• Title/Summary/Keyword: Measurement probe

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Development of On-machine Measurement System utilizing a Capacitive-type Sensor (정전용량형 센서를 이용한 기상계측시스템의 개발)

  • 김건희;박순섭;박원규;원종호
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.10a
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    • pp.391-395
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    • 2002
  • This paper described about the ultra-precision profile measurement of aspheric surfaces using contact probing technique. A contact probe has been designed as a sensing device to obtain measuring resolutions in nanometer regime utilizing a leaf spring mechanism and a capacitive-type sensor. The contact probe is attached on the z-axis during measurement while aspheric objects are supported on the single point diamond turning machine(SPDTM). The machine xz-axis motions are monitored by a set of two orthogonal plane mirror type laser interferometers. Experimental results show that the contact probing technique developed of On-machine Measurement System in this investigation is capable of providing a repeatability of 20 nanometers with a $\pm$20 uncertainty of 300 nanometers.

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Measurement Data Comparison of Fast SAR Measurement System by Probe Arrays with Robot Scanning SAR Measurement System

  • Kim, Jun Hee;Gimm, Yoon-Myoung
    • Journal of electromagnetic engineering and science
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    • v.14 no.4
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    • pp.336-341
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    • 2014
  • Dosimetry of radiating electromagnetic wave from mobile devices to human body has been evaluated by measuring Specific Absorption Rate (SAR). Usual SAR measurement system scans the volume by robot arm to evaluate RF power absorption to human body from wireless devices. It is possible to fast estimate the volume SAR by software deleting robot moving time with the 2D surface SAR data acquired by arrayed probes. This paper shows the principle of fast SAR measurement and the measured data comparison between the fast SAR system and the robot scanning system. Data of the fast SAR is well corresponding with data of robot scanning SAR within ${\pm}3$ dB, and its dynamic range covers from 10 mW/kg to 30 W/kg with 4.8 mm probe diameter.

Measurement and Analysis of Ground Impedance according to Arrangement of Auxiliary Probe around Ground Grid (접지 그리드에서의 보조전극 배치에 따른 접지임피던스 측정 및 분석)

  • Gil, Hyoung-Jun;Shong, Kil-Mok;Kim, Young-Seok;Kim, Chong-Min
    • Journal of the Korean Society of Safety
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    • v.30 no.4
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    • pp.46-50
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    • 2015
  • This paper describes the measurement and analysis of ground impedance according to arrangement of auxiliary probe around ground grid using the fall-of-potential method and the testing techniques to minimize the measuring errors are proposed. The fall-of-potential method involves passing a current between a ground electrode and a current probe, and then measuring the voltage between a ground electrode and a potential probe. To minimize interelectrode influences due to mutual resistances, the current probe is a generally placed at a substantial distance from the ground electrode under test. In order to analyze the effects of ground impedance due to the arrangement of auxiliary probe and frequency, ground impedances were measured in case that the arrangements of auxiliary probe were straight line, perpendicular line, and horizontal line. The distance of current probe was located from 10[m] to 200[m] and the measuring frequency was ranged from 55[Hz] to 513[Hz]. As a consequence, the ground impedance increases with increasing the distance from the ground electrode to the point to be tested, but the ground impedance decreases with increasing the frequency.

A Study on Dielectric Properties of Printed Circuit Board(PCB) Materials with Variation of Frequency and Temperature using Coaxial Air Line Probe (동축선로 프로브를 이용한 프린트 배선 회로용 기판 재료의 주파수 및 온도 변화에 따른 유전특성 연구)

  • 박종성;김종헌
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1998.11a
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    • pp.187-190
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    • 1998
  • In this paper a probe for the' measurement of dielectric properties of dielectric sheet materials is designed and implemented as a coaxial air line type. Using the broadband impedance method with this measurement probe the dielectric constant and loss tangent of the glass-epoxy and teflon are determined in the frequency range of 0.1 - l.O[GHz] with the temperature variation from $25[^{\circ}C]$ up to $65[^{\circ}C]$. A measured relative dielectric constant of the glass-epoxy is 4.42 and a loss tangents is 0.019 relatively, and the relative dielectric constants of teflon is 2.17 and a loss tangents is 0.002 relatively

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Automatic Measurement of 3-Dimensional Profile of Free-Formed Surfaces by Using Touch-Trigger Probes (접촉감지프로브를 이용한 자유곡면의 삼차원형상 자동측정)

  • 송창규
    • Transactions of the Korean Society of Mechanical Engineers
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    • v.17 no.2
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    • pp.407-415
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    • 1993
  • This report presents an automatic measurement method of 3-dimensional profiles of free-formed surfaces, by using a touch a touch-trigger contact probe along with a conventional coordinate measuring machine. The method proceeds in three steps; The surface profile under consideration is traced by the probe in an automatic manner, and then its measured data is compensated by considering the actual probe radius. Finally the compensated data is rearranged in the form suitable for the further processings of CAD/CAM applications. Some experimental results are discussed to verify the validity of the method suggested in this study.

