• 제목/요약/키워드: N deposition

검색결과 2,148건 처리시간 0.037초

저압 유기 금속 화학 증착법으로 성장시킨 GaN박막의 캐소드루미네슨스에 대한 연구 (Catchodoluminescence Study of GaN Films Grown by Low-Pressure Metalorganic Chemical Vapor Deposition)

  • 홍창희
    • 전자공학회논문지D
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    • 제36D권5호
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    • pp.63-68
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    • 1999
  • 본 논문에서는 저압 유기 금속 화학증착법으로 성장시킨 GaN박막들을 실온 케소드루미네슨스 방법으로 광학적 특성을 측정하여 결정성장 메커니즘과 광학적 특성과의 관계를 규명하였다. 관측된 스펙트럼은 주로 364nm의 강한 band-edge emission 피크와 550nm의 깊은 준위 피크이었다. 빔 전류의 증가에 따라 364nm 스펙트럼의 세기가 깊은 준위 발광 스펙트럼보다 크게 증가시켰다. 이는 성장 초기 GaN박막의 결정 결함이 깊은 준위 발광 스펙트럼과 깊은 관계가 있음을 나타내 주고 있다. 또한 미세 결정 구조와 깊은 준위 발광 스펙프럼과의 관계 분석을 위해 주사형 전자현미경 사진과 캐소드루미네슨스 스펙트럼을 비교 검토하였다.

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Temperature Dependence of Excitonic Transitions in GaN Grown by MOCVD

  • Guangde Chen;Jingyu Lin;Hongxing Jiang;Kim, Jung-Hwan;Park, Sung-Eul
    • Journal of Photoscience
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    • 제7권1호
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    • pp.27-30
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    • 2000
  • The Photoluminescence (PL) measurement results of a very good quality GaN sample grown by metalorganic chemical vapor deposition (MOCVD) are reported. The temperature dependences of peak position, emission intensity, and the full width at half maximum (FWHM) of free-exciton (FX) A and B are presented. Our results show the fast thermal quenching of FX transition intensities and predominantly acoustic phonon scattering of emission line broadening. The transition-energy-shift following the Varshni's empirical equation, and by using it to fit the data, E$\_$A1/(T) = 3.4861 eV -6.046 $\times$ 10$\^$-4/T$^2$ (620.3+ T) eV, E$\_$B1/(T) = 3.4928 eV -4.777 $\times$ 10$\^$-4/T$^2$ / (408.2+ T) eV and E$\_$A2/ = 3.4991 eV -4.426 $\times$ 10$\^$-4/ T$^2$ / (430.6+ T) eV for A(n=1), B(n=1), and A(n=2) are obtained respectively.

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Deposition of (Ti, Cr, Zr)N-$MoS_{2}$ Thin Films by D.C. Magnetron Sputtering

  • Kim, Sun-Kyu;Vinh, Pham-Van
    • 한국표면공학회지
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    • 제39권6호
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    • pp.263-267
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    • 2006
  • As technology advances, there is a demand for development of hard solid lubricant coating. (Ti, Cr, Zr)N-$MoS_2$ films were deposited on AISI H13 tool steel substrate by co-deposition of $MoS_2$ with (Ti, Cr, Zr)N using a D.C. magnetron sputtering process. The influence of the $N_2Ar$ gas ratio, the amount of $MoS_2$ in the films and the bias voltage on the mechanical and structural properties of the films were investigated. The highest hardness level was observed at the $N_2/Ar$ gas ratio of 0.3. Hardness of the films did not change much with the increase of the $MoS_2$ content in the films. As the substrate bias potential was increased, hardness level of the film reached maximum at -150 V. Surface morphology of these films indicated that high hardness was attributed to the fine dome structure.

