The growth and electrical properties of Ferroelectric $(Bi_{3.25},La_{0.75})Ti_3O_{12}$ thin films for Metal-Ferroelectric-Insulator-Semiconductor(MFIS) structure
(Metal-Ferroelectric-Insulator-Semiconductor(MFIS) 구조를 위한 $(Bi_{3.25},La_{0.75})Ti_3O_{12}$ 박막의 성장 및 전기적 특성)
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- Proceedings of the Materials Research Society of Korea Conference
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- 2000.11a
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- pp.39-39
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- 2000