• Proceedings of the KIEE Conference
• /
• 2002.11c
• /
• pp.550-553
• /
• 2002

A source meter is a basic instrument to perform a measurement of DC characteristic of semiconductor devices. the source meter can be used as variable voltage source, variable current source, voltage meter, or current meter. The accuracy of the low current measurement can be improved with the compensation of leakage current and charge and discharge current. In the low current measurement, the RC time constant is extremely big, so the measurement speed is very low. In this thesis, the analysis of the behavior of the measurement current according to the RC time constant and output capacitance and the method to accelerate the measurement speed.

• Proceedings of the KIEE Conference
• /
• 2003.11c
• /
• pp.860-863
• /
• 2003

In this paper high power SMU(Source Measurement Unit) having 50V/1.5A source/measure range has been designed and implemented. The SMU has two operation mode, voltage mode and current mode. The SMU can be used as variable voltage source, variable current source, voltage meter, or current meter. Combining two different unit, output power can be doubled as 100V/1.5A. The developed SMU tan be used many semiconductor testing system and electronic device inspecting system.

• Journal of information and communication convergence engineering
• /
• v.15 no.4
• /
• pp.232-236
• /
• 2017

A digital vacuum pressure sensor is designed, fabricated, and characterized using a packaged MEMS analog Pirani gauge. The packaged MEMS analog Pirani gauge requires a current source to heat up a heater in the Pirani gauge. To investigate the feasibility of digitization for the analog Pirani gauge, its implementation is performed with a zero-temperature coefficient current source and microcontroller that are commercially available. The measurement results using the digital vacuum pressure sensor showed that its operating range is 0.05-760 Torr, which is the same as the measurement results of the packaged MEMS analog pressure sensor. The results confirm that it is feasible to integrate the analog Pirani gauge with a commercially available current source and microcontroller. The successful hybrid integration of the analog Pirani gauge and digital circuits is an encouraging result for monolithic integration with a precision current source and ADCs in the state of CMOS dies.

• Proceedings of the KIEE Conference
• /
• 1998.11a
• /
• pp.22-24
• /
• 1998

The current distribution in the source coil region is analyzed using the two dimensional finite element method. The variables in the FEM are the magnetic vector potentials and the source current density. The boundary condition for the source current density is that the total current is the sum of the eddy current and the source current and is known quantity from measurement. The simulation results are compared with the analytical solution. It is found that the method can analyze the current distribution in the source conductors very accurately.

• Journal of Industrial Technology
• /
• v.30 no.A
• /
• pp.83-88
• /
• 2010

Recently, the LED lighting is widely used to illumination purpose due to its high luminous efficiency and the long life time. However, the light power and lifetime is reduced by junction temperature increment of LED. So it is important to measure the junction temperature accurately. In this paper, we proposed a new design and implementation method of high power LED junction temperature measurement circuit. The proposed circuit has two current sources which are a driving current source and a measurement is verified by experiment, and the result shows that the proposed circuit is appropriate to practical use.

• Journal of Advanced Navigation Technology
• /
• v.28 no.3
• /
• pp.348-355
• /
• 2024

A current source capable of stably supplying current as a measurement medium is required in order to measure and test important facilities that require large-scale measurement current, such as a control element drive mechanism control system(CEDMCS), in case of dismantling a nuclear power plant. However, it can provides only voltage power as a source, not current, although direct voltage controlled constant current source is essential to test major equipment. That kind of source is not available to supply stable constant current regardless of load variation. It is just voltage supplier. Developing current source is not easy other than voltage source. Very large-scale current source up to ampere class more than such ten times of normal current is inevitable to test above mentioned equipment. So, we developed large-scale current source which is controlled by input DC voltage and supplies constant stable current to object equipment according to this requirement. We measured and tested nuclear power plant equipment using given real site data for a long time and afforded long period load test, and then proved its validity and verification. The developed invetion will be used future installed important equipment measuring and testing.

• Proceedings of the KIEE Conference
• /
• 2001.11c
• /
• pp.34-37
• /
• 2001

In this paper, we designed and implemented the 60W DC characteristic measurement system for semiconductor devices. The proposed system is composed of 2 SMU(Source and Measure Unit)s, 2 HPU(High power Unit)s, 2VSU(Voltage Source Unit)s, and 2 VMU(Voltage Measurement Unit)s. HPU can source/measure voltage from -200V to 200V and source/measure current from -3A to 3A within 60W. Experimental results show that the implemented system can measure the power devices such as power BJT, regulator IC, and voltage detector.

• Journal of Information Display
• /
• v.2 no.4
• /
• pp.23-28
• /
• 2001

Field emission characteristics of carbon nanotubes(CNTs) on four kinds of metallic substrates have been investigated under the irradiation of a laser. The field emission measurement reveals that after laser irradiation the current was increased and new humps at the field emission current was found. The current enhancement was thought to have occurred due to the fact that the electrical contact between CNTs and metals was improved due to the irradiation of the laser.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2001.11b
• /
• pp.609-612
• /
• 2001

Rogowski coil is made having no ferromagnetic material in a core. So the coil cannot be driven into saturation. This result in that Rogowski coils may be calibrated at relatively low currents. and used with confidence at very high currents. However the lowest level of current that can be measured is limited by the sensitivity of the voltage measuring instrument and system noise. Therefore. geometrical effects were investigated in order to measure high sensitivity of low level current and the significant source of error was examined as well. In the results, the source of error was associated with coil designs. i.e. shape and uniformity of coil and a geometrical location of current source inside and outside of the Rogowski coil.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2001.11a
• /
• pp.609-612
• /
• 2001

Rogowski coil is made having no ferromagnetic material in a core. So the coil cannot be driven into saturation. This result in that Rogowski coils may be calibrated at relatively low currents, and used with confidence at very high currents. However the lowest level of current that can be measured is limited by the sensitivity of the voltage measuring instrument and system noise. Therefore, geometrical effects were investigated in order to measure high sensitivity of low level current and the significant source of error wa examined as well. n the results, the source of error was associated with coil designs, i.e. shape and uniformity of coil and a geometrical location of current source inside and outside of the Rogowski coil.