• Title/Summary/Keyword: Logic circuits

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A Simulation System for the Automation of Logic Circuit Design (논리회로 설계 자동화를 위한 시뮬레이션 시스템)

  • 한창호
    • Journal of the Korea Society for Simulation
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    • v.3 no.1
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    • pp.107-114
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    • 1994
  • This paper describes an integrated environment for logic circuit simultion which is an important step of logic circuit design. The system consists of a logic simulator kernel, an expandible element routine library. a functional level element routine generator, several HDL input parsers, and a postprocessor. The system can simulate the same system in several levels of hierarchy. The experimental result shows that the system is very efficient and useful for design of logic circuits.

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An extension of testability analysis for sequential circuits (순차회로를 위한 검사성 분석법의 확장)

  • 김신택;민형복
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.32A no.4
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    • pp.75-84
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    • 1995
  • Fault simulators are used for accurate evaluation of fault coverages of digital circuits. But fault simulation becomes time and memory consuming job because computation time is proportional to wquare of size of circuits. Recently, several approximate algorithms for testability analysis have been published to cope with the problems. COP is very fast but cannot be used for sequential circuits, while STAFAN can ve used for sequential circuits but requires large amount of computation because it utilizes logic simulation results. In this paper EXTASEC(An Extension of Testability Analysis for Sequential Circuits) is proposed. It is an extension of COP in the sense that it is the same as COP for combinational circuits, but it can handle sequential circuits, Xicontrollability and backward line analysis are key concept for EXTASEC. Performance of EXTASEC is proven by comparing EXTASEC with a falut simulator, STAFAN, and COP for ISCAS circuits, and the result is demonstated.

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Efficient Technology Mapping of FPGA Circuits Using Fuzzy Logic Technique (퍼지이론을 이용한 FPGA회로의 효율적인 테크놀로지 매핑)

  • Lee, Jun-Yong;Park, Do-Soon
    • The Transactions of the Korea Information Processing Society
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    • v.7 no.8
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    • pp.2528-2535
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    • 2000
  • Technology mapping is a part of VLSI CAD system, where circuits in logical level are mapped into circuits in physical level. The performance of technology mapping system is evaluatecJ by the delay and area of the resulting circuits. In the sequential circuits, the delay of the circuit is decided by the maximal delay between registers. In this work, we introduce an FPGA mapping algorithm improved by retiming technique used in constructive level and iterative level, and by fuzzy logic technique. Initial circuit is mapped into an FPGA circuit by constructive manner and improved by iterative retiming. Criteria given to the initial circuit are structured hierarchically by decision-making functions of fuzzy logic. The proposed system shows better results than previous systems by the experiments with MCNC benchmarkers.

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Implementation of Simplification Procedure for Digital Combinational Logic Circuits Using Java Applets (자바 애플릿을 이용한 디지털 조합회로의 간략화 과정 구현)

  • Moon, Hun-Joo;Kim, Dong-Sik;Moon, Il-Hyun;Choi, Kwan-Sun;Lee, Sun-Heum
    • The Journal of Korean Association of Computer Education
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    • v.10 no.4
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    • pp.17-25
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    • 2007
  • In this paper, the simplification procedure of Karnaugh Map, which is essential to design digital logic circuits, was implemented as a web-based educational tool by Java applet. The learners can make virtual experiments on the simplification of the digital logic circuit by clicking on some buttons or filling out some text fields. The proposed simplification procedure was implemented as a Java applet which is based on the Modified Quine-McCluskey algorithm. Thus, the implemented Java applet will enable the learners to enhance the learning efficiency as a auxiliary educational tool.

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A Cost Model of Hierarchical Automatic Test Pattern Generation Algorithms for Combinational Logic Circuits (조합회로에 대한 계층 구조적 테스트 패턴 생성 알고리즘의 비용 모델)

  • Hyoung Bok Min
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.28A no.12
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    • pp.65-72
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    • 1991
  • A cost model of test generation is presented in this paper. The cost of flat gate-level and hierarchical modular level test generation for combinational logic circuits are modeled. The model shows that the cost of hierarchical test generation grows as GlogGunder some assuptions, while the cost of gate-level test generation grows $G^2<$/TEX>, where G is the number of gates in a circuit under test. The cost model derived in this paper is used to explain why some test generation techniques are faster and why hierarchical test generators should be faster than flat test generators on large circuits.

