• 한국진공학회:학술대회논문집
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• 한국진공학회 2007년도 제33회 하계학술대회 초록집
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• pp.172-172
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• 2007

• 천문학회보
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• 제41권2호
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• pp.38.2-38.2
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• 2016

How dense cores and filaments in molecular clouds form is one of key questions in star formation. To challenge this issue we started to make a systematic mapping survey of nearby molecular clouds in various environments with TRAO 14m telescope equipped with 16 beam array, in high ($N_2H^+$, $HCO^+$ 1-0) and low ($C^{18}O$, $^{13}CO$ 1-0) density tracers (TRAO Multi-beam Legacy Survey of Nearby Filamentary Molecular Clouds, PI: C. W. Lee). We pursue to dynamically and chemically understand how filaments, dense cores, and stars form under different environments. We have performed On-The-Fly (OTF) mapping observations toward L1251, southern part of Perseus molecular cloud, and Serpens main molecular cloud from January to May, 2016. In total, ~3.5 square degree area map of $^{13}CO$ and $C^{18}O$ was simultaneously obtained with S/N of >10 in a velocity resolution of ~0.2 km/s. Dense core regions of ~1.7 square degree area where $C^{18}O$ 1-0 line is strongly detected were also mapped in $N_2H^+$ 1-0 and $HCO^+$ 1-0. The L1251 and Perseus MC are known to be low- to intermediate-mass star-forming clouds, while the Serpens MC is an active low-mass star-forming cloud. The observed molecular filaments will help to understand how the filaments, cores and eventually stars form in a low- and/or intermediate-mass star-forming environment. In this talk, I'll give a brief report on the observation and show preliminary results of Perseus MC.

• 한국진공학회지
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• 제19권5호
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• pp.371-376
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• 2010

분자선 에피택시 장비를 이용하여 두 단계 방법(two-step method)으로 Si (100) 기판 위에 GaAs 에피층을 성장하였다. Si 기판은 초고진공을 유지하고 있는 MBE 성장 챔버 속에서 세척 방법을 달리하여 Si 기판표면에 존재하는 불순물(산소, 탄소 등)을 제거하였다. 첫 번째는 Si 기판을 몰리브덴 히터를 사용하여 $800^{\circ}C$로 직접 가열하였다. 두 번째는 Si 기판 표면에 As 빔을 조사시켜 주면서 $800^{\circ}C$로 Si 기판을 가열하였다. 세 번째는 Si 기판 표면에 Ga을 증착한 후 Si 기판을 $800^{\circ}C$로 가열하였다. 이와 같은 세 가지 다른 조건으로 세척한 Si(100) 기판 위에 성장한 GaAs 에피층의 특성은 reflection high-energy electron diffraction (RHEED), atomic force microscope (AFM), double crystal x-ray diffraction (DXRD), photoluminescence (PL), photoreflectance(PR) 등으로 조사하였다. Ga 빔을 증착하여 세척한 Si 기판 위에 성장된 GaAs 에피층의 RHEED 패턴은 ($2{\times}4$) 구조를 가지고 있었다. Ga 빔을 증착하여 세척한 Si 기판 위에 성장된 GaAs 에피층이 가장 좋은 결정성을 가지고 있었다.

• 한국재료학회지
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• 제21권11호
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• pp.634-638
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• 2011

We report growth of epitaxial AlN thin films on c-plane sapphire substrates by plasma-assisted molecular beam epitaxy. To achieve two-dimensional growth the substrates were nitrided by nitrogen plasma prior to the AlN growth, which resulted in the formation of a two-dimensional single crystalline AlN layer. The formation of the two-dimensional AlN layer by the nitridation process was confirmed by the observation of streaky reflection high energy electron diffraction (RHEED) patterns. The growth of AlN thin films was performed on the nitrided AlN layer by changing the Al beam flux with the fixed nitrogen flux at 860$^{\circ}C$. The growth mode of AlN films was also affected by the beam flux. By increasing the Al beam flux, two-dimensional growth of AlN films was favored, and a very flat surface with a root mean square roughness of 0.196 nm (for the 2 ${\mu}m$ ${\times}$ 2 ${\mu}m$ area) was obtained. Interestingly, additional diffraction lines were observed for the two-dimensionally grown AlN films, which were probably caused by the Al adlayer, which was similar to a report of Ga adlayer in the two-dimensional growth of GaN. Al droplets were observed in the sample grown with a higher Al beam flux after cooling to room temperature, which resulted from the excessive Al flux.

• 한국전기전자재료학회논문지
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• 제33권5호
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• pp.360-366
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• 2020

Focused electron beams with high energy acceleration are versatile probes. Focused electron beams can be used for high-resolution imaging and multi-mode nanofabrication, in combination with, molecular precursor delivery, in an electron microscopy environment. A high degree of control with atomic-to-microscale resolution, a focused electron beam allows for precise engineering of a graphene-based field-effect transistor (FET). In this study, the effect of electron irradiation on a graphene FET was systematically investigated. A separate evaluation of the electron beam induced transport properties at the graphene channel and the graphene-metal contacts was conducted. This provided on-demand strategies for tuning transfer characteristics of graphene FETs by focused electron beam irradiation.

