• Title/Summary/Keyword: Measurement probe

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A Study on the Responsibility of Thin film instantaneous surface temperature probe of a Dual-pipe structure (이중관 구조 박막형 순간온도 프로브의 응답성에 관한 연구)

  • Choi, Seok-Ryeol;Park, Kyoung-Suk
    • 한국연소학회:학술대회논문집
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    • 2003.12a
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    • pp.237-242
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    • 2003
  • The measurement study of instantaneous temperature at combustion chamber wall and the temperature of combustion gas has been under lots of research and development to conclude the temperature process in internal combustion engine for combustion characteristics analysis. The measurement with fast responsibility should be used for temperature measurement inside combustion chamber wall since temperature of wall changes, due to the various gas temperature, irregularly during the combustion. Therefore, thin film instantaneous surface temperature probe, which characterizes the fastest and the most accurate responsibility among contact typed temperature measurement, was used for the experiments. This new thin film instantaneous surface temperature probe improved the problems of noise and durability. The optimal coating thickness of thin film instantaneous surface temperature probe was proven to be $10{\mu}m$ for the best responsibility and durability. It also allowed the stable temperature measurement be taken up to $1,200^{\circ}C$ and proven to be read possibly from the combustion chamber wall.

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Electrical Properties of a Single ZnO Nanowire in a four-probe Configuration (단일 ZnO 나노선 4단자 소자의 전기적 특성)

  • Kim, Kang-hyun;Kang, Hae-yong;Yim, Chan-young;Jeon, Dae-young;Kim, Hye-young;Kim, Gyu-Tae;Lee, Jong-Soo;Kang, Woun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.12
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    • pp.1087-1091
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    • 2005
  • Four-probe device of single ZnO nanowire was fabricated by electron beam lithography. Electrical characterizations in a two-probe and a four-probe configuration with a back-gate were carried out to clarify the relative contribution of the contact and the intrinsic part in a ZnO nanowire. I-V characteristic in four-probe measurement showed an ohmic behavior with a high conductivity, 100 S/cm, which was better than those of two-probe measurement by 10 times. At the same values of the current between two-probe and four-probe, the net voltage applied inside the nanowire were extracted with calculated voltages at the contact. Four-probe current-gate voltage characteristics showed bigger tendencies than those of two-probe measurement at low temperatures, indicating the reduced gate dependence in two-Probe measurements by the existence of the contact resistance.

Fabrication of the FET-based SPM probe by CMOS standard process and its performance evaluation (CMOS 표준 공정을 통한 SPM 프로브의 제작 및 그 성능 평가)

  • Lee, Hoontaek;Kim, Junsoo;Shin, Kumjae;Moon, Wonkyu
    • Journal of Sensor Science and Technology
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    • v.30 no.4
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    • pp.236-242
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    • 2021
  • In this paper, we report the fabrication of the tip-on-gate of a field-effect-transistor (ToGoFET) probe using a standard complementary metal-oxide-semiconductor (CMOS) process and the performance evaluation of the fabricated probe. After the CMOS process, I-V characteristic measurement was performed on the reference MOSFET. We confirmed that the ToGoFET probe could be operated at a gate voltage of 0 V due to channel ion implantation. The transconductance at the operating point (Vg = 0 V, Vd = 2 V) was 360 ㎂/V. After the fabrication process was completed, calibration was performed using a pure metal sample. For sensitivity calibration, the relationship between the input voltage of the sample and the output current of the probe was determined and the result was consistent with the measurement result of the reference MOSFET. An oxide sample measurement was performed as an example of an application of the new ToGoFET probe. According to the measurement, the ToGoFET probe could spatially resolve a hundred nanometers with a height of a few nanometers in both the topographic image and the ToGoFET image.

Optical Probe of white Light Interferometry for Precision Coordinate Metrology (정밀 삼차원 측정을 위한 백색광 간섭 광학 프로브 개발)

  • 김승우;진종한;강민구
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.05a
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    • pp.195-198
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    • 2002
  • Demand for high precision measurement of large area is increasing in many industrial fields. White-light Scanning Interferometer(WSI) is a well-known method for 3D profile measurement. However WSI has some limitations in a measurement range because of the sensing mechanism. Therefore, in this paper we use a heterodyne laser interferometer to get over the limitations of a short measurement range in WSI, We suggest a new WSI system combined with heterodyne laser interferometer. This system is aimed at eliminating Abbe error with measuring the focus point directly. With the use of triggering functionality of WSI, we can use this system as a probe of a precision stage such as a probe of CMM. The suggested system gives a repeatability of 87 nm in the absolute distance measurement test under the laboratory environment.

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3차원 자유곡면 온더머신 측정 및 검사 시스템의 개발

  • 남우선;정성종
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 1995.10a
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    • pp.911-914
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    • 1995
  • Measurement and inspection of freeform surface are required in reverse design process. In the case of surface measurement using a touch probe, probe radius compensation affects measuring accuracy But current industrial practice depends upon an operator's experience to compensate for probe radius. In this paper, an on-the-machine measuring and inspection system for freeform surfface was developed. Probe radius compensation methodology was studied via modeling of B-spline surfaces based on digitized data. The accuracy and reliability of the measurement system was confirmed through various kinds of experiments.

