• 제목/요약/키워드: Memory test

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Effects of (-)-Sesamin on Memory Deficits in MPTP-lesioned Mouse Model of Parkinson's Disease

  • Zhao, Ting Ting;Shin, Keon Sung;Lee, Myung Koo
    • Natural Product Sciences
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    • 제22권4호
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    • pp.246-251
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    • 2016
  • This study investigated the effects of (-)-sesamin on memory deficits in 1-methyl-4-phenyl-1,2,3,6-tetrahydropyridine (MPTP)-lesioned mouse model of Parkinson's disease (PD). MPTP lesion (30 mg/kg/day, 5 days) in mice showed memory deficits including habit learning memory and spatial memory. However, treatment with (-)-sesamin (25 and 50 mg/kg) for 21 days ameliorated memory deficits in MPTP-lesioned mouse model of PD: (-)-sesamin at both doses improved decreases in the retention latency time of the passive avoidance test and the levels of dopamine, norepinephrine, 3,4-dihydroxyphenylacetic acid, and homovanillic acid, improved the decreased transfer latency time of the elevated plus-maze test, reduced the increased expression of N-methyl-D-aspartate (NMDA) receptor, and increased the reduced phosphorylation of extracellular signal-regulated kinase (ERK1/2) and cyclic AMP-response element binding protein (CREB). These results suggest that (-)-sesamin has protective effects on both habit learning memory and spatial memory deficits via the dopaminergic neurons and NMDA receptor-ERK1/2-CREB system in MPTP-lesioned mouse model of PD, respectively. Therefore, (-)-sesamin may serve as an adjuvant phytonutrient for memory deficits in PD patients.

Ti_{50}-Ni_{50} 형상기억합금 복합체의 계면 접학 전단강도 향상에 관한 연구 (A Study on the Improvement of Interfacial Bonding Shear Strength of Ti50-Ni50 Shape Memory Alloy Composite)

  • 이효재;황재석
    • 대한기계학회논문집A
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    • 제24권10호
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    • pp.2461-2468
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    • 2000
  • In this paper, single fiber pull-out test is used to measure the interfacial bonding shear strength of $Ti_{50}-Ni_{50}$ shape memory alloy composite with temperature. Fiber and matrix of $Ti_{50}-Ni_{50}$ shape memory alloy composite are respectively $Ti_{50}-Ni_{50}$ shape memory alloy and epoxy resin. To strengthen the interfacial bonding shear stress, various surface treatments are used. They are the hand-sanded surface treatment, the acid etched surface treatment and the silane coupled surface treatment etc.. The interfacial bonding shear strength of surface treated shape memory alloy fiber is greater than that of surface untreated shape memory alloy fiber by from 10% to 16%. It is assured that the hand-sanded surface treatment and the acid etched surface treatment are the best way to strengthen the interfacial bonding shear strength of $Ti_{50}-Ni_{50}$ shape memory composite. The best treatment condition of surface is 10% HNO$_3$ solution in the etching method to strengthen the interfacial bonding shear strength of $Ti_{50}-Ni_{50}$ shape memory alloy composite.

수면 무호흡과 수면이 기억기능에 미치는 영향 (The influence of sleep and sleep apnea on memory function)

  • 이성훈;이나영;박윤조;전덕인
    • 수면정신생리
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    • 제5권2호
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    • pp.177-184
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    • 1998
  • Objectives : Disturbance of sleep with or without sleep apnea may impair the memory function. Sleep deficiency, sleepiness, sleep apnea and emotional problem in sleep disorders can induce an impairment of memory function. Methods : In this study, the polysomnographies were administered to 58 sleep apnea patients and 38 sleep disorder patients without sleep apnea. Their clinical symptoms were quantitatively evaluated. Short term and long term memory were evaluated before and after polysom no graphy with Digit symbol test and Rey-Osterrieth complex figure test. And correlations among various sleep, repiratory and clinical variables were statistically studied in order to explore which variables may influence on memory function. Results and Conclusions : Results are as follows. Depth of sleep cis positively correlated with memory function. As sleep apnea increases and average saturation of blood oxygen decreases, memory function is more impaired. Emotional depression, high blood pressure, obesity or alcohol impaired memory function. However, daytime sleepiness was not significantly correlated with memory function. The possible mechanisms how above factors influence on the memory function were discussed.

