• Korean Journal of Materials Research
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• v.1 no.4
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• pp.214-220
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• 1991

The effects of $SiO_2$ reactive ion etching (RIE) in $CHF_{3/}C_2F_6$ on the surface properties of the underlying Si substrate were studied by X-ray photoelectron spectroscopy(XPS) and secondary ion mass spectrometry(SIMS) techniques. Angle-resolved XPS analysis was carried out as non-destructive depth profile one for investigating the chemical bonding states of silicion, carbon, oxygen and fluorine. The residue layer consists of C-F polymer. O-F bond was found on the top of the polymer layer and Si-O, Si-C and Si-F bonds were detected between Si substrate and polymer film. A 60nm thick damaged layer of silicon surface mainly contains carbon and fluorine.

• Journal of Magnetics
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• v.8 no.4
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• pp.153-156
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• 2003

The values of crystalline-electric-field parameters $A_{nm}$ for $RFe_{11}$Ti $H_{x}$ (R=Tb,Ho) (x=0,l) are obtained by fitting calculations to the magnetization curves along the crystal axes at 4.2 K and higher temperatures. The insertion of H element in RFe$_{11}$Ti significantly affects CEF parameters $A_{nm}$ . By using exchange field 2${\mu}$$_{B}$ $H_{ex}$ derived by inelastic neutron scattering and fitted $A_{nm}$ , the calculations reproduce the experimental curves well.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.15 no.2
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• pp.1211-1215
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• 2014

We developed a new $Rb_2LiCeCl_6$ scintillator and determined the scintillation and thermoluminescence properties of the scintillator. The emission spectrum of $Rb_2LiCeCl$ is located in the range of 350 ~ 410 nm, peaking at 368 nm and 378 nm, due to the 4f ${\rightarrow}$ 5d transition of $Ce^{3+}$ ions. The fluorescence decay time of the crystal is composed two components. The fast component is 71 ns (85%) and the slow component is 405 ns (15%) of the crystal. The after-glow is caused by the electron and hole traps in the crystal lattice. We determined physical parameters of the traps in the crystal. The determined activation energy(E), kinetic order(m) and frequency factor(s) of the trap are 0.75 eV, 1.48 and $3.0{\times}10^8s^{-1}$, respectively.

• Journal of Sensor Science and Technology
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• v.14 no.2
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• pp.63-68
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• 2005

The nano-grained Pd or Pt-doped $SnO_{2}$ thin films were deposited on the alumina substrate at ambient temperature or $300^{\circ}C$ by using an R.F. magnetron sputtering system and then annealed at $650^{\cir}C$ for 1 hour or 4 hours in air. The crystallinity and microstructure of the annealed films were analyzed. A grain size of the thin films was 30 nm to 50 nm. As a result of gas sensitivity measurements to an alcohol vapor of $36^{\circ}C$, the 2 wt.% Pt-doped $SnO_{2}$ thin-film sensor deposited at $300^{\circ}C$ and annealed at $650^{\circ}C$ for 4 hours showed the highest sensitivity.

• Mass Spectrometry Letters
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• v.12 no.2
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• pp.47-52
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• 2021

Evaluating the impurity concentrations in semiconductor thin films using time of flight secondary ion mass spectrometry (ToF-SIMS) is an effective technique. The mass interference between isotopes and matrix element in data interpretation makes the process complex. In this study, we have investigated the doping concentration of phosphorus in, phosphorus doped silicon thin film on glass using ToF-SIMS in the dynamic mode of operation. To overcome the mass interference between phosphorus and silicon isotopes, the quantitative analysis of counts to concentration conversion was done following two routes, standard relative sensitivity factor (RSF) and SIMetric software estimation. Phosphorus doped silicon thin film of 180 nm was grown on glass substrate using hot wire chemical vapor deposition technique for possible applications in optoelectronic devices. Using ToF-SIMS, the phosphorus-31 isotopes were detected in the range of 10¹~10⁴ counts. The silicon isotopes matrix element was measured from p-type silicon wafer from a separate measurement to avoid mass interference. For the both procedures, the phosphorus concentration versus depth profiles were plotted which agree with a percent difference of about 3% at 100 nm depth. The concentration of phosphorus in silicon was determined in the range of 10¹⁹~10²¹ atoms/cm³. The technique will be useful for estimating distributions of various dopants in the silicon thin film grown on glass using ToF-SIMS overcoming the mass interference between isotopes.