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A Study of Efficiency Improvement of the D-algorithm for NAND Circuits (NAND회로망의 시험패턴발생을 위한 D-알고리듬의 효율개선에 관한 연구)

  • 노정호;강병욱;안광선
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.25 no.7
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    • pp.734-745
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    • 1988
  • In this paper, it is tried to improve efficiency of the D-algorithm by assigning the logic values effectively on the nodes related to the critical path for back tracing to reduce the number of search nodes when acyclic combinational logic circuits are composed of NAND gates only. For that purpose, LASAR algorithm which is suitable for determining a critical path for back tracing is applied to the D-algorithm and it is implemented by IBM-PC with APL language. The test results on a number of NAND circuits which have multi-fanout, reconvergent and symetric characteristics show that the modified D-algorihtm reduces the number of search nodes in forward and backward tracing and decreases the run time of CPU about 10 percents.

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Minimizing Leakage of Sequential Circuits through Flip-Flop Skewing and Technology Mapping

  • Heo, Se-Wan;Shin, Young-Soo
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.7 no.4
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    • pp.215-220
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    • 2007
  • Leakage current of CMOS circuits has become a major factor in VLSI design these days. Although many circuit-level techniques have been developed, most of them require significant amount of designers' effort and are not aligned well with traditional VLSI design process. In this paper, we focus on technology mapping, which is one of the steps of logic synthesis when gates are selected from a particular library to implement a circuit. We take a radical approach to push the limit of technology mapping in its capability of suppressing leakage current: we use a probabilistic leakage (together with delay) as a cost function that drives the mapping; we consider pin reordering as one of options in the mapping; we increase the library size by employing gates with larger gate length; we employ a new flipflop that is specifically designed for low-leakage through selective increase of gate length. When all techniques are applied to several benchmark circuits, leakage saving of 46% on average is achieved with 45-nm predictive model, compared to the conventional technology mapping.

Design and Analysis of Current Mode Low Temperature Polysilicon TFT Inverter/Buffer

  • Lee, Joon-Chang;Jeong, Ju-Young
    • Journal of Information Display
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    • v.6 no.4
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    • pp.11-15
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    • 2005
  • We propose a current mode logic circuit design method for LTPS TFT for enhancing circuit operating speed. Current mode inverter/buffers with passive resistive load had been designed and fabricated. Measurement results indicated that the smaller logic swing of the current mode allowed significantly faster operation than the static CMOS. In order to reduce the chip size, both all pTFT and all nTFT active load current mode inverter/buffer had been designed and analyzed by HSPICE simulation. Even though the active load current mode circuits were inferior to the passive load circuits, it was superior to static CMOS gates.

Design of a Multi-Valued Arithmetic Processor with Encoder and Decoder (인코더, 디코오더를 가지는 다치 연산기 설계)

  • 박진우;양대영;송홍복
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.2 no.1
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    • pp.147-156
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    • 1998
  • In this paper, an arithmetic processor using multi-valued logic is designed. For implementing of multi-valued logic circuits, we use current-mode CMOS circuits and design encoder which change binary voltage-mode signals to multi-valued current-mode signals and decoder which change results of arithmetic to binary voltage-mode signals. To reduce the number of partial product we use 4-radix SD number partial product generation algorithm that is an extension of the modified Booth's algorithm. We demonstrate the effectiveness of the proposed arithmetic circuits through SPICE simulation and Hardware emulation using FPGA chip.

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Inductorless 8.9 mW 25 Gb/s 1:4 DEMUX and 4 mW 13 Gb/s 4:1 MUX in 90 nm CMOS

  • Sekiguchi, Takayuki;Amakawa, Shuhei;Ishihara, Noboru;Masu, Kazuya
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.10 no.3
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    • pp.176- 184
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    • 2010
  • A low-power inductorless 1:4 DEMUX and a 4:1 MUX for a 90 nm CMOS are presented. The DEMUX can be operated at a speed of 25 Gb/s with the power supply voltage of 1.05 V, and the power consumption is 8.9 mW. The area of the DEMUX core is $29\;{\times}\;40\;{\mu}m^2$. The operation speed of the 4:1 MUX is 13 Gb/s at a power supply voltage of 1.2 V, and the power consumption is 4 mW. The area of the MUX core is $30\;{\times}\;18\;{\mu}m^2$. The MUX/DEMUX mainly consists of differential pseudo-NMOS. In these MUX/DEMUX circuits, logic swing is nearly rail-to-rail, and a low $V_{dd}$. The component circuit is more scalable than a CML circuit, which is commonly used in a high-performance MUX/DEMUX. These MUX/DEMUX circuits are compatible with conventional CMOS logic circuit, and it can be directly connected to CMOS logic gates without logic level conversion. Furthermore, the circuits are useful for core-to-core interconnection in the system LSI or chip-to-chip communication within a multi-chip module, because of its low power, small footprint, and reasonable operation speed.