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기억강화프로그램이 노인의 인지기능, 자아존중감과 기억수행에 미치는 영향 (Influence of Memory Intensive Training Program on Cognitive Function, Memory Performance, and Self-Esteem in Elderly People)

  • 정명숙;김정화
    • 재활간호학회지
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    • 제13권2호
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    • pp.161-170
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    • 2010
  • Purpose: This study was to confirm the influence of memory intensive training program on the elderly people's cognitive function, memory performance, and self-esteem. Method: Using a quasi-experimental or experimental design, 60 elderly aged over 60 years randomly assigned the experimental and control groups completed pretest-post evaluation. The experimental group participated in the memory intensive training program was offered to the participants in the experimental group for three weeks (2times/week). The t-test and $X^2$-test using SAS program. Results: 1) The cognitive function was significantly higher in the experimental group compared to that in the control group (t=3.26, p=.002). 2) The memory performance that included immediate word recall tasks, word recognition tasks and delayed word recall tasks was significantly higher in the experimental group than in the control group (t=5.30, p<.001). The experimental group showed significantly higher scores for memory performance than the control group (t=5.30, p<.001). 3) The self-esteem was higher in the experimental group than in the control group, but there was no significant difference between the two groups (t=1.94, p=.058). Conclusion: The Memory Intensive Training Program could be an effective intervention for improving cognitive function, and memory performance of the elderly people.

양방향성 형상기억합금을 이용한 공작물 척킹장치: 유용성 검증 (Workpiece-Chucking Device Using Two-Way Shape Memory Alloys: Feasibility Test)

  • 신우철;노승국;박종권
    • 한국생산제조학회지
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    • 제18권5호
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    • pp.462-468
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    • 2009
  • In this study, a workpiece-chucking device that generates a chucking force from a shape memory alloy is introduced. This paper first presents train procedure to transform a commercial one-way shape memory alloy into a two-way shape memory alloy, which makes unclamping mechanism of the chucking device simpler than that using the one-way shape memory alloy Second, it describes a conceptual design of the workpiece-chucking device using the two-way type shape memory alloy. Third, it presents a prototype and its chucking characteristics, such as time-response of clamping/unclamping operations and a relationship between temperatures and chucking forces. Finally, it describes a mill-machining test conducted with the prototype. The results confirm that the proposed workpiece-chucking device is feasible for micro machine-tools.

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명령어 분석기를 이용한 고속 메모리 테스트를 위한 병렬 ALPG (An Effective Parallel ALPG for High Speed Memory Testing Using Instruction Analyzer)

  • 윤현준;양명훈;김용준;박영규;박재석;강성호
    • 대한전자공학회논문지SD
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    • 제45권9호
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    • pp.33-40
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    • 2008
  • 메모리의 속도가 빠르게 향상됨에 따라, 고속 메모리를 테스트하기 위한 테스트 장비가 요구되고 있다. 특히 고속 메모리를 사용자가 원하는 명령어를 그대로 사용하여 효율적으로 테스트할 수 있도록 패턴을 만들어 내는 알고리즘 패턴 생성기(ALPG)가 필요하다. 본 논문에서는 고속 메모리 테스트를 위한 새로운 병렬 ALPG를 제안한다. 제안하는 ALPG는 명령어 분석기를 통해 사용자가 실행하고자 하는 명령어를 그대로 사용하여 고속 메모리 테스트를 위한 패턴을 생성할 수 있다.

SoC 내장 메모리를 위한 ARM 프로세서 기반의 프로그래머블 BIST (ARM Professor-based programmable BIST for Embedded Memory in SoC)

  • 이민호;홍원기;송좌희;장훈
    • 한국정보과학회논문지:시스템및이론
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    • 제35권6호
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    • pp.284-292
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    • 2008
  • 메모리 기술이 발달함에 따라 메모리의 집적도가 증가하게 되었고, 그에 따라 구성요소들의 크기가 작아지게 되고, 고장의 감응성이 증가하게 되어, 테스트는 더욱 복잡하게 된다. 또한, 칩 하나에 포함되어 있는 저장요소가 늘어남에 따라 테스트 시간도 증가하게 된다. SoC 기술의 발달로 대용량의 내장 메모리를 통합할 수 있게 되었지만, 테스트 과정은 복잡하게 되어 외부 테스트 환경에서는 내장 메모리를 테스트하기 어렵게 되었다. 본 논문은 ARM 프로세서 기반의 SoC 환경에서의 임베디드 메모리를 테스트할 수 있는 프로그램 가능한 메모리 내장 자체 테스트를 제안한다.