• Journal of the Korean Vacuum Society
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• v.4 no.2
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• pp.119-123
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• 1995

Bridgman 방법으로 성장한 InSe: Co 단결정의 근적외 영역에서의 광흡수 특성을 상온에서 조사하였다. 1350, 1530, 1710nm 파장영역에서 Td 대칭을 갖는 Co2+ 이온의 4A2(4F)$\longrightarrow$4T1(4F)전이에 대응되는 3개의 흡수 peak를 관측하였다. 이 미세구조는 스핀-궤도 결합효과에 의하여 분리된 Co2+ 이온의 4T1(4F) 준위의 $\Gamma$6, $\Gamma$8, $\Gamma$7+$\Gamma$8 준위와 바닥상태 4A2(4F)의 $\Gamma$8 준위 사이의 전자전이에 기인하며, 결정장이론에 의하여 잘 설명되었다.

• Journal of the Korean Vacuum Society
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• v.13 no.1
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• pp.34-38
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• 2004

Hot embossing master is indispensable for the fabrication of polymeric optical waveguides using hot embossing technology. Sidewall roughness of silicon master is directly related to optical loss of optical waveguides In this paper, a silicon master was fabricated by using a deep-RIE process. Additionally, thermal oxidation followed by oxide removal was carried out to minimize etched Si sidewall roughness. Thermal oxidation and oxide removal were performed with $H_2O_2$ atmosphere at $1050^{\circ}C$ and $NH_4$F:HF=6:l BOE, respectively, for the oxide thickness of 400$\AA$, 1000$\AA$, 3000$\AA$, 4500$\AA$, 5600$\AA$ and 6200$\AA$. The sidewall roughness was characterized by SEM and SPM-AFH measurements. We found that the roughness was improved from 12nm (RMS) to 6nm (RMS) for the scalloped sidewall and from 162nm (RMS) to 39nm (RMS) for the vertical striation sidewall, respectively.

• Journal of the Korean Vacuum Society
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• v.9 no.1
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• pp.76-80
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• 2000

CF & $CF_2$ radicals in a $C_4F_8$ inductively coupled plasma were observed with laser induced fluorescence. 251.9nm UV laser was used for the $CF_2$ excitation and 265.3nm UV emitted light for the detection which has the maximum intensity among many induced fluorescence lights. In the case of CF radical detection, 232.9nm UV laser was used for the excitation and 247.6nm for the detection. $CF_2$ radical density increased toward substrate, while CF radical had its maximum at about 10nm away from the substrate. The atomic fluorine density which was studied by the actinometry increased as the position moves away from the substrate. This phenomena was thought to have a close relation with the polymer growth on the wafer. When the bias voltage increased, $CF_2$ , CF radicals decreased while the atomic fluorine increased tio some extent and then decreased, which was thought to be due to the change in the ionization and dissociation.

• Proceedings of the Korean Vacuum Society Conference
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• 1999.07a
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• pp.233-233
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• 1999

본 연구에서는 2성분계 gas(Ne+Xe)를 사용하여 기체압력(p), 진동수(f)에 따라 VUV(Vacuum Ultra Violet) spectrum 147, 173nm 파장과 IR(Infrared) spectrum 823nm, 828nm을 Vacuum Monochromator(Acton-VM 507)를 통해 측정하였다. 휘도(Luminance)와 전력(Power)측면에서 Ne+ Xe 최적의 가스 조성비를 찾기 위해서 Xe의 혼합비에 따른 IR영역인 823nm, 828nm을 측정결과, Xe 4%일 때 좋은 효율을 나타냈다. 기체압력이 200Torr에서는 Xe(3P1)에 기인하는 147nm가 주요한 파장이며, 기체압력이 400Torr, 600Torr일때는 Xe(3P2)에 기인하는 173nm 파장이 주요함을 알 수 있었다. 또한 공간 방전 이미지를 전압 pulse 인가후 ICCD Camera(V-Tek)의 Ready time, On Time을 조절하면서 50ns delay로 관측하였다. 향후 실험계획은 실제 상용화되고 있는 혼합가스 He+Ne+Xe의 조성비에 따른 자세한 실험을 할 것이다.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.24 no.4
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• pp.66-72
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• 2010

In this paper, AZO thin film was deposited on polyethylene terephthalate(PET) substrate by r. f. magnetron sputtering method from a ZnO target mixed with 2[wt%] Al2O3. The flexible film-typed dye sensitized solar cell(F-DSC) was fabricated and photo-electric conversion efficiency was investigated. The results showed that the minimum resistivity and the maximum deposition rate of AZO conducting film were recorded as $1.8{\times}10^{-3}[{\Omega}{\cdot}cm]$ and 25.5[nm/min], respectively at r.f. power of 220[W]. From the analysis of XPS data an improvement of electrical resistivity or an increase in carrier concentration with increasing sputtering power may be related to the generation of lattice imperfections as a result of increasing component ratio of O1s/Zn2p, which generates donor carriers or active growth of crystalline grain. The photo-electric conversion efficiency of F-DSC with AZO conducting electrode was over 2.79[%], which was comparable as that with commercially available ITO electrode.