. An extended calibrating method is developed to consider the contributions of the normal velocity. The inclusion of the turbulence-induced normal velocity term is found to have a negligible effect on the mass transfer coefficient. The contribution wave-induced normal velocity can be classified on the dimensionless parameter V. If V above a critical value of V, $V_{crit}$, the effects of the wave-induced normal velocity become larger with an increase in V. IF V its effects negligible for V < $V_{crit}$. The unknown shear rate is numerically determined by solving the 2-D mass transport equation inversely. The president inverse method can predict the unknown shear rate more accurately in thin wavy flow with large amplitude waves than the previous method.

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2D-ICP(inductively coupled plasma)에서 정전 탐침 삽입 시의 플라즈마 수치 계산 (Numerical Modeling of Perturbation Effects of Electrostatic Probe into 2D ICP(inductively coupled plasma))

  • 주정훈
    • 한국표면공학회지
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    • 제44권1호
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    • pp.26-31
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    • 2011
  • Numerical modeling is used to investigate the perturbation of a single Langmuir probe (0.2 mm diameter shielded with 6 mm insulator) inserted along the center axis of a cylindrical inductively coupled plasma chamber filled with Ar at 10 mTorr and driven by 13 MHz. The probe was driven by a sine wave. When the probe tip is close to a substrate by 24.5 mm, the probe characteristics was unperturbed. At 10 mm above the substrate, the time averaged electric potential distribution around the tip was severly distorted making a normal probe analysis impossible.

2축 힘센서를 이용한 스크레치 테스트 개발 (Development of a scratch tester using a two-component force sensor)

  • 김종호;박연규;이호영;박강식;오희근
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2003년도 춘계학술대회 논문집
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    • pp.1018-1021
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    • 2003
  • A scratch tester was developed to evaluate the adhesive strength at interface between thin film and substrate(silicon wafer). Under force control, the scratch tester can measure the normal and the horizontal forces simultaneously as the probe tip of the equipment approaches to the interface between thin film and substrate of wafer. The capacity of each component of force sensor is 0.1 N ∼ 100 N. In addition, the tester can detect the signal of elastic wave from AE sensor(frequency range of 900 kHz) attached to the probe tip and evaluate the bonding strength of interface. Using the developed scratch tester. the feasibility test was performed to evaluate the adhesive strength of semiconductor wafer.

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터너증후군 의심환자에서 2개의 SRY 유전자 발현 1예 (A Case of Two SRY Genes in a Tuner's Syndrome Feature)

  • 박상묵;김윤식
    • 대한임상검사과학회지
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    • 제42권3호
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    • pp.111-115
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    • 2010
  • A 15-year-old female with primary amenorrhea and Tuner's syndrome feature was referred for a chromosome analysis. The karyotype of the patient was 45,X/46,X,der(Y) mosaicism under initial GTG-banding analysis. Fluorescence in situ hybridization (FISH) analysis with probe for CEP X probes and SRY probe (Vysis, Inc. Downers Grove, IL 60515, USA) was carried out. This probe is direct labeled with SpectrumOrange (SRY, Yp11.3) and is available as a single probe or mixed with the CEP X SpectrumGreen probe. SRY SpectrumOrange/CEP X SpectrumGreen hybridized to a specimen obtained from an two isodicentric Y chromosomes. The karyotype of the patient was ish Xcen(DXZ1x1)/Xcen(DXZ1x1), Yp11.3(SRYx2) by using FISH. This karyotype was considered a variant of Tuner syndrome with mixed gonadal dysgenesis (MGD), male pseudohermaphroitism (MPH) and apparently normal male.

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초음파회절방법(超音波回折方法)을 이용한 귀렬(龜裂)의 높이 측정(測定) (Measurement of the Crack Height using the Two-Probe Ultrasonic Diffraction Method.)

  • 이재옥;이승규;김영길
    • 비파괴검사학회지
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    • 제7권2호
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    • pp.35-41
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    • 1988
  • The optimum test conditions of measuring the crack height were determined for the two-probe ultrasonic diffraction method. The applicability and the accuracy of the two-probe ultrasonic diffraction method on the inclined artificial cracks and the fatigue cracks were evaluated. It us possible to measure the height of the normal and inclined artificial cracks with the maximum error of ${\pm}\;0.5mm$ with the two-probe ultrasonic diffraction method. It was found, however, that the accuracy of this method in meaasuring the height of the fatigue crack depends on the degree of closure of the crack tip. It was desirable to choose a refraction angle as small as possible, but the angle should not be so small that the distortion of the lateral waveform became appreciable.

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ECR Reactor 내의 Langmuir Probe 시뮬레이션 (Simulation of a Langmuir Probe in an ECR Reactor)

  • 김훈
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1994년도 하계학술대회 논문집 C
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    • pp.1609-1611
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    • 1994
  • In ECR and helicon reactors for plasma processing, a high density plasma is generated in a source region which is connected to a diffusion region where the processing takes place. Large density and potential gradients can develop at the orifice of the source which drive ion currents into the diffusion region. The average ion velocity may become the order of the sound velocity. Measurements of the ion saturation current to a Langmuir probe are used as a standard method of determining the plasma density in laboratory discharges. However, the analysis becomes difficult in a steaming plasma. We have used the HAMLET plasma simulator to simulate the ion flow to a large langmuir probe in an ECR plasma. The collection surface was aligned with the Held upstream, normal to the field, and downstream. ion trajectories through the electric and magnetic fields were calculated including ion-neutral collisions. We examines the ratio of ion current density to plasma density as a function of magnetic field and pressure.

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