일 지역 치매의심 노인군에서 갑상선관련 호르몬, 인지기능, 우울증, 주관적 기억저하의 연관성 (Thyroid Hormones, Cognitive Impairment, Depression and Subjective Memory Complaint in Community-Dwelling Elders with Questionable Dementia in Korea)

  • 이성남;진하영;문석우
    • 생물정신의학
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    • 제21권4호
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    • pp.175-181
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    • 2014
  • Objectives It was the aim to examine the association of the thyroid-related hormones with cognitive function, depression, and subjective memory impairment in community-dwelling elders with questionable dementia. Methods The sample consisted of 399 community residents with 'questionable dementia' aged 60 or over in whom serum thyroid-related hormones [thyroid stimulating hormone (TSH) and thyroxine] had been assayed. Cognitive impairment was defined using the Korean version of the Consortium Establish a Registry for Alzheimer's Disease. Depression was diagnosed using the Korean version of Geriatric Depression Scale and subjective memory complaint (SMC) was checked using the subjective memory complaints questionnaire (SMCQ). Age, gender, education, and the presence of apolipoprotein E {\varepsilon}4 were included as covariates. Results There was a significant positive association between verbal fluency test (VFT) score and serum TSH levels (p = 0.01). There was a significant negative association between SMCQ total score and word list memory test (WLMT)(p = 0.002) or word list recall test (WLRT) score (p = 0.013). Conclusions Lower serum TSH levels were associated with semantic memory (VFT), and we found that SMC was associated with episodic memory (WLMT and WLRT) in this sample.

기준 메모리를 이용한 메모리 컴파일러 특성화 방법 (Characterization Method of Memory Compiler Using Reference Memories)

  • 신우철;송혜경;정원영;조경순
    • 전자공학회논문지
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    • 제51권2호
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    • pp.38-45
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    • 2014
  • 본 논문에서는 메모리 컴파일러를 정확하고 빠르게 특성화할 수 있도록 기준 메모리를 기반으로 특성화하는 방법을 제안하였다. 제안한 특성화 방법은 메모리 컴파일러의 정확도를 유지하면서 특성화 시간을 최소화하기 위해 메모리 컴파일러의 타이밍 경향을 분석하고 분석 결과를 토대로 기준 메모리를 선정하고, 메모리간의 경향성을 대변할 수 있도록 모델링하였다. 본 논문에서 제안한 방법론을 검증하기 위하여 130nm에서 개발된 메모리 컴파일러를 제안한 방법을 이용하여 110nm 메모리 컴파일러를 특성화하였다. 이를 통해 생성한 메모리들의 특성과 SPICE를 사용하여 특성화한 결과를 비교하여 메모리 타이밍의 평균 오차율은 ${\pm}0.1%$ 이내였으며 실제 110nm 공정을 사용하여 제작된 메모리 BIST(Built-In Self Test) 테스트 칩으로 기능 검사한 결과, 수율(Yield)이 98.8% 임을 확인하였다. 또한, 180nm 공정을 사용하여 비교한 결과, 수율이 98.3%로 그 유용성을 확인할 수 있었다.

MLC NAND-형 Flash Memory 내장 자체 테스트에 대한 연구 (MLC NAND-type Flash Memory Built-In Self Test for research)

  • 김진완;김태환;장훈
    • 전자공학회논문지
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    • 제51권3호
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    • pp.61-71
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    • 2014
  • 임베디드 시스템의 저장매체 시장의 플래시 메모리의 점유율이 증가되고 반도체 산업이 성장함에 따라 플래시 메모리의 수요와 공급이 큰 폭으로 증가하고 있다. 특히 스마트폰, 테블릿 PC, SSD등 SoC(System on Chip)산업에 많이 사용되고 있다. 플래시 메모리는 셀 배열 구조에 따라 NOR-형과 NAND-형으로 나뉘고 NAND-형은 다시 Cell당 저장 가능한 bit수에 따라서 SLC(Single Level Cell)과 MLC(Multi Level Cell)로 구분된다. NOR-형은 BIST(Bulit-In Self Test), BIRA(Bulit-In Redundancy Analysis)등의 많은 연구가 진행되었지만 NAND-형의 경우 BIST 연구가 적다. 기존의 BIST의 경우 고가의 ATE 등의 외부 장비를 사용하여 테스트를 진행해야한다. 하지만 본 논문은 MLC NAND-형 플래시 메모리를 위해 제안되었던 MLC NAND March(x)알고리즘과 패턴을 사용하며 내부에 필요한 패턴을 내장하여 외부 장비 없이 패턴 테스트가 가능한 유한상태머신(Finite State Machine) 기반구조의 MLC NAND-형 플래시 메모리를 위한 BIST를 제안하여 시스템의 신뢰도 향상과 수율향상을 위한 시도이다.