• 펄프종이기술
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• 제48권2호
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• pp.68-74
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• 2016

Nanofibrillated cellulose (NFC) was prepared from cotton linter after electron beam irradiation to investigate its effects on the manufacturing efficiency of the NFC preparation and the property changes by the treatment. Mechanical device (Super Masscolloider) was used to prepare the NFC and its passing frequency for each NFC preparation was recorded. More electron beam irradiation resulted in less passing frequency. Alpha cellulose content, molecular weight, crystallinity index, and thermal decomposition behavior of each treatment were lowered by electron beam treatment (10 and 100 kGy) and grinding process. NFC films were prepared to investigate their mechanical properties. There were little changes in tensile properties of the NFC films.

• 펄프종이기술
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• 제41권3호
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• pp.71-75
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• 2009

Cotton waste is usually used for cultivating agaric mushroom after outdoor fermentation for a few months. Electron beam was used to break down the polymer chaims of cotton waste for increasing low molecular weight soluble sugars, which may enhance the agaric mushroom cultivation. By increasing electron beam radiation, alpha cellulose content of the cotton waste was decreased while beta cellulose content and hot water solubles were increased. Electron beam radiation over 240 kGy on cotton waste caused significant increase of mushroom yield without lowering mushroom quality.

• Transactions on Electrical and Electronic Materials
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• 제1권3호
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• pp.18-22
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• 2000

In this work, we reported the sulfur compositional variation of ZnS$\_$x/Se$\_$1-x/ epitaxial layers with growth temperature and BEP ration of ZnX/Se/)P$\_$ZnS//P$\_$Se/) grown on GaAs substrates by molecular beam epitaxy. The sulfur composition of ZnSSe epitaxial layers was varied sensitively on the growth temperature and show different linear relationship with growth temperature and BEP ration of ZnS/Se(P$\_$ZnS//P$\_$Se/), which revealed -0.107 %$\^{C}$ at (P$\_$ZnS//P$\_$Se/)=0.30 and -0.052 %$\^{C}$ at (P$\_$ZnS//P$\_$Se/)=0.158 rspectively. A reference data for the accurate control of the sulfur composition and the growth of high quality ZnSSe/GaAs epitaxial layers was provided.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2005년도 International Meeting on Information Displayvol.II
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• pp.1221-1224
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• 2005

The improvement of luminance and luminous efficiency is the one of the most important parts in AC-PDPs. To achieve high luminance and luminous efficiency, high VUV emission efficiency is needed. We measured the emission spectra of the vacuum ultraviolet(VUV) rays in surface discharge AC-PDP with ternary gas mixture of He-Ne-Xe. The influence of He-Ne-Xe gas-mixture ratio on excited $Xe^{\ast}$ resonant atoms and $Xe_2\;^{\ast}$ dimers has been investigated. It is found that luminous efficiency of ternary gas mixture, He-Ne-Xe, is shown to be much higher than that of binary gas mixture of Ne-Xe. For improving discharge luminous efficiency, we have studied VUV emission characteristics of ternary gas mixture, He(50%)-Ne-Xe and He(70%)-Ne-Xe with Xe concentration and filling gas pressure.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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• pp.368-368
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• 2008

Ion implantation has been widely developed during the past decades to become a standard industrial tool. To comply with the growing needs in ion implantation, innovative technology for the control of ion beam parameters is required. Beam current, beam profile, ion fractions are of great interest when uniformity of the implant is an issue. Especially, it is important to measure the spatial distribution of beam power and also the energy distribution of accelerated ions. This energy distribution is influenced by the proportion of mass for ion in the plasma generator(ion source) and by charge exchange and dissociation within the accelerator structure and also by possible collective effects in the neutralizer which may affect the energy and divergence of ions. Hydrogen atom has been the object of a good study to investigate the energy distribution. Hydrogen ion sources typically produce multi-momentum beams consisting of atomic ion ($H^+$) and molecular ion ($H_2^+$ and $H_3^+$). In the beam injector, the molecular ions pass through a charge-exchanges gas cell and break up into atomic with one-half (from $H_2^+$) or one-third (from $H_3^+$) according to their accelerated energy. Burrell et al. have observed the Doppler shifted lines from incident $H^+$, $H_2^+$, and $H_3^+$ using a Doppler shift spectroscopy. Several authors have measured the proportion of mass for hydrogen ion and deuterium using an ion source equipped with a magnetic dipole filter. We developed an ion implanter with 50-KeV and 20-mA ion source and 100-keV accelerator tube, aiming at commercial uses. In order to measure the proportion of mass for ions, we designed a filter system which can be used to measure the ion fraction in any type of ion source. The hydrogen and helium ion species compositions are used a filter system with the two magnets configurations.