The Development of 3D based On-Machine Measurement Operating System (3D 기반의 기상측정 운영시스템 개발)

  • 윤길상;최진화;조명우;김찬우
    • Journal of the Korean Society for Precision Engineering
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    • v.21 no.7
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    • pp.145-152
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    • 2004
  • This paper proposed efficient manufacturing system using the OMM (on-machine measurement) system. The OMM system is software based 3D modeler for inspection on machine and it is interfaced tool machine with RS232C. The software is composed of two inspection modules that one is touch probe operating module and the other is laser displacement sensor operating module. The module for touch probe has need of inspection feature that extracted it from CAD data. Touch probe moves to workpiece by three operating modes as follows: manual, general and automatic mode. The operating module of laser displacement sensor is used inspection for profile and very small hole. An Advantage of this inspection method is to be able to execute on-line inspection during machining or after it. The efficiency of proposed system which can predict and definite the machining errors of each process is verified, so the developed system is applied to inspect the mold-base(cavity, core).

Tilt Measurement of Drilling Machine Using the Laser Interferometer (레이저 간섭계를 이용한 드릴링 머신의 틸트 측정)

  • 이승수;손영지;김순경;전언찬
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 1996.11a
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    • pp.479-484
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    • 1996
  • This paper describes a method of measuring tilt motion. This method measures the tilt motion of drilling machines using a laser interferometer, a simple sliding linear bearing, measurement of the probe and the LSC(least square center) method. The next order of business is discussing the procedure of measurement. First, The measured position is considered to be the point of contact between the drill shank and the probe. The revolution of the drill axis delivers the point of contact to the probe. Second, because the laser interferometer is attached on the sliding linear bearing, any movement of probe influences laser reflector. Thus, the laser program displays the moving factor of laser reflector. Namely, this is tilt factor. Third. the points of measurement are a full circle which has 8 points (each are 45$^{\circ}$), After it is finished measuring the 8 points, let the spindle of the drilling machine move down about 5 cm. Repeating this procedure three times, we can get tilt motion's values which are calculated by LSC method. Many error factors affect the accurate measurement of tilt motion. However in this paper we ignore some error factors because they are less significant than tilt motion.

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The Measurement of Nano-grating by Scanning Probe Microscopy Using Digital PID Control (Digital PID Control을 적용한 Scanning Probe Microscopy의 Nano-grating 측정)

  • Park, Gyeong-Deok;Ji, Won-Su;Kim, Dae-Chan;Jang, Dong-Hun;O, Beom-Hwan;Park, Se-Geun;Lee, Il-Hang;Lee, Seung-Geol
    • Proceedings of the Optical Society of Korea Conference
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    • 2008.07a
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    • pp.185-186
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    • 2008
  • In this paper, the nano-grating was measured by Scanning Probe Microscopy (SPM) system using digital Proportion, Integration and Derivative (PID) control. Through this measurement, we could confirm the improvement of the vertical resolution compared with analog Proportion and Integration (PI) control method.

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Vision Inspection Module for Dimensional Measurement in CMM having Vision Probe (비젼프로브를 가지는 3차원 측정기를 위한 형상 측정 시스템 묘듈 개발)

  • 이일환;박희재;김구영
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 1995.10a
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    • pp.379-383
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    • 1995
  • In this paper, vision inspection module for dimensional measurement has been developed. For high accuracy of CMM, camera calibration and edge detection with subpixel accuracy have been implemented. In measurement process, the position of vision probe can be recognized in PC by serial communication with CMM controller. The developed vision inspection module can be widely applied to the practical measurement process.

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Development of On-the-Machine Measurement(OMM) System (기상측정(機上測定) 시스템 개발)

  • Lee, Seung-Woo;Kim, Sun-Ho
    • IE interfaces
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    • v.11 no.1
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    • pp.199-205
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    • 1998
  • This paper describes the development of on-the-machine measuring(OMM) system which can directly measure the two and three dimensional machined accuracy using a scanning probe in milling machine. Two algorithms, NC program based continuous path(CP) measurement and CAD data assisted point to point(PTP) measurement, are developed for three dimensional measurements, with consideration of the characteristics of the scanning probe. The algorithms are used to develop an auto measuring system. The delveloped system is compared with the CMM (Coordinate Measuring Machine) in terms of accuracy and repeatability. The OMM system is expected to realize measurement time reduction and hence result in high productivity.

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