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Development of Basic Techniques for Ultrasound-guided Follicular Aspiration I. Measurement of Size of Ovaries, Follicles and Corpora Lutea of Korean Native Cows by Ultrasonography (초음파유도 난포란 채취를 위한 기본 기술의 개발 I. 초음파상에 나타난 한우 난소, 난포 및 황체의 크기 측정)

  • 최민철;강태영;조성근;최상용;손우진;이효종
    • Journal of Embryo Transfer
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    • v.12 no.2
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    • pp.203-209
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    • 1997
  • This study was carried out to compare the actual size(length and height) of ovaries, follicles and corpora lutea of Korean native cow with those on sonograms. We used 3 different probes(3.5 MHz abdominal probe, 6.5 MHz transvaginal probe and 5.0 MHz transrectal probe) and a calipher for measurements of ovaries, follicles and corpora lutea on sonograms and actual size. Under water immersion, 157 ovaries were scanned with 3 probes and measured in actual size and compared each other. The average height and width of ovaries of Korean native cows were 17.40$\pm$3.99 and 34.23$\pm$6.02mm, respectively. In comparison of height, length of ovaries and preovulation follicles, we found that image with a transvaginal probe was nearly the same as the actual size(p<0.01), but with an abdominal probe the image was appeared larger than the actual size. In measurement(diameter) of preovulation follicles the transvaginal probe was proven to be more accurate to the actual size than other probes and in corpus luteum measurement all probes were accurate. In the comparison of number of follicles by different size ranges, there was no statistical difference in the count of follicles over 10 mm in diameter between the transvaginal probe and naked eyes.

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Development of an Optical Waveguide Loss Measuring System using an Rectangular Glass Probe

  • Choi, Young-Kyu
    • Journal of Sensor Science and Technology
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    • v.10 no.1
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    • pp.71-79
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    • 2001
  • The use of a glass-plate probe of rectangular shape is proposed for the measurement of transmission loss in optical waveguides. The light-collecting window is of a thin, rectangular shape and is perpendicular to the light streak, while the conventional fiberglass probe has a small circular face. This transversely elongated form results in a grate improvement of mechanical tolerance for the probe movement in the vortical as well as in the transverse direction. A theoretical investigation also presents a reasonable agreement with the experiments.

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Calibration/Compensation of Errors of the Touch Probe (접촉식 프로브의 오차교정 및 보정기술)

  • 박희재;이교일
    • Transactions of the Korean Society of Mechanical Engineers
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    • v.18 no.8
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    • pp.2081-2087
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    • 1994
  • Touch trigger probes are widely used for inspection purposed in the CMM(Coordinate meauring machine) or machine tool. The errors introduced by measurement probe are fairy systematic, thus can be calibrated and compensated properly. This paper presents a technique for the error calibration and compensation of the probe errors, which can be easily applicable to the manufacturers and users of the measurement probe. The probe coordinate system is defined for the probe error assessment, and a reference sphere ball is measured, and the probe errors are calibrated. The calibrated probe errors are represented in the 3D error map and 2D error map along probing direction. Detail algorithms for the error compensation are proposed.

NAC Measurement Technique on High Parallelism Probe Card with Protection Resistors

  • Kim, Gyu-Yeol;Nah, Wansoo
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.16 no.5
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    • pp.641-649
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    • 2016
  • In this paper, a novel time-domain measurement technique on a high parallelism probe card with protection resistors installed is proposed. The measured signal amplitude decreases when the measurement is performed by Needle Auto Calibration (NAC) probing on a high parallelism probe card with installed resistors. Therefore, the original signals must be carefully reconstructed, and the compensation coefficient, which is related to the number of channel branches and the value of protection resistors, must be introduced. The accuracy of the reconstructed signals is analyzed based on the varying number of channel branches and various protection resistances. The results demonstrate that the proposed technique is appropriate for evaluating the overall signal performance of probe cards with Automatic Test Equipment (ATE), which enhances the efficiency of probe card performance test dramatically.

Design Models for Electric Coupling Probe in Combline Resonators Using Neural Network (신경망을 이용한 Combline 공진기 내의 전계결합 프로브 설계 모델)

  • 김병욱;김영수
    • Proceedings of the Korea Electromagnetic Engineering Society Conference
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    • 2002.11a
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    • pp.366-369
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    • 2002
  • Two artificial neural networks (ANN) are used to model the electric coupling probe in the combline resonators. One is used to analyze and synthesize the electric probe, and the other is used to correct errors between the results of the analysis and the synthesis ANNs and the fabrication results. The ANNs for the analysis and the synthesis of the electric probe are trained using the physical dimensions of the electric probe and the corresponding coupling bandwidth which is obtained using the finite element method. The ANNs for the error correction are trained using a very small set of the measurement results. Once trained, the ANN models provide the correct result approaching the accuracy of the measurement. The results from the ANN models show fairly good agreement with those of the measurement and they can be used as good initial design values.

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