Magnetic hardening of nano-thick $Sm_2$$Fe_{17}$$N_x$ films grown by a pulsed laser deposition

  • Yang, Choong-Jin;Kim, Sang-Won;Jianmin Wu
    • 한국자기학회:학술대회 개요집
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    • 한국자기학회 2000년도 International Symposium on Magnetics The 2000 Fall Conference
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    • pp.251-265
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    • 2000
  • S $m_{2}$F $e_{17}$ $N_{x}$ film magnets using a S $m_{2}$F $e_{17}$ target were prepared at $N_{2}$ gas atmosphere using a Nd-YAG laser ablation technique. The effect of nitrogen pressure, deposition temperature, pulsation time and film thickness on the structure and magnetic properties of S $m_{2}$F $e_{17}$ $N_{x}$ film were studied. Increasing the nitrogen pressure up to 5 atm. was confirmed to lead the formation of complete S $m_{2}$F $e_{17}$ $N_{x}$ compound. Optimized magnetic properties with the nitrogenation temperature ranging over 500-53$0^{\circ}C$ could be obtained by extending the nitrogenation time up to 4 hours. Relatively low coercivities of 400~600 Oe were exhibited from the S $m_{2}$F $e_{17}$ $N_{x}$ films having the thickness of 50~100 nm while 4$\pi$ $M_{s}$ of 10~12 kG could be achieved. In-plane anisotropic characteristic, which was the basic goal in this study, was achieved by controlling the nitrogenation parameters.ameters.ers.ameters.

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III-V 광소자 제작을 위한 ITO/n+lnP 옴 접촉 특성연구 (Formation of ITO Ohmic Contact to ITO/n+lnP for III-V Optoelectronic Devices)

  • 황용한;한교용
    • 한국전기전자재료학회논문지
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    • 제15권5호
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    • pp.449-454
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    • 2002
  • The use of a thin film of indium between the ITO and the $n^+-lnP$ contact layers for InP/InGaAs HPTs was studied without degrading its excellent optical transmittance properties. $ITO/n^+-lnP$ ohmic contact was successfully achieved by the deposition of indium and annealing. The specific contact resistance of about $6.6{\times}10^{-4}\Omega\textrm{cm}^2$ was measured by use of the transmission line method (TLM). However, as the thermal annealing was just performed to $ITO/n^+-lnP$ contact without the deposition of indium between ITO and $n^+-lnP$, it exhibited Schottky characteristics. In the applications, the DC characteristics of InP/InGaAs HPTs with ITO emitter contacts was compared with those of InP/InGaAs HBTs with the opaque emitter contacts.

Cu와 Si 사이에서 확산방지막으로 사용하기 위한 ZrN 층의 연구 (A study on ZrN layer as a diffusion barrier between Cu and Si)

  • 김창조;김좌연;윤의중;이재갑
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1998년도 추계학술대회 논문집
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    • pp.21-24
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    • 1998
  • The properties of ZrN layer deposited by Sputtering system have been investigated in the application of diffusion barrier layer to copper. ZrN layer exhibited a excellent barrier property up to $700^{\circ}$ and higher resistivity. If an excess $O_2$is protected during the process of ZrN deposition, ZrN layer will be possible to use a diffusion barrier layer to copper.

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산소발생용 Cobalt-phosphate (Co-pi) 촉매를 이용한 Gallium Nitride (GaN) 광전극의 광전기화학적 특성 (Photoelectrochemical Properties of Gallium Nitride (GaN) Photoelectrode Using Cobalt-phosphate (Co-pi) as Oxygen Evolution Catalyst)

