• Journal of the Korean Institute of Telematics and Electronics
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• v.27 no.5
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• pp.699-708
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• 1990

This paper proposes two test procedures for detecting functional faults in semiconductor random access memories (RAM's) and a new testimg scheme to execute the proposed test procedures. The first test procedure detects stuck-at faults, coupling faults and decoder faults, and requires 19N operations, which is an improvement over conventional procedures. The second detects restricted patternsensitive faults and requires 69N operations. The proposed scheme uses Built-In Self Testing (BIST) techniques. The scheme can write into more memory cells than I/O pins can in a write cycle in test mode. By using the scheme, the number of write operations is reduced and then much testing time is saved.

• Proceedings of the KIEE Conference
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• 2001.07e
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• pp.134-140
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• 2001

Parallel processing has the potential to be cost effectively used on computationally intense power system problems. But this technology is not still available is not only parallel computer but also parallel processing scheme. Testing these algorithms to ensure accuracy, and evaluation of their performance is also an issue. Although a significant amount of parallel algorithms of power system problem have been developed in last decade, actual testing on processor architectures lies in the beginning stages. This paper presents the parallel processing algorithm to supply the base being able to treat power flow by newton's method by the distributed memory type parallel computer. This method is to assign and to compute teared blocks of sparse matrix at each parallel processors. The testing to insure accuracy of developed method have been done on serial computer by trying to simulate a parallel environment.

• Journal of electromagnetic engineering and science
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• v.11 no.3
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• pp.213-219
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• 2011

Simulative target generators are needed for testing and calibrating various radar systems. The generator in this study discriminates the transmitting frequency from a radar and simulates parameters like target range, range rate, and atmospheric attenuation using the digital RF memory technique. The simulative target echo is then sent to the radar for testing and evaluation. This paper proposes a novel architecture for controlling the digital RF memory so it continually writes ADC data to the memory and reads it for the DAC with increasing one step address in order to control the delay of target range in a simple way. The target echo is programmed according to various preprogrammed scenarios and is generated in real time using a wireless local area network (LAN). To analyze the detected and generated target information easily, the system times for the radar and simulative target generator are synchronized using a global positioning system (GPS).

• Journal of the Korean Society for Nondestructive Testing
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• v.21 no.6
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• pp.634-641
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• 2001

Shape memory alloy has been used to improve the tensile strength of composite by the occurrence of compressive residual stress in matrix using its shape memory effect. In order to fabricate shape memory alloy composite, TiNi alloy and A16061 were used as reinforcing material and mix, respectively. In this study, TiNi/A16061 shape memory alloy composite was made by using hot press method. However, the specimen fabricated by this method had the bonding problem at the boundary between TiNi fiber and Al matrix when the load was applied to it. A cold rolling was imposed to the specimen to improve the bonding effect. It was found that tensile strength of specimen subjected to cold rolling was more increased than that of specimen which did not underwent cold rolling. In addition, acoustic emission technique was used to quantify the microscopic damage behavior of cold rolled TiNi/A16061 shape memory alloy composite at high temperature.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.806-809
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• 2007

SRAM cell array and peripheral circuits on display panel are designed using LTPS process. To overcome low yield of SOP, high speed parallel fault detection circuitry for memory cells is designed at local I/O lines with minimal overhead for efficient memory cell redundancy replacement. Normal read/write and parallel test read/write are simulated and verified.

• Korean Management Science Review
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• v.26 no.1
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• pp.171-182
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• 2009

We consider the inventory replenishment problem and the vehicle routing problem simultaneously in the vending machine operation. This problem is known as the inventory routing problem. We design a memory cell in the clonal selection algorithm. The memory cell store the best solution of previous solved problem and use an initial solution for next problem. In general, the other clonal selection algorithm used memory cell for reserving the best solution in current problem. Experiments are performed for testing efficiency of the memory cell in demand uncertainty. Experiment result shows that the solution quality of our algorithm is similar to general clonal selection algorithm and the calculations time is reduced by 20% when the demand uncertainty is less than 30%.

