References
- Electron. Lett v.30 no.5 Optically transparent indium tin oxide(ITO) ohmic contacts in the fabrication of vertical cavity surface emitting lasers M. A. Matin;A. F. Jezierski;S. A. Bashar;D. E. Lacklison;T. M. Benson;T. S. Cheng;T. E. Sale;J. W. Orton;C. T. Foxon;A. A. Razazadeh https://doi.org/10.1049/el:19940243
- IEE Pro.-optoelectron v.143 no.1 Fabrication and characterisation of transparent-gate field effect transistors using indium tin oxide A. H. Khalid;Razazadeh https://doi.org/10.1049/ip-opt:19960083
- IEE Pro.-optoelectron v.143 no.1 Fabrication and spectral response analysis of AlGaAs/GaAs and InP/InGaAs HPTs with transparent ITO emitter contacts S. A. Bashar;Razazadeh https://doi.org/10.1049/ip-opt:19960176
- 한국전기전자재료학회 1997추계학술대회논문집 반응성 스퍼트링에 의한 ITO의 형성과 유전체소성 공정중의 특성변화에 관한 연구 남상옥;지성원;손제봉;조정수;박정후
- 한국전기전자재료학회 2001추계학술대회논문집 sputtered ITO(glass)의 열처리효과 김호수;정순원;구경완
- Proc. 2001 Autumn Conf. KIEEME Control of deposition parameters in ITO films: figure of merit H. H. Kim;C. H. Park;M. J. Cho;K. J. Lim;J. H. Shin;K. I. Park
- IEEE trans. Electron Devices v.ED-43 no.3 Optical control of 14 GHz MMIC oscillators based on InAl As/InGaAs HBT's with monolithically integrated optical waveguides P. Freeman;X. Zhang;I. Vurgaftman;J. Singh;P. Bhattacharya
- IEEE trans. on Microwave Thoery and Techniques v.43 no.9 Optically transparent ITO emitter contacts in the fabrication of InP/InGaAs HTP's S. A. Bashar;Razazadeh https://doi.org/10.1109/22.414581
- Jpn. J. Appl. Phys v.33 Postdeposition annealing influence on sputtered indium tin oxide film characteristics M. Higuchi;S. Uekusa;R. Nakano;K. Yokogawa https://doi.org/10.1143/JJAP.33.302
- J. Electrochem. Soc. v.138 no.11 Influence of the doposition and anneal temperature on the electrical properities of indium tin oxide C. H. L Weijtens https://doi.org/10.1149/1.2085429
- Applied Surface Science v.68 Effect of annealing and optical properties of RF magnetron sputtered indium tin oxide films W. Wu;B. Chiou https://doi.org/10.1016/0169-4332(93)90233-2
- IEEE Electron Dev. Lett. v.3 no.5 Obtaining the specific contact resistance from transmission line model measurements G. K. Reeves;H. B. Harrison https://doi.org/10.1109/EDL.1982.25502