  • 성채원;배효정;;하준석
    • 마이크로전자및패키징학회지
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    • 제27권2호
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    • pp.33-38
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    • 2020
  • 광전기화학적 물분해에서 광전극으로 이용되는 GaN은 전해질에 대해 높은 안정성을 가지고 있으며 물의 산화 환원준위를 포함하고 있어 외부전압 없이 물분해가 가능하다. 그러나 GaN 광전극의 경우, 재료 자체의 효율이 낮아 상용화하기에는 부족한 실정이다. 본 연구에서는 광효율을 향상시키기 위해 Cobalt phosphate(Co-pi) 촉매를 광전기증착(Photoelectro-deposition)방법을 통하여 GaN 광전극에 도입하였다. Co-pi 촉매 증착 후 SEM, EDS, XPS분석을 진행하여 Co-pi의 증착 여부 및 증착 정도를 확인하고, Potentiostat를 이용해 PEC 특성을 분석하였다. SEM 이미지를 통해 Co-pi가 GaN 표면 위에 20~25 nm 사이즈의 클러스터 형태로 고르게 증착되어 있는 것을 확인하였다. EDS 및 XPS 분석을 통해 GaN 표면의 입자가 Co-pi임을 확인하였다. 이 후 측정된 PEC 특성에서 Co-pi를 증착 시킨 후 0.5 mA/㎠에서 0.75 mA/㎠로 향상된 광전류밀도 값을 얻을 수 있었다. 향상된 원인을 밝히기 위하여, 임피던스 및 Mott-Schottky 측정을 진행하였고, 측정 결과, 50.35 Ω에서 34.16 Ω으로 감소한 분극저항(Rp)과 증가된 donor 농도(ND) 값을 확인하였다. 물분해 전 후, 표면 성분을 분석한 결과 물분해 후에도 Co-pi가 남아있음으로써 Co-pi 촉매가 안정적이라는 것을 확인하였다. 이를 통해, Co-pi가 GaN의 효율 향상을 위한 촉매로서 효과가 있음을 확인하였고, 다른 광전극에 촉매로써 적용시켰을 경우, PEC 시스템의 효율을 향상시킬 수 있을 것으로 판단된다.

Amorphous Silicon Carbon Nitride Films Grown by the Pulsed Laser Deposition of a SiC-$Si_3N_4$ Mixed Target

  • Park, Nae-Man;Kim, Sang-Hyeob;Sung, Gun-Yong
    • ETRI Journal
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    • 제26권3호
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    • pp.257-261
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    • 2004
  • We grew amorphous SiCN films by pulsed laser deposition using mixed targets. The targets were fabricated by compacting a mixture of SiC and $SiC-{Si_3}{N_4}$ powders. We controlled the film stoichiometry by varying the mixing ratio of the target and the target-to-substrate distance. The mixing ratio of the target had a dominant effect on the film composition. We consider the structures of the SiCN films deposited using 30~70 wt.% SiC in the target to be an intermediate phase of SiC and $SiN_x$. This provides the possibility of growing homogeneous SiCN films with a mixed target at a moderate target-to-substrate distance.

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n-Butane 내부개질시 Ni-YSZ와 Cu-Ceria-YSZ에 대한 탄소침적에 관한 연구 (Research of carbon formation on Ni-YSZ and Cu-Ceria-YSZ to internal reforming using n-Butane)

  • 배규종;배중면;박광진;김용민
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2008년도 춘계학술대회 논문집
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    • pp.9-12
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    • 2008
  • The internal reforming of n-Butane on Ni-YSZ and Cu-Ceria-YSZ was investigated with anode granule at steam to carbon ratio from 0 to 3 and at temperature of $750^{\circ}C$. Although hydrogen production was lager at Ni-YSZ, resistivity for carbon deposition was better at Cu-Ceria-YSZ. These phenomena occur because unwanted side reaction go on with reforming reaction for hydrogen production at Ni-YSZ.

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Optical properties of amorphous $Si_xC_yN_z$ ternary thin films prepared by plasma enhanced chemical vapor deposition

  • Zhang, Z.H.;Fan, X.J.;Guo, H.X.;Zhang, W.;Zhang, C.Y.;Luo, F.Y.
    • 한국진공학회지
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    • 제7권s1호
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    • pp.190-196
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    • 1998
  • Amorphous ternary $Si_xC_yN-z$ thin films were obtained by plasma enhanced chemical vapor deposition(PECVD) using $N_2, SiH_4 \;and \;C_2H_4$ as the reaction sources. The chemical state were characterized by x-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy(FTIR). The optical properties of the thin films were investigated by UV-visible spectrophotometer and ellipsometer, and the optical band gaps of thin films were determined from corresponding transmittance spectra following Tauc equation.

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