• Proceedings of the Korea Information Processing Society Conference
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• 2004.05a
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• pp.309-312
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• 2004

임베디드 시스템은 특별한 목적을 수행하기 위해 컴퓨터 하드웨어와 소프트웨어를 결합시킨 것이다. 임베디드 시스템은 일반 데스크탑보다 작은 규모의 하드웨어에서 운영된다. 임베디드 시스템은 파워, 공간, 메모리 등의 여러 가지 환경적 요소에 제약을 받는다. 그리고 임베디드 시스템은 실시간으로 동작하기 때문에 임베디드 시스템에서 소프트웨어의 실패는 일반 데스크탑에서보다 훨씬 심각한 문제를 발생시킨다. 따라서 임베디드 시스템은 주어진 자원을 효율적으로 사용하여야 하고 임베디드 시스템의 실패율을 낮춰야만 한다. 치명적인 문제를 발생시킬 수 있는 임베디드 시스템의 실패의 원인 중 하나가 메모리에 관련한 문제이다. 임베디드 시스템 특정상 메모리 문제는 크게 하드웨어 기반의 메모리 문제와 소프트웨어 기반의 메모리 문제로 분류된다. 소프트웨어 기반의 메모리에 관련한 문제는 Memory Leak, Freeing Free Memory, Freeing Unallocated Memory, Memory Allocation Failed, Late Detect Array Bounds Write, Late Detect Freed Memory Write 등과 같은 것들이 있다. 본 논문에서는 임베디드 시스템의 메모리 관련에 대한 문제점을 파악하고 관련 툴을 연구하여 그 문제점들을 효율적으로 해결할 수 있는 기법을 점증적으로 연구하고자 한다.

• Electrical & Electronic Materials
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• v.10 no.4
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• pp.349-354
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• 1997

This paper aims at studying the improvement of test method for t-weight sensitive fault (t-wsf) detect. The development of RAM fabrication technology results in not only the increase at device density on chips but also the decrease in line widths in VLSI. But, the chip size that was large and complex is shortened and simplified while the cost of chips remains at the present level, in many cases, even lowering. First of all, The testing patterns for RAM fault detect, which is apt to be complicated , need to be simplified. This new testing method made use of Local Lower Bound (L.L.B) which has the memory with the beginning pattern of 0(l) and the finishing pattern of 0(1). The proposed testing patterns can detect all of RAM faults which contain stuck-at faults, coupling faults. The number of operation is 6N at 1-weight sensitive fault, 9,5N at 2-weight sensitive fault, 7N at 3-weight sensitive fault, and 3N at 4-weight sensitive fault. This test techniques can reduce the number of test pattern in memory cells, saving much more time in test, This testing patterns can detect all static weight sensitive faults and pattern sensitive faults in RAM.

• Journal of KIISE:Computing Practices and Letters
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• v.7 no.1
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• pp.99-107
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• 2001

In this paper, we implemented memory BIST circuit based on ION march algorithm, and the IEEE 1149.1 has been designed as main controlJer for embedded memory testing. The implemented memory BIST can be used for word-oriented memory since it adopts background data, this is avaliable for word-oriented memory. It is able to detect all stuck-at faults, transition faults, coupling faults, and address decoder faults in the word-oriented memory. Memory BIST and IEEE 1149.1 are described at RTL level in Verilog-HDL, and synthesized with the Synopsys. The synthesized circuits are fully velified using VerilogXL and memory cell generated by memory compiler.

• Journal of the Korean Society for Nondestructive Testing
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• v.22 no.1
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• pp.45-52
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• 2002

It has been known that tensile residual stresses occurring by the thermal expansion coefficient mismatch between fiber and matrix is a cause of the weak strength of metal matrix composites(MMCs). In order to solve this problem, TiNi alloy fiber was used as a reinforced material in TiNi/A16001 shape memory alloy composite in this study. TiNi alloy fiber improves the tensile strength of the composite by causing compressive residual stress in matrix on the basis of its shape memory effect. Pre-strain was imposed to generate the compressive residual stresses inside the TiNi/A16001 shape memory alloy composites. AE technique was used to quantify the microscopic damage behavior of the composite at high temperature. The effect of applied pre-strains on the AE behavior was also evaluated.